{"id":"https://openalex.org/W4206423782","doi":"https://doi.org/10.1109/icm52667.2021.9664963","title":"Design and Fabrication of Rad-hard Low Power CMOS Temperature Sensor for Space Applications at 180nm","display_name":"Design and Fabrication of Rad-hard Low Power CMOS Temperature Sensor for Space Applications at 180nm","publication_year":2021,"publication_date":"2021-12-19","ids":{"openalex":"https://openalex.org/W4206423782","doi":"https://doi.org/10.1109/icm52667.2021.9664963"},"language":"en","primary_location":{"id":"doi:10.1109/icm52667.2021.9664963","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm52667.2021.9664963","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081551103","display_name":"Ashutosh Yadav","orcid":"https://orcid.org/0000-0003-4547-224X"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ashutosh Yadav","raw_affiliation_strings":["Indian Institute of Technology, Roorkee","Semi-Conductor Laboratory, Chandigarh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Roorkee","institution_ids":["https://openalex.org/I154851008"]},{"raw_affiliation_string":"Semi-Conductor Laboratory, Chandigarh","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031850929","display_name":"Anand Bulusu","orcid":"https://orcid.org/0000-0002-3986-3730"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anand Bulusu","raw_affiliation_strings":["Indian Institute of Technology, Roorkee"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Roorkee","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064560509","display_name":"Sudeb Dasgupta","orcid":"https://orcid.org/0000-0002-4044-1594"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sudeb Dasgupta","raw_affiliation_strings":["Indian Institute of Technology, Roorkee"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Roorkee","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084187505","display_name":"Surinder Singh","orcid":"https://orcid.org/0000-0001-6348-1743"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Surinder Singh","raw_affiliation_strings":["Semi-Conductor Laboratory, Chandigarh"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semi-Conductor Laboratory, Chandigarh","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.628,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.84036245,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"166","last_page":"169"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.848407506942749},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.6937530040740967},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5781172513961792},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5351107716560364},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.5091542601585388},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.49089938402175903},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.47533416748046875},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4621930718421936},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.4438442885875702},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4189613163471222},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.38405248522758484},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3713352084159851},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3445567488670349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3395920991897583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2504839301109314},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16287249326705933}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.848407506942749},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.6937530040740967},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5781172513961792},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5351107716560364},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.5091542601585388},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.49089938402175903},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.47533416748046875},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4621930718421936},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4438442885875702},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4189613163471222},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.38405248522758484},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3713352084159851},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3445567488670349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3395920991897583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2504839301109314},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16287249326705933},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm52667.2021.9664963","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm52667.2021.9664963","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1527855434","https://openalex.org/W1675518556","https://openalex.org/W1964116095","https://openalex.org/W2111427475","https://openalex.org/W2344834436","https://openalex.org/W2543209405","https://openalex.org/W6631675838","https://openalex.org/W6641190841","https://openalex.org/W6676368206","https://openalex.org/W7049180026"],"related_works":["https://openalex.org/W3122096049","https://openalex.org/W140691178","https://openalex.org/W2034106250","https://openalex.org/W2097993883","https://openalex.org/W1964153648","https://openalex.org/W2168638127","https://openalex.org/W4206423782","https://openalex.org/W4249934669","https://openalex.org/W1972985293","https://openalex.org/W2970070696"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"presented":[4],"a":[5,47,58],"CMOS":[6,43],"proportional":[7],"to":[8,23,52],"absolute":[9],"temperature":[10],"(PTAT)":[11],"sensor":[12],"using":[13,39],"subthreshold":[14],"MOS":[15],"devices":[16],"and":[17,65,78],"output":[18],"of":[19,28,61],"PTAT":[20],"is":[21,36],"1Vpp":[22],"match":[24],"the":[25],"dynamic":[26],"range":[27,49],"next":[29],"stage":[30],"data":[31],"acquisition":[32],"systems.":[33],"The":[34,54],"circuit":[35],"first":[37],"evaluated":[38],"SPICE":[40],"with":[41,71],"0.18\u03bcm":[42],"device":[44,56],"parameters":[45],"across":[46],"wide-temperature":[48],"from":[50],"\u221240\u00b0C":[51],"125\u00b0C.":[53],"fabricated":[55],"occupies":[57],"die":[59],"area":[60],"0.013mm2(=170\u00b5m":[62],"X":[63],"78\u00b5m)":[64],"consumes":[66],"power":[67,73],"less":[68],"than":[69],"15\u00b5W":[70],"3.3V":[72],"supply.":[74],"Radiation":[75],"effects":[76],"characterization":[77],"analysis":[79],"has":[80],"been":[81],"done":[82],"on":[83],"PTAT.":[84]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}