{"id":"https://openalex.org/W2784837491","doi":"https://doi.org/10.1109/icit.2018.8352239","title":"A CAN network architecture for gate drivers dedicated to wide band gap components","display_name":"A CAN network architecture for gate drivers dedicated to wide band gap components","publication_year":2018,"publication_date":"2018-02-01","ids":{"openalex":"https://openalex.org/W2784837491","doi":"https://doi.org/10.1109/icit.2018.8352239","mag":"2784837491"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2018.8352239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2018.8352239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053115030","display_name":"Christophe Bouguet","orcid":"https://orcid.org/0000-0003-0877-0344"},"institutions":[{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I97188460","display_name":"Nantes Universit\u00e9","ror":"https://ror.org/03gnr7b55","country_code":"FR","type":"education","lineage":["https://openalex.org/I97188460"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Christophe Bouguet","raw_affiliation_strings":["Universite de Nantes, Nantes, Pays de la Loire, FR","Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique"],"affiliations":[{"raw_affiliation_string":"Universite de Nantes, Nantes, Pays de la Loire, FR","institution_ids":["https://openalex.org/I97188460"]},{"raw_affiliation_string":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","institution_ids":["https://openalex.org/I4210100151"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072970174","display_name":"Nicolas Ginot","orcid":"https://orcid.org/0000-0002-0633-0508"},"institutions":[{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I4210149833","display_name":"Universit\u00e9 Bretagne Loire","ror":"https://ror.org/04x1a4s97","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210149833"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Nicolas Ginot","raw_affiliation_strings":["Universit\u00e9 Bretagne Loire, UMR6164: Institut d'Electronique et de Telecommunications de Rennes (IETR), Nantes cedex 3, BP, France","Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Bretagne Loire, UMR6164: Institut d'Electronique et de Telecommunications de Rennes (IETR), Nantes cedex 3, BP, France","institution_ids":["https://openalex.org/I4210149833","https://openalex.org/I4210100151"]},{"raw_affiliation_string":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","institution_ids":["https://openalex.org/I4210100151"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025036065","display_name":"Christophe Batard","orcid":"https://orcid.org/0000-0002-8223-4622"},"institutions":[{"id":"https://openalex.org/I4210100151","display_name":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","ror":"https://ror.org/013q33h79","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I28221208","https://openalex.org/I4210095849","https://openalex.org/I4210100151","https://openalex.org/I56067802","https://openalex.org/I97188460"]},{"id":"https://openalex.org/I4210149833","display_name":"Universit\u00e9 Bretagne Loire","ror":"https://ror.org/04x1a4s97","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210149833"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Christophe Batard","raw_affiliation_strings":["Universit\u00e9 Bretagne Loire, UMR6164: Institut d'Electronique et de Telecommunications de Rennes (IETR), Nantes cedex 3, BP, France","Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 Bretagne Loire, UMR6164: Institut d'Electronique et de Telecommunications de Rennes (IETR), Nantes cedex 3, BP, France","institution_ids":["https://openalex.org/I4210149833","https://openalex.org/I4210100151"]},{"raw_affiliation_string":"Institut d'\u00c9lectronique et des Technologies du num\u00e9Rique","institution_ids":["https://openalex.org/I4210100151"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053115030"],"corresponding_institution_ids":["https://openalex.org/I4210100151","https://openalex.org/I97188460"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.00683426,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"565","last_page":"570"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/galvanic-isolation","display_name":"Galvanic isolation","score":0.8850759267807007},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5217298269271851},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.5158352255821228},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4978482723236084},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.48022228479385376},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4650489091873169},{"id":"https://openalex.org/keywords/frequency-band","display_name":"Frequency band","score":0.4650237560272217},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4509536325931549},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4338219463825226},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.42311954498291016},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4182053804397583},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13245952129364014},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12152072787284851}],"concepts":[{"id":"https://openalex.org/C70234604","wikidata":"https://www.wikidata.org/wiki/Q780813","display_name":"Galvanic isolation","level":4,"score":0.8850759267807007},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5217298269271851},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.5158352255821228},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4978482723236084},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.48022228479385376},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4650489091873169},{"id":"https://openalex.org/C2778116611","wikidata":"https://www.wikidata.org/wiki/Q25110567","display_name":"Frequency band","level":3,"score":0.4650237560272217},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4509536325931549},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4338219463825226},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.42311954498291016},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4182053804397583},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13245952129364014},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12152072787284851},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icit.2018.8352239","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2018.8352239","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01688374v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01688374","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2018 IEEE International Conference on Industrial Technology, Feb 2018, Lyon, France. pp.LD-008362, ⟨10.1109/icit.2018.8352239⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2011400739","https://openalex.org/W2015369167","https://openalex.org/W2087343356","https://openalex.org/W2171886847","https://openalex.org/W2320168040","https://openalex.org/W2514581063","https://openalex.org/W2536846282","https://openalex.org/W2756115799","https://openalex.org/W6744343977"],"related_works":["https://openalex.org/W1936607280","https://openalex.org/W2025136394","https://openalex.org/W2560536780","https://openalex.org/W1965724337","https://openalex.org/W1935580009","https://openalex.org/W2799183675","https://openalex.org/W1597057327","https://openalex.org/W2798405562","https://openalex.org/W4313224879","https://openalex.org/W2547156516"],"abstract_inverted_index":{"In":[0,39],"this":[1,40,84,90],"paper,":[2,41],"an":[3,142],"innovative":[4],"communication":[5,50],"network":[6,51,64],"architecture":[7],"for":[8,16,94,141],"gate":[9,20],"drivers":[10],"is":[11,14,70,81,107,139],"presented.":[12],"It":[13],"adapted":[15],"wide":[17],"band":[18,98],"gap":[19],"drivers,":[21],"particularly":[22],"SiC":[23],"MOSFET,":[24],"in":[25,83,122],"the":[26,45,48,60,63,67,75,111,119,123,130,137],"working":[27],"environment":[28],"of":[29,35,47,59,62,74,136],"power":[30],"electronics":[31],"with":[32,144],"high":[33],"dv/dt":[34],"125kV/\u03bcs":[36],"under":[37],"1.5kV.":[38],"aspects":[42],"linked":[43],"to":[44,102,109,149],"constitution":[46],"entire":[49],"and":[52,80],"its":[53],"topology":[54],"are":[55,92,125],"introduced.":[56],"The":[57,86,104,115,133],"design":[58],"section":[61],"that":[65],"guarantees":[66],"galvanic":[68,112],"isolation":[69,113],"detailed.":[71],"A":[72],"model":[73,91,124],"channel":[76],"has":[77],"been":[78],"established":[79],"described":[82],"paper.":[85],"results":[87],"obtained":[88],"through":[89],"exposed":[93],"a":[95,145],"carrier":[96,106,131],"frequency":[97],"going":[99],"from":[100],"300kHz":[101],"30MHz.":[103],"latter":[105],"used":[108],"cross":[110],"barrier.":[114],"final":[116],"choices":[117],"concerning":[118],"parameters":[120],"considered":[121],"specified,":[126],"as":[127,129],"well":[128],"frequency.":[132],"electronic":[134],"structure":[135],"modulator":[138],"presented":[140],"application":[143],"bit":[146],"rate":[147],"equal":[148],"1Mbit/s.":[150]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}