{"id":"https://openalex.org/W4390606071","doi":"https://doi.org/10.1109/icm60448.2023.10378890","title":"Layout-based reliability analysis of openMSP430 register file under external radiations","display_name":"Layout-based reliability analysis of openMSP430 register file under external radiations","publication_year":2023,"publication_date":"2023-12-17","ids":{"openalex":"https://openalex.org/W4390606071","doi":"https://doi.org/10.1109/icm60448.2023.10378890"},"language":"en","primary_location":{"id":"doi:10.1109/icm60448.2023.10378890","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icm60448.2023.10378890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032433481","display_name":"Vivek Bansal","orcid":null},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Vivek Bansal","raw_affiliation_strings":["Concordia University Montreal,Department of Electrical and Computer Engineering,Canada"],"affiliations":[{"raw_affiliation_string":"Concordia University Montreal,Department of Electrical and Computer Engineering,Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032928854","display_name":"Otmane A\u0131\u0308t Mohamed","orcid":"https://orcid.org/0000-0003-1378-1443"},"institutions":[{"id":"https://openalex.org/I60158472","display_name":"Concordia University","ror":"https://ror.org/0420zvk78","country_code":"CA","type":"education","lineage":["https://openalex.org/I60158472"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Otmane Ait Mohamed","raw_affiliation_strings":["Concordia University Montreal,Department of Electrical and Computer Engineering,Canada"],"affiliations":[{"raw_affiliation_string":"Concordia University Montreal,Department of Electrical and Computer Engineering,Canada","institution_ids":["https://openalex.org/I60158472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079435024","display_name":"Fakhreddine Ghaffari","orcid":"https://orcid.org/0000-0002-0928-7963"},"institutions":[{"id":"https://openalex.org/I4210142324","display_name":"CY Cergy Paris Universit\u00e9","ror":"https://ror.org/043htjv09","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210142324"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fakhreddine Ghaffari","raw_affiliation_strings":["CY Cergy Paris University"],"affiliations":[{"raw_affiliation_string":"CY Cergy Paris University","institution_ids":["https://openalex.org/I4210142324"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5032433481"],"corresponding_institution_ids":["https://openalex.org/I60158472"],"apc_list":null,"apc_paid":null,"fwci":0.1339,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4801679,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"294","last_page":"297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/register-file","display_name":"Register file","score":0.9165780544281006},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7695989608764648},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.76783287525177},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6294676661491394},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5594024062156677},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5380693078041077},{"id":"https://openalex.org/keywords/register","display_name":"Register (sociolinguistics)","score":0.5105267763137817},{"id":"https://openalex.org/keywords/modulo","display_name":"Modulo","score":0.4701407551765442},{"id":"https://openalex.org/keywords/factor","display_name":"Factor (programming language)","score":0.43606215715408325},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.43040382862091064},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.41663646697998047},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39383119344711304},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.38271015882492065},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.31096363067626953},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.19434574246406555},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12874308228492737},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12034893035888672},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11480993032455444},{"id":"https://openalex.org/keywords/instruction-set","display_name":"Instruction set","score":0.0876038670539856}],"concepts":[{"id":"https://openalex.org/C117280010","wikidata":"https://www.wikidata.org/wiki/Q180944","display_name":"Register file","level":3,"score":0.9165780544281006},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7695989608764648},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.76783287525177},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6294676661491394},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5594024062156677},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5380693078041077},{"id":"https://openalex.org/C2779235478","wikidata":"https://www.wikidata.org/wiki/Q286576","display_name":"Register (sociolinguistics)","level":2,"score":0.5105267763137817},{"id":"https://openalex.org/C54732982","wikidata":"https://www.wikidata.org/wiki/Q1415345","display_name":"Modulo","level":2,"score":0.4701407551765442},{"id":"https://openalex.org/C2781039887","wikidata":"https://www.wikidata.org/wiki/Q1391724","display_name":"Factor (programming language)","level":2,"score":0.43606215715408325},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.43040382862091064},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.41663646697998047},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39383119344711304},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.38271015882492065},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.31096363067626953},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.19434574246406555},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12874308228492737},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12034893035888672},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11480993032455444},{"id":"https://openalex.org/C202491316","wikidata":"https://www.wikidata.org/wiki/Q272683","display_name":"Instruction set","level":2,"score":0.0876038670539856},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icm60448.2023.10378890","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icm60448.2023.10378890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-04522846v1","is_oa":false,"landing_page_url":"https://hal.science/hal-04522846","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2023 International Conference on Microelectronics (ICM), Dec 2023, Abu Dhabi, France. pp.294-297, ⟨10.1109/ICM60448.2023.10378890⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1965425138","https://openalex.org/W2047703327","https://openalex.org/W2053166527","https://openalex.org/W2106865643","https://openalex.org/W2197494737","https://openalex.org/W2247452615","https://openalex.org/W2427698979","https://openalex.org/W2539275586","https://openalex.org/W4292070376"],"related_works":["https://openalex.org/W2117548279","https://openalex.org/W2097470475","https://openalex.org/W4312941541","https://openalex.org/W2483419948","https://openalex.org/W2407896","https://openalex.org/W1990419382","https://openalex.org/W4394246196","https://openalex.org/W2133971626","https://openalex.org/W1955718652","https://openalex.org/W2242908068"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3,67],"application":[4],"specific-approach":[5],"to":[6,17,32,96],"estimate":[7],"the":[8,18,27,34,40,46,50,54,58,70,74,98],"soft":[9,37],"error":[10],"failure":[11],"rate":[12],"of":[13,20,36,57,73,101],"a":[14],"circuit":[15],"due":[16],"effect":[19],"external":[21],"radiations.":[22],"The":[23],"proposed":[24],"approach":[25],"utilizes":[26],"Satisfiability":[28],"modulo":[29],"theory":[30],"(SMT)":[31],"evaluate":[33],"impact":[35],"errors":[38],"on":[39,69,83],"microprocessor's":[41],"register":[42,71],"file.":[43],"We":[44],"investigate":[45],"vulnerable":[47],"factors":[48],"at":[49],"gate":[51],"level":[52],"using":[53],"layout":[55],"information":[56],"circuit.":[59],"A":[60],"case":[61],"study":[62],"is":[63],"conducted":[64],"by":[65],"performing":[66],"analysis":[68],"file":[72],"openMSP430":[75],"core":[76],"for":[77],"benchmark":[78],"programs.":[79],"Exhaustive":[80],"analyses":[81,92],"focused":[82],"single":[84],"and":[85],"multiple":[86],"event":[87],"transients":[88],"were":[89],"performed.":[90],"These":[91],"have":[93],"been":[94],"used":[95],"measure":[97],"vulnerability":[99],"factor":[100],"different":[102],"registers,":[103],"identifying":[104],"their":[105],"application-specific":[106],"criticality.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}