{"id":"https://openalex.org/W2144011591","doi":"https://doi.org/10.1109/icme.2004.1394417","title":"Coding artifacts reduction using edge map guided adaptive and fuzzy filtering","display_name":"Coding artifacts reduction using edge map guided adaptive and fuzzy filtering","publication_year":2005,"publication_date":"2005-03-21","ids":{"openalex":"https://openalex.org/W2144011591","doi":"https://doi.org/10.1109/icme.2004.1394417","mag":"2144011591"},"language":"en","primary_location":{"id":"doi:10.1109/icme.2004.1394417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icme.2004.1394417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 IEEE International Conference on Multimedia and Expo (ICME) (IEEE Cat. No.04TH8763)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100855889","display_name":"Hao-Song Kong","orcid":null},"institutions":[{"id":"https://openalex.org/I1306287861","display_name":"Mitsubishi Group (Japan)","ror":"https://ror.org/0234cd281","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861"]},{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Hao-Song Kong","raw_affiliation_strings":["Mitsubishi Electric Research Labs, Cambridge, MA, USA","Mitsubishi Electr. Res. Labs, Cambridge, MA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Labs, Cambridge, MA, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"Mitsubishi Electr. Res. Labs, Cambridge, MA","institution_ids":["https://openalex.org/I1306287861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101057617","display_name":"Yao Nie","orcid":"https://orcid.org/0009-0003-3005-0033"},"institutions":[{"id":"https://openalex.org/I86501945","display_name":"University of Delaware","ror":"https://ror.org/01sbq1a82","country_code":"US","type":"education","lineage":["https://openalex.org/I86501945"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yao Nie","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Delaware, Newark, DE, USA","Department of Electrical and Computer Engineering, University of Delaware , Newark, DE, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Delaware, Newark, DE, USA","institution_ids":["https://openalex.org/I86501945"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Delaware , Newark, DE, USA","institution_ids":["https://openalex.org/I86501945"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049841606","display_name":"Anthony Vetro","orcid":"https://orcid.org/0000-0002-8194-573X"},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Vetro","raw_affiliation_strings":["Mitsubishi Electric Research Labs, Cambridge, MA, USA","[Mitsubishi Electric Research Laboratories, Cambridge, MA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Labs, Cambridge, MA, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"[Mitsubishi Electric Research Laboratories, Cambridge, MA, USA]","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102156960","display_name":"Huifing Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Huifing Sun","raw_affiliation_strings":["Mitsubishi Electric Research Labs, Cambridge, MA, USA","[Mitsubishi Electric Research Laboratories, Cambridge, MA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Labs, Cambridge, MA, USA","institution_ids":["https://openalex.org/I4210159266"]},{"raw_affiliation_string":"[Mitsubishi Electric Research Laboratories, Cambridge, MA, USA]","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036946701","display_name":"Kenneth E. Barner","orcid":"https://orcid.org/0000-0002-0936-7840"},"institutions":[{"id":"https://openalex.org/I86501945","display_name":"University of Delaware","ror":"https://ror.org/01sbq1a82","country_code":"US","type":"education","lineage":["https://openalex.org/I86501945"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.E. Barner","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Delaware, Newark, DE","Department of Electrical & Computer Engineering,University of Delaware Newark, DE#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Delaware, Newark, DE","institution_ids":["https://openalex.org/I86501945"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering,University of Delaware Newark, DE#TAB#","institution_ids":["https://openalex.org/I86501945"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.6934,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.94629325,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"1135","last_page":"1138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ringing-artifacts","display_name":"Ringing artifacts","score":0.8735263347625732},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.674082338809967},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6637709140777588},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6332077980041504},{"id":"https://openalex.org/keywords/artifact","display_name":"Artifact (error)","score":0.601753294467926},{"id":"https://openalex.org/keywords/ringing","display_name":"Ringing","score":0.5912494659423828},{"id":"https://openalex.org/keywords/deblocking-filter","display_name":"Deblocking filter","score":0.5894581079483032},{"id":"https://openalex.org/keywords/adaptive-filter","display_name":"Adaptive