{"id":"https://openalex.org/W1577572515","doi":"https://doi.org/10.1109/icmens.2004.1508942","title":"Finite Element Simulations of Transient Droplet Deformation in an Electrical Field","display_name":"Finite Element Simulations of Transient Droplet Deformation in an Electrical Field","publication_year":2006,"publication_date":"2006-10-11","ids":{"openalex":"https://openalex.org/W1577572515","doi":"https://doi.org/10.1109/icmens.2004.1508942","mag":"1577572515"},"language":"en","primary_location":{"id":"doi:10.1109/icmens.2004.1508942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmens.2004.1508942","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058179483","display_name":"Graeme Supeene","orcid":null},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"G. Supeene","raw_affiliation_strings":["University of Alberta"],"affiliations":[{"raw_affiliation_string":"University of Alberta","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044294757","display_name":"Charles Robert Koch","orcid":"https://orcid.org/0000-0002-6094-5933"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"C.R. Koch","raw_affiliation_strings":["University of Alberta"],"affiliations":[{"raw_affiliation_string":"University of Alberta","institution_ids":["https://openalex.org/I154425047"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071930915","display_name":"S. Bhattacharjee","orcid":"https://orcid.org/0000-0001-6158-3578"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S. Bhattacharjee","raw_affiliation_strings":["University of Alberta"],"affiliations":[{"raw_affiliation_string":"University of Alberta","institution_ids":["https://openalex.org/I154425047"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058179483"],"corresponding_institution_ids":["https://openalex.org/I154425047"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04394656,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"291","issue":null,"first_page":"181","last_page":"183"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12784","display_name":"Modular Robots and Swarm Intelligence","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrowetting","display_name":"Electrowetting","score":0.7926486134529114},{"id":"https://openalex.org/keywords/microfluidics","display_name":"Microfluidics","score":0.7724651098251343},{"id":"https://openalex.org/keywords/deformation","display_name":"Deformation (meteorology)","score":0.7144208550453186},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.6912710666656494},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.6830873489379883},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6541099548339844},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.6345996856689453},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5674307942390442},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.503243625164032},{"id":"https://openalex.org/keywords/computer-simulation","display_name":"Computer simulation","score":0.4409436285495758},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.35337546467781067},{"id":"https://openalex.org/keywords/classical-mechanics","display_name":"Classical mechanics","score":0.3292257487773895},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25581124424934387},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23877355456352234},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.22790253162384033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17800140380859375},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.12295910716056824},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1023024320602417},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07969436049461365},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07714274525642395}],"concepts":[{"id":"https://openalex.org/C2779673822","wikidata":"https://www.wikidata.org/wiki/Q907239","display_name":"Electrowetting","level":3,"score":0.7926486134529114},{"id":"https://openalex.org/C8673954","wikidata":"https://www.wikidata.org/wiki/Q138845","display_name":"Microfluidics","level":2,"score":0.7724651098251343},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.7144208550453186},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.6912710666656494},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.6830873489379883},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6541099548339844},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.6345996856689453},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5674307942390442},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.503243625164032},{"id":"https://openalex.org/C500300565","wikidata":"https://www.wikidata.org/wiki/Q925667","display_name":"Computer simulation","level":2,"score":0.4409436285495758},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.35337546467781067},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.3292257487773895},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25581124424934387},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23877355456352234},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.22790253162384033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17800140380859375},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.12295910716056824},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1023024320602417},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07969436049461365},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07714274525642395},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icmens.2004.1508942","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmens.2004.1508942","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W18714901","https://openalex.org/W2023408802","https://openalex.org/W2077613410","https://openalex.org/W2135992844","https://openalex.org/W2142486523","https://openalex.org/W2150068960","https://openalex.org/W2320488967","https://openalex.org/W2332024053"],"related_works":["https://openalex.org/W4386095735","https://openalex.org/W2266841287","https://openalex.org/W2248590691","https://openalex.org/W2317636690","https://openalex.org/W1892650420","https://openalex.org/W1518283146","https://openalex.org/W2184856822","https://openalex.org/W2105772751","https://openalex.org/W2075021927","https://openalex.org/W2101793433"],"abstract_inverted_index":{"Deformation":[0],"of":[1,19,25,39,76,83,94],"droplets":[2,40,95],"in":[3,101],"an":[4,16,42,65],"externally":[5],"imposed":[6,43],"electrical":[7,23,44],"field":[8],"is":[9,15,48],"a":[10,32,98],"widely":[11],"studied":[12],"phenomenon,":[13],"and":[14,115,122],"important":[17],"component":[18],"microfluidic":[20,128],"operations":[21,129],"involving":[22],"actuation":[24],"droplets.":[26],"In":[27],"this":[28],"study,":[29],"we":[30],"explore":[31],"general":[33],"numerical":[34,59],"formulation":[35],"for":[36,50,69,110,118],"the":[37,74,77,81,84,90,102,108,112,120],"deformation":[38,85],"under":[41],"field.":[45,104],"The":[46,58,105],"solution":[47],"presented":[49,87],"two":[51],"perfect":[52],"dielectrics":[53],"carring":[54],"no":[55],"free":[56],"charge.":[57],"solutions":[60],"are":[61,86],"first":[62],"compared":[63],"with":[64],"asymptotic":[66],"analytic":[67],"result":[68],"small":[70],"deformations":[71],"to":[72,88,97],"assess":[73],"accuracy":[75],"method.":[78],"Following":[79],"this,":[80],"dynamics":[82],"characterize":[89],"typical":[91],"response":[92,114],"times":[93],"subjected":[96],"step":[99],"change":[100],"electric":[103],"results":[106],"provide":[107,124],"basis":[109],"modeling":[111],"dynamic":[113],"control":[116],"strategies":[117],"manipulating":[119],"droplets,":[121],"may":[123],"considerable":[125],"insight":[126],"into":[127],"based":[130],"on":[131],"electrowetting.":[132]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}