{"id":"https://openalex.org/W2414533305","doi":"https://doi.org/10.1109/icit.2016.7474863","title":"High-throughput shape classification using support vector machine","display_name":"High-throughput shape classification using support vector machine","publication_year":2016,"publication_date":"2016-03-01","ids":{"openalex":"https://openalex.org/W2414533305","doi":"https://doi.org/10.1109/icit.2016.7474863","mag":"2414533305"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2016.7474863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2016.7474863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083278041","display_name":"Pranav Lad","orcid":"https://orcid.org/0000-0003-2244-6217"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Pranav Lad","raw_affiliation_strings":["Department of Mechanical Engineering, Indian Institute of Technology Bombay, India"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Indian Institute of Technology Bombay, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081408576","display_name":"Abhijeet Somani","orcid":null},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Abhijeet Somani","raw_affiliation_strings":["Department of Mechanical Engineering, Indian Institute of Technology Bombay, India"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Indian Institute of Technology Bombay, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017434610","display_name":"Kumaresh Krishnan","orcid":"https://orcid.org/0009-0008-1046-0576"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Eswara Krishnan","raw_affiliation_strings":["Parle Global Technologies Pvt. Ltd., Mumbai, India"],"affiliations":[{"raw_affiliation_string":"Parle Global Technologies Pvt. Ltd., Mumbai, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100769064","display_name":"Abhishek Gupta","orcid":"https://orcid.org/0000-0001-7565-7929"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Abhishek Gupta","raw_affiliation_strings":["Department of Mechanical Engineering, Indian Institute of Technology Bombay, India"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Indian Institute of Technology Bombay, India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003719670","display_name":"V. Kartik","orcid":"https://orcid.org/0000-0002-9248-7607"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"V. Kartik","raw_affiliation_strings":["Department of Mechanical Engineering, Indian Institute of Technology Bombay, India"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Indian Institute of Technology Bombay, India","institution_ids":["https://openalex.org/I162827531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5083278041"],"corresponding_institution_ids":["https://openalex.org/I162827531"],"apc_list":null,"apc_paid":null,"fwci":0.8357,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.77572431,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"3","issue":null,"first_page":"854","last_page":"859"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.8245971202850342},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7738723754882812},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.7305927276611328},{"id":"https://openalex.org/keywords/interrupt","display_name":"Interrupt","score":0.6568371057510376},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.588607668876648},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.529975414276123},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4899984896183014},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.47043249011039734},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4326035976409912},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4278993010520935},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4224509000778198},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.41814762353897095},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4169299602508545},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3574170470237732},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1843978762626648}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.8245971202850342},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7738723754882812},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.7305927276611328},{"id":"https://openalex.org/C41661131","wikidata":"https://www.wikidata.org/wiki/Q220764","display_name":"Interrupt","level":3,"score":0.6568371057510376},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.588607668876648},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.529975414276123},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4899984896183014},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.47043249011039734},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4326035976409912},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4278993010520935},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4224509000778198},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.41814762353897095},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4169299602508545},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3574170470237732},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1843978762626648},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit.2016.7474863","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2016.7474863","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W221177331","https://openalex.org/W1511900900","https://openalex.org/W2072982423","https://openalex.org/W2100190740","https://openalex.org/W2119821739","https://openalex.org/W2120515362","https://openalex.org/W2142857855","https://openalex.org/W2313353578","https://openalex.org/W2411580290","https://openalex.org/W2494899040","https://openalex.org/W4239510810","https://openalex.org/W4285719527","https://openalex.org/W6630736215","https://openalex.org/W6723601732"],"related_works":["https://openalex.org/W4288898221","https://openalex.org/W2358308054","https://openalex.org/W2391783641","https://openalex.org/W2109690896","https://openalex.org/W4231875098","https://openalex.org/W4230529130","https://openalex.org/W2391365542","https://openalex.org/W2361731841","https://openalex.org/W2386367690","https://openalex.org/W4243198198"],"abstract_inverted_index":{"Identification":[0],"of":[1,42,75],"defective":[2,55],"objects":[3,56],"is":[4,50,83],"a":[5,48,58,72],"crucial":[6],"problem":[7],"in":[8,57],"assembly":[9],"line":[10],"industries.":[11],"Several":[12],"machine":[13,62],"learning":[14,63],"techniques":[15,29],"along":[16,70],"with":[17,71],"image":[18,101],"processing":[19,102],"have":[20],"been":[21],"proposed":[22,51],"to":[23,32,52,85],"solve":[24],"this":[25,46],"problem.":[26],"However":[27],"such":[28,87],"are":[30],"limited":[31],"low":[33],"flow":[34],"rate":[35],"lines":[36],"and":[37],"hence":[38],"constrain":[39],"the":[40,43,93],"productivity":[41],"line.":[44,60],"In":[45],"paper,":[47],"method":[49,90],"identify":[53,86],"small":[54],"high-throughput":[59],"A":[61],"technique":[64],"called":[65],"Support":[66],"Vector":[67],"Machines":[68],"(SVM)":[69],"simple":[73],"set":[74],"interrupt":[76],"sensors":[77],"(such":[78],"as":[79,96],"infra-red":[80],"optical":[81],"sensors)":[82],"used":[84],"objects.":[88],"The":[89],"demonstrates":[91],"nearly":[92],"same":[94],"accuracy":[95],"that":[97],"achieved":[98],"using":[99],"conventional":[100],"techniques.":[103]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}