{"id":"https://openalex.org/W2586659537","doi":"https://doi.org/10.1109/icm.2016.7847877","title":"Self-calibrating enabled low cost, two channel type K thermocouple interface for microcontrollers","display_name":"Self-calibrating enabled low cost, two channel type K thermocouple interface for microcontrollers","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2586659537","doi":"https://doi.org/10.1109/icm.2016.7847877","mag":"2586659537"},"language":"en","primary_location":{"id":"doi:10.1109/icm.2016.7847877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086478049","display_name":"Hesham H. Shaker","orcid":"https://orcid.org/0000-0001-5853-170X"},"institutions":[{"id":"https://openalex.org/I3089115","display_name":"Egyptian Atomic Energy Authority","ror":"https://ror.org/04hd0yz67","country_code":"EG","type":"government","lineage":["https://openalex.org/I3089115"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Hesham H. Shaker","raw_affiliation_strings":["EAEA, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"EAEA, Cairo, Egypt","institution_ids":["https://openalex.org/I3089115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101724406","display_name":"Alaa Saleh","orcid":"https://orcid.org/0000-0002-5455-2279"},"institutions":[{"id":"https://openalex.org/I3089115","display_name":"Egyptian Atomic Energy Authority","ror":"https://ror.org/04hd0yz67","country_code":"EG","type":"government","lineage":["https://openalex.org/I3089115"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A. A. Saleh","raw_affiliation_strings":["EAEA, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"EAEA, Cairo, Egypt","institution_ids":["https://openalex.org/I3089115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108771540","display_name":"Azza H. Ali","orcid":null},"institutions":[{"id":"https://openalex.org/I3089115","display_name":"Egyptian Atomic Energy Authority","ror":"https://ror.org/04hd0yz67","country_code":"EG","type":"government","lineage":["https://openalex.org/I3089115"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Azza H. Ali","raw_affiliation_strings":["EAEA, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"EAEA, Cairo, Egypt","institution_ids":["https://openalex.org/I3089115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108224711","display_name":"M. Abd Elaziz","orcid":null},"institutions":[{"id":"https://openalex.org/I3089115","display_name":"Egyptian Atomic Energy Authority","ror":"https://ror.org/04hd0yz67","country_code":"EG","type":"government","lineage":["https://openalex.org/I3089115"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M. Abd Elaziz","raw_affiliation_strings":["EAEA, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"EAEA, Cairo, Egypt","institution_ids":["https://openalex.org/I3089115"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5086478049"],"corresponding_institution_ids":["https://openalex.org/I3089115"],"apc_list":null,"apc_paid":null,"fwci":0.5791,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.74379398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"44","issue":null,"first_page":"309","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9835000038146973,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thermocouple","display_name":"Thermocouple","score":0.8077369928359985},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7847433686256409},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.7105820178985596},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5485560894012451},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41737979650497437},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41717201471328735},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40869176387786865},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3821461796760559},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3802194595336914},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.226921945810318},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.16022738814353943}],"concepts":[{"id":"https://openalex.org/C168068576","wikidata":"https://www.wikidata.org/wiki/Q190241","display_name":"Thermocouple","level":2,"score":0.8077369928359985},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7847433686256409},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.7105820178985596},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5485560894012451},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41737979650497437},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41717201471328735},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40869176387786865},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3821461796760559},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3802194595336914},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.226921945810318},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.16022738814353943},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icm.2016.7847877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icm.2016.7847877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 28th International Conference on Microelectronics (ICM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7799999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2597882700","https://openalex.org/W6734847599"],"related_works":["https://openalex.org/W2966484342","https://openalex.org/W1992175215","https://openalex.org/W2026588589","https://openalex.org/W2025486907","https://openalex.org/W2027878388","https://openalex.org/W2348639818","https://openalex.org/W2368737953","https://openalex.org/W2391951862","https://openalex.org/W3091627987","https://openalex.org/W2147310439"],"abstract_inverted_index":{"This":[0,19],"paper":[1],"presents":[2],"a":[3,7],"new":[4],"design":[5],"of":[6,44],"low":[8],"cost,":[9],"two":[10,69],"channel,":[11],"type":[12],"K":[13],"thermocouple":[14,74,78,83],"interface":[15,20,59],"circuit":[16,21],"for":[17,56],"micro-controllers.":[18],"enables":[22],"the":[23,45,57,68,77,82],"connecting":[24],"micro-controller":[25],"to":[26,34,51,66],"make":[27,52],"accurate":[28],"temperature":[29],"measurements":[30],"from":[31],"0":[32],"up":[33],"250":[35],"degree":[36,40],"Celsius":[37],"with":[38,73],"1":[39],"resolution.":[41],"The":[42],"usage":[43],"microcontrollers'":[46],"computational":[47],"capabilities":[48,62],"is":[49],"proposed":[50],"an":[53],"adaptive":[54],"self-calibration":[55],"designed":[58],"circuit.":[60],"These":[61],"are":[63],"also":[64],"used":[65],"solve":[67],"major":[70],"problems":[71],"associated":[72],"signal":[75],"measurement:":[76],"non-linearity":[79],"problems;":[80],"and":[81],"reference":[84],"junction":[85],"problems.":[86]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}