{"id":"https://openalex.org/W4313564361","doi":"https://doi.org/10.1109/icit48603.2022.10002822","title":"Defective Surface Detection based on Improved Faster R-CNN","display_name":"Defective Surface Detection based on Improved Faster R-CNN","publication_year":2022,"publication_date":"2022-08-22","ids":{"openalex":"https://openalex.org/W4313564361","doi":"https://doi.org/10.1109/icit48603.2022.10002822"},"language":"en","primary_location":{"id":"doi:10.1109/icit48603.2022.10002822","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icit48603.2022.10002822","pdf_url":null,"source":{"id":"https://openalex.org/S4363608411","display_name":"2022 IEEE International Conference on Industrial Technology (ICIT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090563956","display_name":"Han Duan","orcid":"https://orcid.org/0000-0001-5071-1458"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Han Duan","raw_affiliation_strings":["Fudan University,Academy for Engineering and Technology,Shanghai,China","Academy for Engineering and Technology, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,Academy for Engineering and Technology,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"Academy for Engineering and Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084344775","display_name":"Jian Huang","orcid":"https://orcid.org/0000-0002-4300-7128"},"institutions":[{"id":"https://openalex.org/I143593769","display_name":"East China University of Science and Technology","ror":"https://ror.org/01vyrm377","country_code":"CN","type":"education","lineage":["https://openalex.org/I143593769"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Huang","raw_affiliation_strings":["East China University of Science and Technology,Academy for Information Science and Engineering,Shanghai,China","Academy for Information Science and Engineering, East China University of Science and Technology, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"East China University of Science and Technology,Academy for Information Science and Engineering,Shanghai,China","institution_ids":["https://openalex.org/I143593769"]},{"raw_affiliation_string":"Academy for Information Science and Engineering, East China University of Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I143593769"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103020236","display_name":"Weike Liu","orcid":"https://orcid.org/0000-0001-8021-337X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weike Liu","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC and System,Shanghai,China","State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC and System,Shanghai,China","institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},{"raw_affiliation_string":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078781855","display_name":"Feng Shu","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Shu","raw_affiliation_strings":["Fudan University,Academy for Engineering and Technology,Shanghai,China","Academy for Engineering and Technology, Fudan University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Fudan University,Academy for Engineering and Technology,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]},{"raw_affiliation_string":"Academy for Engineering and Technology, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5090563956"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":2.4263,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.90322581,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.8482198715209961},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7878659963607788},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7332927584648132},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7091478109359741},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.6819495558738708},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6779260635375977},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6260279417037964},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.5376476049423218},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5122796893119812},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4993479251861572},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4955071210861206},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.48975324630737305},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.4880775213241577},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4750511646270752},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4501960277557373},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3770614266395569},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16740304231643677},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.081580251455307},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.057520657777786255}],"concepts":[{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.8482198715209961},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7878659963607788},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7332927584648132},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7091478109359741},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.6819495558738708},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6779260635375977},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6260279417037964},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5376476049423218},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5122796893119812},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4993479251861572},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4955071210861206},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.48975324630737305},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.4880775213241577},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4750511646270752},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4501960277557373},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3770614266395569},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16740304231643677},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.081580251455307},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.057520657777786255},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit48603.2022.10002822","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icit48603.2022.10002822","pdf_url":null,"source":{"id":"https://openalex.org/S4363608411","display_name":"2022 IEEE International Conference on Industrial Technology (ICIT)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1677182931","https://openalex.org/W1686810756","https://openalex.org/W2028775883","https://openalex.org/W2092072518","https://openalex.org/W2094158905","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2565639579","https://openalex.org/W2618843429","https://openalex.org/W2790707365","https://openalex.org/W2889985731","https://openalex.org/W2890391196","https://openalex.org/W2897689496","https://openalex.org/W2963037989","https://openalex.org/W2963150697","https://openalex.org/W2965491691","https://openalex.org/W2966926453","https://openalex.org/W3011214090","https://openalex.org/W3012374719","https://openalex.org/W3099319035","https://openalex.org/W3106250896","https://openalex.org/W3137333070","https://openalex.org/W4293584584","https://openalex.org/W6620707391","https://openalex.org/W6637373629","https://openalex.org/W6750227808"],"related_works":["https://openalex.org/W4226493464","https://openalex.org/W4312417841","https://openalex.org/W3193565141","https://openalex.org/W3133861977","https://openalex.org/W2951211570","https://openalex.org/W3103566983","https://openalex.org/W3167935049","https://openalex.org/W2964954556","https://openalex.org/W3029198973","https://openalex.org/W2949096641"],"abstract_inverted_index":{"In":[0,48,61,97],"modern":[1],"manufacturing,":[2],"quality":[3],"inspection":[4],"of":[5,35,40,92,109,120],"object":[6,25],"surfaces":[7],"has":[8,28],"already":[9],"become":[10],"indispensable":[11],"in":[12,32,43,94],"the":[13,33,62,85,98,100,115],"production.":[14],"Faster":[15,57,117],"Region":[16],"Convolutional":[17],"Neural":[18],"Network":[19],"(Faster":[20],"R-CNN),":[21],"a":[22,51,64,104],"deep":[23],"learning":[24],"detection":[26,52],"algorithm,":[27],"been":[29],"gradually":[30],"applied":[31],"field":[34],"inspection,":[36],"but":[37],"it":[38],"is":[39,59],"low":[41],"accuracy":[42],"steel":[44],"surface":[45],"defect":[46],"detection.":[47],"this":[49],"paper,":[50],"method":[53],"based":[54],"on":[55,111],"improved":[56],"R-CNN":[58],"proposed.":[60],"method,":[63],"modified":[65],"backbone":[66],"network":[67],"extracts":[68,89],"features":[69],"from":[70],"images,":[71],"deformable":[72],"convolution":[73,77],"kernels":[74,78],"replace":[75],"conventional":[76],"to":[79,103],"make":[80],"location":[81],"more":[82],"precise,":[83],"and":[84],"multi-scale":[86],"feature":[87,90],"layer":[88],"maps":[91],"defects":[93],"different":[95],"scales.":[96],"experiment,":[99],"solution":[101],"comes":[102],"mean":[105],"Average":[106],"Precision":[107],"(mAP)":[108],"0.774":[110],"NEU-DET":[112],"dataset,":[113],"exceeding":[114],"original":[116],"RCNN":[118],"model":[119],"0.7":[121],"substantially.":[122]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}