filter","score":0.5830150842666626},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.5755313634872437},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5538137555122375},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.543258011341095},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5304136872291565},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.5131009817123413},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.42763176560401917},{"id":"https://openalex.org/keywords/bilateral-filter","display_name":"Bilateral filter","score":0.41787800192832947},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.37213414907455444},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3504107594490051},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.35033565759658813},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21385684609413147},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20722252130508423}],"concepts":[{"id":"https://openalex.org/C17828673","wikidata":"https://www.wikidata.org/wiki/Q7334899","display_name":"Ringing artifacts","level":3,"score":0.8735263347625732},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.674082338809967},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6637709140777588},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6332077980041504},{"id":"https://openalex.org/C2779010991","wikidata":"https://www.wikidata.org/wiki/Q2720909","display_name":"Artifact (error)","level":2,"score":0.601753294467926},{"id":"https://openalex.org/C30684385","wikidata":"https://www.wikidata.org/wiki/Q176509","display_name":"Ringing","level":3,"score":0.5912494659423828},{"id":"https://openalex.org/C143184774","wikidata":"https://www.wikidata.org/wiki/Q3020846","display_name":"Deblocking filter","level":2,"score":0.5894581079483032},{"id":"https://openalex.org/C102248274","wikidata":"https://www.wikidata.org/wiki/Q168388","display_name":"Adaptive filter","level":2,"score":0.5830150842666626},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.5755313634872437},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5538137555122375},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.543258011341095},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5304136872291565},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.5131009817123413},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.42763176560401917},{"id":"https://openalex.org/C156140930","wikidata":"https://www.wikidata.org/wiki/Q860417","display_name":"Bilateral filter","level":3,"score":0.41787800192832947},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.37213414907455444},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3504107594490051},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.35033565759658813},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21385684609413147},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20722252130508423},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icme.2004.1394417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icme.2004.1394417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2004 IEEE International Conference on Multimedia and Expo (ICME) (IEEE Cat. No.04TH8763)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1551485322","https://openalex.org/W2006862994","https://openalex.org/W2095868395","https://openalex.org/W2110691818","https://openalex.org/W2113641518","https://openalex.org/W2118344463","https://openalex.org/W2141620200","https://openalex.org/W2145667476","https://openalex.org/W2158724566","https://openalex.org/W2160515577","https://openalex.org/W6681202210"],"related_works":["https://openalex.org/W2104708016","https://openalex.org/W2390701595","https://openalex.org/W1542850441","https://openalex.org/W2090956370","https://openalex.org/W2293401449","https://openalex.org/W2095868395","https://openalex.org/W2016796085","https://openalex.org/W1523560328","https://openalex.org/W1834442554","https://openalex.org/W2140689276"],"abstract_inverted_index":{"The":[0],"work":[1],"presents":[2],"a":[3,70],"new":[4],"adaptive":[5,33],"approach":[6],"for":[7,64],"blocking":[8],"and":[9,30,43,75,87,102],"ringing":[10],"artifact":[11,28,41,100],"reduction.":[12],"In":[13],"order":[14],"to":[15,35,81],"avoid":[16],"smearing":[17],"of":[18,98],"the":[19,22,36,76,82,92],"image":[20,65],"details,":[21],"proposed":[23,93],"method":[24,94],"first":[25],"performs":[26],"visual":[27,40],"detection":[29,42],"then":[31],"applies":[32],"filtering":[34,44,77],"corrupted":[37],"blocks.":[38],"Both":[39],"are":[45,90],"guided":[46],"by":[47],"an":[48],"edge":[49,72,83],"map":[50],"which":[51],"is":[52,62,79],"constructed":[53],"based":[54],"on":[55],"local":[56],"features.":[57],"A":[58],"fuzzy":[59],"identity":[60],"filter":[61],"used":[63],"de-ringing.":[66],"Since":[67],"it":[68],"possesses":[69],"good":[71],"preserving":[73],"property":[74],"operation":[78],"applied":[80],"blocks":[84,89],"only":[85],"(smooth":[86],"textured":[88],"unaltered),":[91],"shows":[95],"great":[96],"effectiveness":[97],"both":[99],"reduction":[101],"detail":[103],"preservation.":[104],"Experiments":[105],"demonstrate":[106],"better":[107],"results":[108],"compared":[109],"with":[110],"other":[111],"methods.":[112]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}