{"id":"https://openalex.org/W2956055338","doi":"https://doi.org/10.1109/icit.2019.8755109","title":"Modular Multilevel Converter Using IGCT-based Cross-Connected Modules for Medium Voltage DC Grids","display_name":"Modular Multilevel Converter Using IGCT-based Cross-Connected Modules for Medium Voltage DC Grids","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2956055338","doi":"https://doi.org/10.1109/icit.2019.8755109","mag":"2956055338"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2019.8755109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2019.8755109","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004166698","display_name":"Qiang Song","orcid":"https://orcid.org/0000-0001-6231-8303"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Song","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008253090","display_name":"Jingwei Meng","orcid":"https://orcid.org/0000-0003-1550-2719"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingwei Meng","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024456616","display_name":"Biao Zhao","orcid":"https://orcid.org/0000-0001-9956-724X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biao Zhao","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078854901","display_name":"Zhanqing Yu","orcid":"https://orcid.org/0000-0002-2705-6595"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhanqing Yu","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100771836","display_name":"Wenhua Liu","orcid":"https://orcid.org/0000-0002-6914-5262"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhua Liu","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017455501","display_name":"Rong Zeng","orcid":"https://orcid.org/0000-0002-4514-605X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rong Zeng","raw_affiliation_strings":["Department of Electrical Engineering, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2422,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.54841691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1457","last_page":"1462"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9847000241279602,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9671000242233276,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrated-gate-commutated-thyristor","display_name":"Integrated gate-commutated thyristor","score":0.8733164072036743},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.6801987290382385},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.637668251991272},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.6019831895828247},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5475059151649475},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5374569892883301},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48752662539482117},{"id":"https://openalex.org/keywords/blocking","display_name":"Blocking (statistics)","score":0.46742910146713257},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3917706310749054},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30486929416656494},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27859994769096375}],"concepts":[{"id":"https://openalex.org/C194777113","wikidata":"https://www.wikidata.org/wiki/Q1066563","display_name":"Integrated gate-commutated thyristor","level":4,"score":0.8733164072036743},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.6801987290382385},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.637668251991272},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.6019831895828247},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5475059151649475},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5374569892883301},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48752662539482117},{"id":"https://openalex.org/C144745244","wikidata":"https://www.wikidata.org/wiki/Q4927286","display_name":"Blocking (statistics)","level":2,"score":0.46742910146713257},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3917706310749054},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30486929416656494},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27859994769096375},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit.2019.8755109","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2019.8755109","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.699999988079071,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2030891049","https://openalex.org/W2044939716","https://openalex.org/W2055905802","https://openalex.org/W2066416962","https://openalex.org/W2091065431","https://openalex.org/W2160311820","https://openalex.org/W2320858657","https://openalex.org/W2328229040","https://openalex.org/W2401220290","https://openalex.org/W2409961214","https://openalex.org/W2481301245","https://openalex.org/W2493777815","https://openalex.org/W6721673643"],"related_works":["https://openalex.org/W1830300994","https://openalex.org/W2571003122","https://openalex.org/W2378476669","https://openalex.org/W2099191517","https://openalex.org/W2107671007","https://openalex.org/W2393611170","https://openalex.org/W2902864868","https://openalex.org/W2393255129","https://openalex.org/W2365275120","https://openalex.org/W2060760104"],"abstract_inverted_index":{"The":[0,34,55,119,132,172],"modular":[1],"multilevel":[2],"converter":[3,53],"(MMC)":[4],"using":[5,182],"half-bridge":[6],"submodules":[7],"(HBSMs)":[8],"cannot":[9],"clear":[10],"the":[11,40,44,113,117,125,143,155,158,178,183],"DC-side":[12],"short-circuit":[13],"current":[14],"by":[15,39],"itself.":[16],"Various":[17],"improved":[18],"MMC":[19,165],"topologies":[20],"based":[21],"on":[22],"clamped":[23,45],"circuit":[24,46],"have":[25,157],"been":[26],"proposed":[27,108,126],"to":[28,70,101,109,163],"provide":[29],"DC":[30,64,144,168,173],"fault":[31,65,145,169,174],"blocking":[32,66,93,170],"capability.":[33,171],"extra":[35,41,75,104,160],"conduction":[36,88],"loss":[37,161],"caused":[38],"switches":[42,115],"in":[43,99,116],"is":[47,140,180],"an":[48],"important":[49],"concern":[50],"for":[51],"choosing":[52],"topology.":[54],"combination":[56],"of":[57,74,86,124,134,177],"cross-connected":[58],"module":[59],"(CCM)":[60],"with":[61,167],"HBSMs":[62],"provides":[63],"capability":[67,176],"and":[68,91,121,142],"leads":[69],"a":[71,135],"low":[72,87],"number":[73],"semiconductor":[76,114],"switches.":[77],"Integrated":[78],"gate":[79],"commutated":[80],"thyristor":[81],"(IGCT)":[82],"has":[83],"superior":[84],"characteristic":[85,147],"voltage":[89,94],"drop":[90],"high":[92],"rating.":[95],"In":[96],"this":[97],"study,":[98],"order":[100],"reach":[102],"lowest":[103,159],"loss,":[105],"IGCTs":[106],"are":[107,130,148],"be":[110],"used":[111],"as":[112],"CCM.":[118],"topology":[120],"operating":[122],"principle":[123],"IGCT-based":[127],"CCM":[128],"(ICCM)":[129],"presented.":[131],"design":[133],"\u00b110":[136],"kV/10":[137],"MW":[138],"ICCM-MMC":[139,156,179],"presented":[141],"clearance":[146,175],"analyzed.":[149],"Loss":[150],"evaluation":[151],"results":[152],"show":[153],"that":[154],"compared":[162],"other":[164],"solutions":[166],"verified":[181],"simulation":[184],"results.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}