{"id":"https://openalex.org/W4205349070","doi":"https://doi.org/10.1109/icm52667.2021.9664911","title":"Novel Sensors Design for SHM of RC Using the Opto-Mechatronics Technologies","display_name":"Novel Sensors Design for SHM of RC Using the Opto-Mechatronics Technologies","publication_year":2021,"publication_date":"2021-12-19","ids":{"openalex":"https://openalex.org/W4205349070","doi":"https://doi.org/10.1109/icm52667.2021.9664911"},"language":"en","primary_location":{"id":"doi:10.1109/icm52667.2021.9664911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm52667.2021.9664911","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103249839","display_name":"Amir R. Ali","orcid":"https://orcid.org/0000-0002-7640-9174"},"institutions":[{"id":"https://openalex.org/I96823368","display_name":"German University in Cairo","ror":"https://ror.org/03rjt0z37","country_code":"EG","type":"education","lineage":["https://openalex.org/I96823368"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Amir R. Ali","raw_affiliation_strings":["Applied-Science & Robotics Laboratory for Applied-Mechatronics (ARAtronics Laboratory), German University in Cairo (GUC), New Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied-Science & Robotics Laboratory for Applied-Mechatronics (ARAtronics Laboratory), German University in Cairo (GUC), New Cairo, Egypt","institution_ids":["https://openalex.org/I96823368"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108729918","display_name":"Ahmed Raouf","orcid":null},"institutions":[{"id":"https://openalex.org/I96823368","display_name":"German University in Cairo","ror":"https://ror.org/03rjt0z37","country_code":"EG","type":"education","lineage":["https://openalex.org/I96823368"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ahmed Raouf","raw_affiliation_strings":["German University in Cairo (GUC), New Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"German University in Cairo (GUC), New Cairo, Egypt","institution_ids":["https://openalex.org/I96823368"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043343219","display_name":"Amr El-Nemr","orcid":"https://orcid.org/0000-0001-8556-6086"},"institutions":[{"id":"https://openalex.org/I96823368","display_name":"German University in Cairo","ror":"https://ror.org/03rjt0z37","country_code":"EG","type":"education","lineage":["https://openalex.org/I96823368"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Amr ElNemr","raw_affiliation_strings":["German University in Cairo (GUC), New Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"German University in Cairo (GUC), New Cairo, Egypt","institution_ids":["https://openalex.org/I96823368"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I96823368"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16367056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"99","issue":null,"first_page":"224","last_page":"227"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rendering","display_name":"Rendering (computer graphics)","score":0.6596691608428955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6297358870506287},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5693050622940063},{"id":"https://openalex.org/keywords/mechatronics","display_name":"Mechatronics","score":0.5531182289123535},{"id":"https://openalex.org/keywords/electromotive-force","display_name":"Electromotive force","score":0.47341209650039673},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.4434340298175812},{"id":"https://openalex.org/keywords/structural-health-monitoring","display_name":"Structural health monitoring","score":0.422555148601532},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.32665666937828064},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32561564445495605},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.30857428908348083},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28682994842529297},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21975043416023254},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.15951982140541077}],"concepts":[{"id":"https://openalex.org/C205711294","wikidata":"https://www.wikidata.org/wiki/Q176953","display_name":"Rendering (computer