{"id":"https://openalex.org/W1995634544","doi":"https://doi.org/10.1109/icmcs.2014.6911421","title":"Channel temperature estimation of AlGaN/GaN HEMT for pulsed RADAR applications using infrared thermography and electrical characterization","display_name":"Channel temperature estimation of AlGaN/GaN HEMT for pulsed RADAR applications using infrared thermography and electrical characterization","publication_year":2014,"publication_date":"2014-04-01","ids":{"openalex":"https://openalex.org/W1995634544","doi":"https://doi.org/10.1109/icmcs.2014.6911421","mag":"1995634544"},"language":"en","primary_location":{"id":"doi:10.1109/icmcs.2014.6911421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmcs.2014.6911421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Conference on Multimedia Computing and Systems (ICMCS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033584692","display_name":"Jean-Baptiste Fonder","orcid":null},"institutions":[{"id":"https://openalex.org/I62396329","display_name":"Universit\u00e9 de Rouen Normandie","ror":"https://ror.org/03nhjew95","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210105918","https://openalex.org/I62396329"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Jean-Baptiste Fonder","raw_affiliation_strings":["GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I62396329"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054206644","display_name":"Olivier Latry","orcid":"https://orcid.org/0000-0002-2121-8864"},"institutions":[{"id":"https://openalex.org/I62396329","display_name":"Universit\u00e9 de Rouen Normandie","ror":"https://ror.org/03nhjew95","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210105918","https://openalex.org/I62396329"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Olivier Latry","raw_affiliation_strings":["GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I62396329"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108597298","display_name":"Farid Tem\u00e7amani","orcid":null},"institutions":[{"id":"https://openalex.org/I86175216","display_name":"\u00c9cole Nationale Sup\u00e9rieure de l'\u00c9lectronique et de ses Applications","ror":"https://ror.org/03qeacd72","country_code":"FR","type":"education","lineage":["https://openalex.org/I86175216"]},{"id":"https://openalex.org/I62396329","display_name":"Universit\u00e9 de Rouen Normandie","ror":"https://ror.org/03nhjew95","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210105918","https://openalex.org/I62396329"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Farid Temcamani","raw_affiliation_strings":["ENSEA, ECS-Lab, Cergy, France","GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France"],"affiliations":[{"raw_affiliation_string":"ENSEA, ECS-Lab, Cergy, France","institution_ids":["https://openalex.org/I86175216"]},{"raw_affiliation_string":"GPM UMR 6634, Avenue de l'Universite, Saint Etienne du Rouvray, France","institution_ids":["https://openalex.org/I62396329"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007278722","display_name":"C\u00e9dric Duperrier","orcid":null},"institutions":[{"id":"https://openalex.org/I86175216","display_name":"\u00c9cole Nationale Sup\u00e9rieure de l'\u00c9lectronique et de ses Applications","ror":"https://ror.org/03qeacd72","country_code":"FR","type":"education","lineage":["https://openalex.org/I86175216"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Cedric Duperrier","raw_affiliation_strings":["ETIS UMR 8051, ENSEA, Cergy, France"],"affiliations":[{"raw_affiliation_string":"ETIS UMR 8051, ENSEA, Cergy, France","institution_ids":["https://openalex.org/I86175216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5033584692"],"corresponding_institution_ids":["https://openalex.org/I62396329"],"apc_list":null,"apc_paid":null,"fwci":0.20334783,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.586109,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1405","last_page":"1408"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-electron-mobility-transistor","display_name":"High-electron-mobility transistor","score":0.9033731818199158},{"id":"https://openalex.org/keywords/thermography","display_name":"Thermography","score":0.8714362382888794},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7260162234306335},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.632485032081604},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6191481947898865},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6119378805160522},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.587006151676178},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5699959397315979},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.5142104625701904},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.49222269654273987},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3818289637565613},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.267214298248291},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.18391874432563782},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14347681403160095},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10011202096939087},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09533458948135376},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.06252875924110413}],"concepts":[{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.9033731818199158},{"id":"https://openalex.org/C2779222261","wikidata":"https://www.wikidata.org/wiki/Q624587","display_name":"Thermography","level":3,"score":0.8714362382888794},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7260162234306335},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.632485032081604},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6191481947898865},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6119378805160522},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.587006151676178},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5699959397315979},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5142104625701904},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.49222269654273987},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3818289637565613},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.267214298248291},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.18391874432563782},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14347681403160095},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10011202096939087},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09533458948135376},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.06252875924110413},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icmcs.2014.6911421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icmcs.2014.6911421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Conference on Multimedia Computing and Systems (ICMCS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01740889v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01740889","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2014 International Conference on Multimedia Computing and Systems (ICMCS), Apr 2014, Marrakech, France. ⟨10.1109/ICMCS.2014.6911421⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1966088032","https://openalex.org/W1982619893","https://openalex.org/W1993597955","https://openalex.org/W2008582929","https://openalex.org/W2042801850","https://openalex.org/W2051923643","https://openalex.org/W2055263547","https://openalex.org/W2070528178","https://openalex.org/W2106184779","https://openalex.org/W2114003999","https://openalex.org/W2170542824","https://openalex.org/W2547434433"],"related_works":["https://openalex.org/W2224543647","https://openalex.org/W4310007303","https://openalex.org/W35959284","https://openalex.org/W2141980482","https://openalex.org/W2900544575","https://openalex.org/W2513461979","https://openalex.org/W2891762927","https://openalex.org/W4255358997","https://openalex.org/W2946143309","https://openalex.org/W4380319153"],"abstract_inverted_index":{"International":[0],"audience":[1]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}