{"id":"https://openalex.org/W2587540887","doi":"https://doi.org/10.1109/icm.2016.7847905","title":"Hall sensor system design and modeling for current-measurement in power meters","display_name":"Hall sensor system design and modeling for current-measurement in power meters","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2587540887","doi":"https://doi.org/10.1109/icm.2016.7847905","mag":"2587540887"},"language":"en","primary_location":{"id":"doi:10.1109/icm.2016.7847905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847905","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017973440","display_name":"Zhou Baizhong","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Baizhong Zhou","raw_affiliation_strings":["Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100543068","display_name":"Xunhua Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xunhua Guo","raw_affiliation_strings":["Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041785530","display_name":"Mohamed Atef","orcid":"https://orcid.org/0000-0002-3344-6127"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mohamed Atef","raw_affiliation_strings":["Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro/Nano-electronics, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5017973440"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.16772398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"64","issue":null,"first_page":"49","last_page":"52"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.8539347648620605},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6114229559898376},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6019240021705627},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5970933437347412},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.538731575012207},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5323828458786011},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.5120961666107178},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.4938979744911194},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.47799152135849},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4646242558956146},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4369678497314453},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4227771461009979},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.3588099479675293},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20970875024795532},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13598409295082092}],"concepts":[{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.8539347648620605},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6114229559898376},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6019240021705627},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5970933437347412},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.538731575012207},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5323828458786011},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.5120961666107178},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.4938979744911194},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.47799152135849},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4646242558956146},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4369678497314453},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4227771461009979},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.3588099479675293},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20970875024795532},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13598409295082092},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.0},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm.2016.7847905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847905","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7099999785423279}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1986634776","https://openalex.org/W2067541678","https://openalex.org/W2068200693","https://openalex.org/W2111146447","https://openalex.org/W2112611349","https://openalex.org/W2117426512","https://openalex.org/W2129952074","https://openalex.org/W2153019383","https://openalex.org/W2161389065","https://openalex.org/W2322297005","https://openalex.org/W6948322191"],"related_works":["https://openalex.org/W3162919010","https://openalex.org/W2622830326","https://openalex.org/W2151516162","https://openalex.org/W4396766766","https://openalex.org/W2906319801","https://openalex.org/W2373461325","https://openalex.org/W2384861391","https://openalex.org/W1667373633","https://openalex.org/W2370291732","https://openalex.org/W2007447343"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,8,46,55,65],"system":[4,30,35,47],"level":[5],"design":[6],"for":[7,71],"proposed":[9],"Hall":[10,32,67],"sensor":[11,68],"chip":[12],"fabricated":[13],"in":[14,19],"0.35":[15],"\u03bcm":[16],"CMOS":[17],"used":[18],"power":[20],"meters.":[21],"Based":[22],"on":[23,26,50],"theoretical":[24],"analysis":[25],"key":[27],"circuits":[28],"and":[29,54,60],"of":[31,64],"sensor,":[33],"important":[34],"parameters":[36],"have":[37],"been":[38],"selected.":[39],"In":[40],"order":[41],"to":[42],"verify":[43],"the":[44,58,61],"design,":[45],"model":[48],"based":[49],"SIMULINK":[51],"is":[52,69],"built":[53],"comparison":[56],"between":[57],"simulated":[59],"measured":[62],"results":[63],"prototype":[66],"presented":[70],"verification.":[72]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}