{"id":"https://openalex.org/W4390606080","doi":"https://doi.org/10.1109/icm60448.2023.10378910","title":"Fault simulation Framework using PyUVM","display_name":"Fault simulation Framework using PyUVM","publication_year":2023,"publication_date":"2023-12-17","ids":{"openalex":"https://openalex.org/W4390606080","doi":"https://doi.org/10.1109/icm60448.2023.10378910"},"language":"en","primary_location":{"id":"doi:10.1109/icm60448.2023.10378910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm60448.2023.10378910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102601292","display_name":"Mina Hanna Fayez","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Mina Hanna Fayez","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104224937","display_name":"Mohamed Ahmed ElAdawy","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed Ahmed ElAdawy","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093657742","display_name":"Micheal Safwat Sahyon","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Micheal Safwat Sahyon","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114115853","display_name":"Islam Osama Ahmed","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Islam Osama Ahmed","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093657743","display_name":"Omar Hossam El-Din","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Omar Hossam El-Din","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113089367","display_name":"M. El-Shafie","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed Ahmed ElShafie","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109671725","display_name":"Mohamed Ayman Taha","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed Ayman Taha","raw_affiliation_strings":["Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Cairo University,Faculty of Engineering Electronics and Communications Department,Cairo,Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Faculty of Engineering Electronics and Communications Department, Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104224938","display_name":"Mohamed Gamal Talaat","orcid":null},"institutions":[{"id":"https://openalex.org/I107720978","display_name":"Ain Shams University","ror":"https://ror.org/00cb9w016","country_code":"EG","type":"education","lineage":["https://openalex.org/I107720978"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed Gamal Talaat","raw_affiliation_strings":["Ain Shams University,Faculty of Engineering Computer Department,Cairo,Egypt","Faculty of Engineering Computer Department, Ain Shams University, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Ain Shams University,Faculty of Engineering Computer Department,Cairo,Egypt","institution_ids":["https://openalex.org/I107720978"]},{"raw_affiliation_string":"Faculty of Engineering Computer Department, Ain Shams University, Cairo, Egypt","institution_ids":["https://openalex.org/I107720978"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5102601292"],"corresponding_institution_ids":["https://openalex.org/I145487455"],"apc_list":null,"apc_paid":null,"fwci":0.924,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.74246231,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"158","last_page":"161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7212997674942017},{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.625423789024353},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5947436690330505},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.47131189703941345},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47013550996780396},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4327758848667145},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42374932765960693},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2254028022289276},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.19217312335968018},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17533263564109802},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08412554860115051}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7212997674942017},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.625423789024353},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5947436690330505},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.47131189703941345},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47013550996780396},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4327758848667145},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42374932765960693},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2254028022289276},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.19217312335968018},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17533263564109802},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08412554860115051},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm60448.2023.10378910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm60448.2023.10378910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Life below water","score":0.4099999964237213,"id":"https://metadata.un.org/sdg/14"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2998821731"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2121043529","https://openalex.org/W2082366402","https://openalex.org/W2120242933","https://openalex.org/W1657300322","https://openalex.org/W2055295790","https://openalex.org/W2083209667","https://openalex.org/W2185394135","https://openalex.org/W3155997325","https://openalex.org/W2742111403"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,81],"fault":[4,32,46,51,93,99],"simulation":[5,47,52,55,100,103],"environment":[6,72],"developed":[7],"using":[8],"PyUVM":[9],"to":[10],"address":[11],"challenges":[12,27],"in":[13],"simulating":[14,30],"faults":[15,79],"during":[16],"the":[17,45,84],"manufacturing":[18],"process":[19],"of":[20,40,78],"integrated":[21],"circuits":[22],"(ICs).":[23],"The":[24,38,71,95],"two":[25],"main":[26],"tackled":[28],"are":[29],"pre-manufacturing":[31],"behavior":[33],"and":[34,60,68,87,105,114],"overcoming":[35],"performance":[36],"issues.":[37],"contributions":[39],"this":[41],"work":[42],"include":[43],"expanding":[44],"capacity":[48],"beyond":[49],"existing":[50,112],"methodologies,":[53],"improving":[54],"time":[56],"through":[57],"efficient":[58],"algorithms,":[59],"enabling":[61],"compatibility":[62,107],"with":[63,111],"Universal":[64],"Verification":[65],"Methodology":[66],"(UVM)":[67],"SystemVerilog":[69],"testbenches.":[70],"allows":[73],"for":[74,108],"injecting":[75],"various":[76],"types":[77],"into":[80],"design,":[82],"reporting":[83],"resulting":[85],"behavior,":[86],"facilitating":[88],"comprehensive":[89],"analysis":[90],"under":[91],"different":[92],"scenarios.":[94],"proposed":[96],"solution":[97],"enhances":[98],"capabilities,":[101],"reduces":[102],"time,":[104],"provides":[106],"seamless":[109],"integration":[110],"designs":[113],"verification":[115],"methodologies.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}