{"id":"https://openalex.org/W3126692575","doi":"https://doi.org/10.1109/icm50269.2020.9331502","title":"Controllable OTA Slew-rate for CMOS Image Sensor","display_name":"Controllable OTA Slew-rate for CMOS Image Sensor","publication_year":2020,"publication_date":"2020-12-14","ids":{"openalex":"https://openalex.org/W3126692575","doi":"https://doi.org/10.1109/icm50269.2020.9331502","mag":"3126692575"},"language":"en","primary_location":{"id":"doi:10.1109/icm50269.2020.9331502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm50269.2020.9331502","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 32nd International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076989940","display_name":"Ola Ibrahim","orcid":null},"institutions":[{"id":"https://openalex.org/I57629906","display_name":"Nile University","ror":"https://ror.org/03cg7cp61","country_code":"EG","type":"education","lineage":["https://openalex.org/I57629906"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ola Ibrahim","raw_affiliation_strings":["Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt","institution_ids":["https://openalex.org/I57629906"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005253441","display_name":"Rana Hesham","orcid":null},"institutions":[{"id":"https://openalex.org/I57629906","display_name":"Nile University","ror":"https://ror.org/03cg7cp61","country_code":"EG","type":"education","lineage":["https://openalex.org/I57629906"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Rana Hesham","raw_affiliation_strings":["Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt","institution_ids":["https://openalex.org/I57629906"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087371461","display_name":"Ahmed Soltan","orcid":"https://orcid.org/0000-0002-5153-3056"},"institutions":[{"id":"https://openalex.org/I57629906","display_name":"Nile University","ror":"https://ror.org/03cg7cp61","country_code":"EG","type":"education","lineage":["https://openalex.org/I57629906"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ahmed Soltan","raw_affiliation_strings":["Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Integrated Systems Center (NISC), Nile University, Giza, Egypt","institution_ids":["https://openalex.org/I57629906"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1041,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.46835142,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"227","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.900583028793335},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.6306546926498413},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5655047297477722},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.5309789776802063},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.5224263072013855},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4936012029647827},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48933571577072144},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.447995126247406},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44560444355010986},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.3930610120296478},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.38784340023994446},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.34174662828445435},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23937037587165833},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15260544419288635},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13769292831420898},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.11086243391036987}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.900583028793335},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.6306546926498413},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5655047297477722},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.5309789776802063},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.5224263072013855},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4936012029647827},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48933571577072144},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.447995126247406},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44560444355010986},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.3930610120296478},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.38784340023994446},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34174662828445435},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23937037587165833},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15260544419288635},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13769292831420898},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11086243391036987}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm50269.2020.9331502","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm50269.2020.9331502","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 32nd International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W154521691","https://openalex.org/W594546823","https://openalex.org/W1985964745","https://openalex.org/W2147497875","https://openalex.org/W2160610278","https://openalex.org/W2585597896","https://openalex.org/W2603550894","https://openalex.org/W2659908032","https://openalex.org/W2767717632","https://openalex.org/W2885358920","https://openalex.org/W2949718230","https://openalex.org/W2975938667","https://openalex.org/W2981823490","https://openalex.org/W3005292989","https://openalex.org/W4285674669","https://openalex.org/W6606221822"],"related_works":["https://openalex.org/W2783539788","https://openalex.org/W4293528144","https://openalex.org/W2792031931","https://openalex.org/W2341419291","https://openalex.org/W101534108","https://openalex.org/W2074850648","https://openalex.org/W2134780641","https://openalex.org/W4235119538","https://openalex.org/W2384930422","https://openalex.org/W2391811601"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"a":[3,28,102],"proposed":[4,25,90],"circuit":[5,59,91],"is":[6,41,46],"implemented":[7],"using":[8],"tsmc":[9],"0.18um":[10],"technology":[11],"of":[12,27,63,85,100],"area":[13],"16642":[14],"um":[15],"<sup":[16],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[17],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[18],"with":[19],"supply":[20],"voltage":[21],"equals":[22],"5V.":[23],"A":[24],"implementation":[26],"controllable":[29],"Operational":[30],"Transconductance":[31],"Amplifier":[32],"(OTA)":[33],"slew":[34,44,105],"rate":[35,45],"for":[36,54],"CMOS":[37],"image":[38,86],"sensor":[39],"(CIS)":[40],"proposed.":[42],"The":[43,57,89],"controlled":[47],"by":[48,96],"switching":[49],"between":[50],"various":[51],"bias":[52,113],"circuits":[53],"the":[55,61,70,74,78,83,98,109,112,119],"OTA.":[56],"biasing":[58],"controls":[60],"value":[62],"OTA":[64],"biased":[65],"current,":[66],"which":[67],"allows":[68,92],"controlling":[69,93],"amplifier's":[71],"characteristics.":[72],"As":[73],"flicker":[75],"noise":[76,94,122],"in":[77,81],"main":[79],"contributor":[80],"reducing":[82,108],"quality":[84],"sensors":[87],"performance.":[88],"effect":[95],"increasing":[97],"time":[99],"reading":[101],"pixel":[103],"signal(OTA":[104],"rate).":[106],"For":[107],"power":[110],"consumption,":[111],"cell":[114],"can":[115],"be":[116],"selected":[117],"regarding":[118],"signal":[120],"to":[121],"ratio":[123],"(SNR)":[124],"value.":[125]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}