{"id":"https://openalex.org/W3012489601","doi":"https://doi.org/10.1109/icm48031.2019.9021709","title":"FPGA-based Ethernet Switch for NCS with Partial Fault Tolerance","display_name":"FPGA-based Ethernet Switch for NCS with Partial Fault Tolerance","publication_year":2019,"publication_date":"2019-12-01","ids":{"openalex":"https://openalex.org/W3012489601","doi":"https://doi.org/10.1109/icm48031.2019.9021709","mag":"3012489601"},"language":"en","primary_location":{"id":"doi:10.1109/icm48031.2019.9021709","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm48031.2019.9021709","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 31st International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028522101","display_name":"Gehad I. Alkady","orcid":"https://orcid.org/0000-0002-1965-8377"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Gehad I. Alkady","raw_affiliation_strings":["Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110743704","display_name":"Ram\u00e8z M. Daoud","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ramez M. Daoud","raw_affiliation_strings":["Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hassanein H. Amer","raw_affiliation_strings":["Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011613970","display_name":"Hassan H. Halawa","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hassan H. Halawa","raw_affiliation_strings":["Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5098003233","display_name":"Kawther Alshureify","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Kawther Alshureify","raw_affiliation_strings":["Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. And Comm. Eng. Dept., The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001909113","display_name":"Ihab Adly","orcid":"https://orcid.org/0000-0003-4513-9818"},"institutions":[{"id":"https://openalex.org/I154023281","display_name":"British University in Egypt","ror":"https://ror.org/0066fxv63","country_code":"EG","type":"education","lineage":["https://openalex.org/I154023281"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ihab Adly","raw_affiliation_strings":["Electrical Eng. Dept., The British University in Egypt, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Eng. Dept., The British University in Egypt, Cairo, Egypt","institution_ids":["https://openalex.org/I154023281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102912766","display_name":"Hany M. ElSayed","orcid":"https://orcid.org/0000-0003-1066-2238"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hany M. ElSayed","raw_affiliation_strings":["Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075607669","display_name":"Manar N. Shaker","orcid":"https://orcid.org/0009-0001-9140-4371"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Manar N. Shaker","raw_affiliation_strings":["Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003417381","display_name":"Mohamed Refky","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed Refky","raw_affiliation_strings":["Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elect. & Comm. Eng. Dept., Cairo University, Cairo, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044327399","display_name":"Tarek K. Refaat","orcid":"https://orcid.org/0000-0003-3382-0905"},"institutions":[{"id":"https://openalex.org/I4210127351","display_name":"Cisco Systems (Canada)","ror":"https://ror.org/02af0qw97","country_code":"CA","type":"company","lineage":["https://openalex.org/I135428043","https://openalex.org/I4210127351"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Tarek K. Refaat","raw_affiliation_strings":["Engineering Department, Cisco Systems, Inc., Ottawa, ON, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Department, Cisco Systems, Inc., Ottawa, ON, Canada","institution_ids":["https://openalex.org/I4210127351"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024264738","display_name":"Markus Rentschler","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Markus Rentschler","raw_affiliation_strings":["Business Unit Networking Balluff GmbH, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Business Unit Networking Balluff GmbH, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.186,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.60113079,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"32","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12216","display_name":"Network Time Synchronization Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12216","display_name":"Network Time Synchronization Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7243248224258423},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.6814024448394775},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6695095896720886},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6077775359153748},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5928671360015869},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5665818452835083},{"id":"https://openalex.org/keywords/ethernet","display_name":"Ethernet","score":0.5338315367698669},{"id":"https://openalex.org/keywords/industrial-ethernet","display_name":"Industrial Ethernet","score":0.5050466656684875},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4603853225708008},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.43481868505477905},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.24814218282699585},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.20049774646759033}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7243248224258423},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.6814024448394775},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6695095896720886},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6077775359153748},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5928671360015869},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5665818452835083},{"id":"https://openalex.org/C172173386","wikidata":"https://www.wikidata.org/wiki/Q79984","display_name":"Ethernet","level":2,"score":0.5338315367698669},{"id":"https://openalex.org/C167151114","wikidata":"https://www.wikidata.org/wiki/Q1661930","display_name":"Industrial Ethernet","level":3,"score":0.5050466656684875},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4603853225708008},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.43481868505477905},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.24814218282699585},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.20049774646759033},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm48031.2019.9021709","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm48031.2019.9021709","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 31st International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49000000953674316,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1566296806","https://openalex.org/W1962983140","https://openalex.org/W1982689108","https://openalex.org/W2002137790","https://openalex.org/W2040186632","https://openalex.org/W2044978933","https://openalex.org/W2075762488","https://openalex.org/W2104086123","https://openalex.org/W2426218908","https://openalex.org/W2734886195","https://openalex.org/W2763425418","https://openalex.org/W2783408164","https://openalex.org/W6634123939"],"related_works":["https://openalex.org/W2808484818","https://openalex.org/W2810427553","https://openalex.org/W2135053878","https://openalex.org/W2941434274","https://openalex.org/W2340647897","https://openalex.org/W4249632163","https://openalex.org/W1760305469","https://openalex.org/W2797161794","https://openalex.org/W2073075351","https://openalex.org/W2096938998"],"abstract_inverted_index":{"Networked":[0],"Control":[1],"Systems":[2],"(NCSs)":[3],"are":[4,19,127],"very":[5,20],"important":[6],"components":[7],"in":[8,49],"industrial":[9,15],"control.":[10],"Due":[11],"to":[12,22,33,67,139],"the":[13,45,75,93,108,111,120,124,132,140],"harsh":[14],"environment,":[16],"these":[17],"systems":[18],"prone":[21],"different":[23],"types":[24,51],"of":[25,52,110,118],"faults.":[26,104],"Accordingly,":[27],"fault-tolerant":[28,60],"techniques":[29],"should":[30],"be":[31,58,65,72],"applied":[32],"extend":[34],"their":[35,83],"lifetime.":[36],"This":[37],"paper":[38],"proposes":[39],"a":[40],"cost-efficient":[41],"NCS":[42],"by":[43,81],"using":[44,87],"FPGA":[46,56,94],"already":[47],"existing":[48],"some":[50],"Ethernet":[53],"switches.":[54],"The":[55,98],"will":[57,64],"partially":[59],"and":[61,95,123],"its":[62],"size":[63],"increased":[66],"guarantee":[68],"that":[69,107,131],"it":[70],"can":[71],"used":[73,101],"for":[74],"following":[76],"tasks:":[77],"recovering":[78],"faulty":[79],"controllers":[80],"downloading":[82],"partial":[84],"BIT":[85],"files":[86],"Dynamic":[88],"Partial":[89],"Reconfiguration":[90],"(DPR)":[91],"inside":[92],"dew":[96],"analysis.":[97],"fault":[99],"model":[100],"is":[102,114],"hard":[103],"To":[105],"verify":[106],"reliability":[109,135],"proposed":[112,121,133],"system":[113,122,126,134],"improved,":[115],"Markov":[116],"models":[117],"both":[119],"simplex":[125,141],"built.":[128],"Results":[129],"show":[130],"increases":[136],"significantly":[137],"compared":[138],"system.":[142]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}