graphics)","level":2,"score":0.6596691608428955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6297358870506287},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5693050622940063},{"id":"https://openalex.org/C28704281","wikidata":"https://www.wikidata.org/wiki/Q180165","display_name":"Mechatronics","level":2,"score":0.5531182289123535},{"id":"https://openalex.org/C127535462","wikidata":"https://www.wikidata.org/wiki/Q185329","display_name":"Electromotive force","level":2,"score":0.47341209650039673},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.4434340298175812},{"id":"https://openalex.org/C2776247918","wikidata":"https://www.wikidata.org/wiki/Q1423713","display_name":"Structural health monitoring","level":2,"score":0.422555148601532},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.32665666937828064},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32561564445495605},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.30857428908348083},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28682994842529297},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21975043416023254},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.15951982140541077},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm52667.2021.9664911","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm52667.2021.9664911","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W600180812","https://openalex.org/W1632840482","https://openalex.org/W1735654083","https://openalex.org/W1973299141","https://openalex.org/W2011226752","https://openalex.org/W2018036694","https://openalex.org/W2033151804","https://openalex.org/W2042172700","https://openalex.org/W2109176808","https://openalex.org/W2124075656","https://openalex.org/W2166250628","https://openalex.org/W2288227736","https://openalex.org/W2346733354","https://openalex.org/W2902226106","https://openalex.org/W2914719797","https://openalex.org/W3021104963","https://openalex.org/W3029261575","https://openalex.org/W3120558153","https://openalex.org/W3199586233","https://openalex.org/W6788459891"],"related_works":["https://openalex.org/W17155033","https://openalex.org/W3207760230","https://openalex.org/W1496222301","https://openalex.org/W4312814274","https://openalex.org/W1590307681","https://openalex.org/W2536018345","https://openalex.org/W4285370786","https://openalex.org/W2296488620","https://openalex.org/W2358353312","https://openalex.org/W2353836703"],"abstract_inverted_index":{"recently,":[0],"health":[1],"monitoring":[2,93],"of":[3,12,17,33,41,120,174],"structures":[4,54,68],"possesses":[5],"great":[6],"attention":[7],"for":[8,51,65,75,136,145],"various":[9],"purposes.":[10],"One":[11],"them":[13],"follows":[14],"the":[15,18,39,62,72,77,94,106,110,114,118,121,140,143,146,158,161,179,184,189],"status":[16],"existing":[19,53,67],"structure,":[20],"especially":[21],"if":[22],"it":[23,37,60],"is":[24,149],"an":[25],"infrastructure":[26],"that":[27],"handles":[28],"traffic":[29],"load":[30],"and":[31,43,55,69,97,131],"mainstream":[32],"any":[34,66],"country.":[35],"Secondly,":[36],"lowers":[38,61],"cost":[40,64],"maintenance":[42],"rehabilitation":[44],"as":[45],"no":[46],"human":[47],"skills":[48],"are":[49,90,101,134],"required":[50,73],"testing":[52],"evaluating":[56],"manuals.":[57],"In":[58,83],"addition,":[59],"budget":[63,74],"specifies":[70],"exactly":[71],"repairing":[76],"defective":[78],"parts":[79],"in":[80],"these":[81],"structures.":[82],"this":[84],"paper,":[85],"two":[86,172],"novel":[87],"new":[88],"techniques":[89,100],"suggested":[91],"over":[92,188],"structures:":[95],"external":[96],"internal.":[98],"The":[99,128,169],"mainly":[102],"based":[103],"on":[104,109,183],"reading":[105],"deformation":[107,132],"optically":[108],"first":[111,147,180],"technique,":[112,181],"while":[113],"second":[115,162],"technique":[116,148,163],"exploits":[117],"measurement":[119],"back":[122],"electromotive":[123],"force":[124],"(back":[125],"EMF":[126],"voltages).":[127],"output":[129],"voltages":[130],"readings":[133],"reported":[135,150],"supported":[137],"beams.":[138],"From":[139],"analytical":[141],"results,":[142],"resolution":[144],"up":[151],"to":[152],"0.2N,":[153],"around":[154,167],"20":[155],"gm":[156],"On":[157],"other":[159,190],"hand,":[160],"implied":[164],"31.25N,":[165],"rendering":[166],"3186.6gm":[168],"results":[170],"show":[171],"orders":[173],"magnitudes":[175],"enhancement":[176],"when":[177],"using":[178],"depending":[182],"optical":[185],"sensing":[186],"element":[187],"one.":[191]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}