{"id":"https://openalex.org/W2587197590","doi":"https://doi.org/10.1109/icm.2016.7847923","title":"Digital signature based test of analogue circuits using amplitude modulated multi-tone signals","display_name":"Digital signature based test of analogue circuits using amplitude modulated multi-tone signals","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2587197590","doi":"https://doi.org/10.1109/icm.2016.7847923","mag":"2587197590"},"language":"en","primary_location":{"id":"doi:10.1109/icm.2016.7847923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069413489","display_name":"Mohamed Saad Saleh","orcid":"https://orcid.org/0000-0003-4226-295X"},"institutions":[{"id":"https://openalex.org/I4210100308","display_name":"Military Technical College","ror":"https://ror.org/01337pb37","country_code":"EG","type":"education","lineage":["https://openalex.org/I4210100308"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Mohamed S. Saleh","raw_affiliation_strings":["Military Technical College, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Military Technical College, Cairo, Egypt","institution_ids":["https://openalex.org/I4210100308"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045830887","display_name":"Mohamed H. El-Mahlawy","orcid":"https://orcid.org/0000-0002-7012-9702"},"institutions":[{"id":"https://openalex.org/I186217134","display_name":"Future University in Egypt","ror":"https://ror.org/03s8c2x09","country_code":"EG","type":"education","lineage":["https://openalex.org/I186217134"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Mohamed H. El-Mahlawy","raw_affiliation_strings":["Electrical Eng. Dep., Faulty of Engineering and Technology, Future University, Egypt"],"affiliations":[{"raw_affiliation_string":"Electrical Eng. Dep., Faulty of Engineering and Technology, Future University, Egypt","institution_ids":["https://openalex.org/I186217134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073749500","display_name":"Hossam Hassan","orcid":"https://orcid.org/0000-0002-9940-5627"},"institutions":[{"id":"https://openalex.org/I4210100308","display_name":"Military Technical College","ror":"https://ror.org/01337pb37","country_code":"EG","type":"education","lineage":["https://openalex.org/I4210100308"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hossam E. Abou-Bakr Hassan","raw_affiliation_strings":["Military Technical College, Cairo, EG"],"affiliations":[{"raw_affiliation_string":"Military Technical College, Cairo, EG","institution_ids":["https://openalex.org/I4210100308"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5069413489"],"corresponding_institution_ids":["https://openalex.org/I4210100308"],"apc_list":null,"apc_paid":null,"fwci":1.2613,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.80355464,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"117","last_page":"120"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6220206022262573},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5916776061058044},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.5908375382423401},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5797922015190125},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.5096712112426758},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5091971755027771},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5029589533805847},{"id":"https://openalex.org/keywords/tone","display_name":"Tone (literature)","score":0.4912964701652527},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4823714792728424},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.46109047532081604},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.453048437833786},{"id":"https://openalex.org/keywords/detection-theory","display_name":"Detection theory","score":0.42652687430381775},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40390342473983765},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3710956871509552},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3410462737083435},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1795058250427246},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1544111967086792},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13251090049743652},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11749446392059326},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10266426205635071},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08535653352737427},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.06881502270698547}],"concepts":[{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6220206022262573},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5916776061058044},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.5908375382423401},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5797922015190125},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.5096712112426758},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5091971755027771},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5029589533805847},{"id":"https://openalex.org/C2780583480","wikidata":"https://www.wikidata.org/wiki/Q1366327","display_name":"Tone (literature)","level":2,"score":0.4912964701652527},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4823714792728424},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.46109047532081604},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.453048437833786},{"id":"https://openalex.org/C137270730","wikidata":"https://www.wikidata.org/wiki/Q120811","display_name":"Detection theory","level":3,"score":0.42652687430381775},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40390342473983765},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3710956871509552},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3410462737083435},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1795058250427246},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1544111967086792},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13251090049743652},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11749446392059326},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10266426205635071},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08535653352737427},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.06881502270698547},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm.2016.7847923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1532286644","https://openalex.org/W1950483953","https://openalex.org/W1976387361","https://openalex.org/W1999141085","https://openalex.org/W2004443640","https://openalex.org/W2046119243","https://openalex.org/W2098533420","https://openalex.org/W2120514720","https://openalex.org/W2129444872","https://openalex.org/W2131693096","https://openalex.org/W2153484316","https://openalex.org/W2162696040","https://openalex.org/W2307960883","https://openalex.org/W2344737359","https://openalex.org/W2474843360","https://openalex.org/W2493114542"],"related_works":["https://openalex.org/W2150780157","https://openalex.org/W2171636001","https://openalex.org/W2951627661","https://openalex.org/W2149949200","https://openalex.org/W1993241318","https://openalex.org/W4210264033","https://openalex.org/W4301628046","https://openalex.org/W2142519941","https://openalex.org/W2118744143","https://openalex.org/W2587197590"],"abstract_inverted_index":{"In":[0],"this":[1,41],"paper,":[2],"a":[3,78,89],"new":[4],"multi-tone":[5,79,126,135],"test":[6,24,59,68,76,80,91,115],"method":[7,17,42],"for":[8,139],"fault":[9,53,111,142],"detection":[10,112,143,148],"of":[11,22,62,84,95,99,113,149,152],"analogue":[12,65,107],"circuits":[13],"is":[14,27,43,82,119,137],"presented.":[15],"This":[16],"determines":[18],"all":[19,85],"applicable":[20,72,86,101],"frequencies":[21,87,102],"the":[23,33,52,57,64,75,96,110,114,123,133,140,153],"set":[25],"that":[26,40,132],"ranked,":[28],"and":[29,56],"then":[30],"compacted":[31],"using":[32],"digital":[34],"signature.":[35],"The":[36,93,128],"experimental":[37,129],"results":[38,130],"show":[39],"effective":[44],"over":[45],"previous":[46],"published":[47],"related":[48],"testing":[49,63],"methods":[50],"in":[51,74,88],"simulation":[54],"count":[55],"application":[58],"time.":[60],"Instead":[61],"circuit":[66],"under":[67],"(ACUT)":[69],"at":[70],"each":[71],"frequency":[73],"set,":[77],"signal":[81,136],"composed":[83],"single":[90],"signal.":[92,127],"attenuation":[94],"amplitude":[97,124],"component":[98],"some":[100],"due":[103],"to":[104,146],"passing":[105],"through":[106],"filters":[108],"reduces":[109],"set.":[116],"Therefore,":[117],"it":[118],"solved":[120],"by":[121],"applying":[122],"modulated":[125,134],"illustrate":[131],"better":[138,147],"early":[141],"which":[144],"leads":[145],"parametric":[150],"faults":[151],"ACUT.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}