{"id":"https://openalex.org/W2953680789","doi":"https://doi.org/10.1109/icit.2019.8754953","title":"Error Analysis of An Accurate Bipolar Voltage Measurement Circuit for Online Health Monitoring of IGBTs","display_name":"Error Analysis of An Accurate Bipolar Voltage Measurement Circuit for Online Health Monitoring of IGBTs","publication_year":2019,"publication_date":"2019-02-01","ids":{"openalex":"https://openalex.org/W2953680789","doi":"https://doi.org/10.1109/icit.2019.8754953","mag":"2953680789"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2019.8754953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2019.8754953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112449851","display_name":"Pratik Diwakar Deshmukh","orcid":null},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pratik Diwakar Deshmukh","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004897738","display_name":"Abhinav Arya","orcid":"https://orcid.org/0000-0003-2904-371X"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Abhinav Arya","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022515671","display_name":"Sandeep Anand","orcid":"https://orcid.org/0000-0001-6828-8715"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sandeep Anand","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I94234084"],"apc_list":null,"apc_paid":null,"fwci":0.6054,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.68821908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"434","last_page":"439"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6537521481513977},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.6487608551979065},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6457467079162598},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.603898286819458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5005333423614502},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47106999158859253},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.46330147981643677},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.42808887362480164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31256794929504395},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1184888482093811}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6537521481513977},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.6487608551979065},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6457467079162598},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.603898286819458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5005333423614502},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47106999158859253},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.46330147981643677},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.42808887362480164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31256794929504395},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1184888482093811},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit.2019.8754953","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2019.8754953","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1905166220","https://openalex.org/W1979238143","https://openalex.org/W1994170202","https://openalex.org/W2067348957","https://openalex.org/W2127246042","https://openalex.org/W2544632416","https://openalex.org/W2546726487","https://openalex.org/W2559456120","https://openalex.org/W2768292078"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W2318746575","https://openalex.org/W1960166976","https://openalex.org/W3164416905","https://openalex.org/W2380067098","https://openalex.org/W1992708211","https://openalex.org/W2394855236","https://openalex.org/W2385832380","https://openalex.org/W1548152478","https://openalex.org/W2137172615"],"abstract_inverted_index":{"On-state":[0],"voltage":[1,20,37,46,77,115],"is":[2,23,30,88,94,99,117,160,172],"predominantly":[3],"used":[4],"in":[5,78,128,134,162],"the":[6,10,59,62,76,85,90,101,111,126,129,135,157],"health":[7],"monitoring":[8,109],"of":[9,32,52,61,69,84,110,122,156,169],"IGBT.":[11,27,112],"In":[12],"this":[13,163],"paper,":[14],"fast,":[15],"accurate":[16],"and":[17,43,147,151,166,175],"online":[18],"on-state":[19,35,63],"measurement":[21,56,92,136,183],"circuit":[22,29,57,87,171],"suggested":[24,86,170],"for":[25,107],"an":[26],"The":[28,55,81,153],"capable":[31],"measuring":[33],"positive":[34],"collector-emitter":[36],"(V":[38,47],"<sub":[39,48],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40,49],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">CE-ON</sub>":[41],")":[42,51],"negative":[44],"forward":[45],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">F</sub>":[50],"anti-parallel":[53],"diode.":[54],"offers":[58],"scaling/shifting":[60],"voltage,":[64],"which":[65,98],"facilitates":[66],"direct":[67],"connection":[68],"Analog":[70],"to":[71,74,124],"Digital":[72],"(ADC),":[73],"monitor":[75],"digital":[79],"controllers.":[80],"key":[82],"advantage":[83],"that":[89],"overall":[91],"error":[93,103,127],"about":[95],"\u00b1":[96],"0.111%,":[97],"below":[100],"allowable":[102],"limits":[104],"(\u00b1":[105],"0.33%)":[106],"condition":[108],"A":[113],"flexible":[114],"clamping":[116],"provided,":[118],"during":[119],"OFF":[120],"state":[121],"device,":[123],"minimize":[125],"measurement.":[130],"Different":[131],"possible":[132],"errors":[133,159],"are":[137,177],"due":[138],"to,":[139],"i)":[140],"resistor":[141],"mismatch,":[142,146],"ii)":[143],"diode":[144],"voltages":[145],"iii)":[148],"ADC":[149],"quantisation":[150],"opamp.":[152],"detailed":[154],"analysis":[155],"mentioned":[158],"presented":[161],"paper.":[164],"Simulation":[165],"experimental":[167],"validation":[168],"carried":[173],"out":[174],"results":[176],"also":[178],"compared":[179],"with":[180],"previously":[181],"reported":[182],"circuits.":[184]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}