{"id":"https://openalex.org/W1518026412","doi":"https://doi.org/10.1109/icit.2015.7125296","title":"Conductance sensor for micromachining. A case study on monitoring tool-workpiece contact","display_name":"Conductance sensor for micromachining. A case study on monitoring tool-workpiece contact","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1518026412","doi":"https://doi.org/10.1109/icit.2015.7125296","mag":"1518026412"},"language":"en","primary_location":{"id":"doi:10.1109/icit.2015.7125296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2015.7125296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068898971","display_name":"Fernando Casta\u00f1o","orcid":"https://orcid.org/0000-0002-4801-9224"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Fernando Castano","raw_affiliation_strings":["Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain"],"affiliations":[{"raw_affiliation_string":"Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076576895","display_name":"Rodolfo E. Haber","orcid":"https://orcid.org/0000-0002-2881-0166"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Rodolfo E. Haber","raw_affiliation_strings":["Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain"],"affiliations":[{"raw_affiliation_string":"Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082939847","display_name":"Ra\u00fal M. del Toro","orcid":"https://orcid.org/0000-0001-9809-636X"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Raul M. del Toro","raw_affiliation_strings":["Centre for Automation and Robotics (UPM-CSIC), Arganda del Rey, Spain"],"affiliations":[{"raw_affiliation_string":"Centre for Automation and Robotics (UPM-CSIC), Arganda del Rey, Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029231792","display_name":"Gerardo Beruvides","orcid":"https://orcid.org/0000-0001-7049-4462"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Gerardo Beruvides","raw_affiliation_strings":["Centre for Automation and Robotics (UPM-CSIC), Arganda del Rey, Spain"],"affiliations":[{"raw_affiliation_string":"Centre for Automation and Robotics (UPM-CSIC), Arganda del Rey, Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076576895","display_name":"Rodolfo E. Haber","orcid":"https://orcid.org/0000-0002-2881-0166"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Rodolfo E. Haber","raw_affiliation_strings":["Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain"],"affiliations":[{"raw_affiliation_string":"Ra\u00fal M. del Toro and Gerardo Beruvides, Centre for Automation and Robotics (UPM-CSIC), Spain","institution_ids":["https://openalex.org/I4210125392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5068898971"],"corresponding_institution_ids":["https://openalex.org/I4210125392"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.02457445,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1422","last_page":"1426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10188","display_name":"Advanced machining processes and optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11451","display_name":"Advanced Machining and Optimization Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/surface-micromachining","display_name":"Surface micromachining","score":0.7521567940711975},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6301480531692505},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.5600714683532715},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5337404012680054},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49884772300720215},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4603012204170227},{"id":"https://openalex.org/keywords/breakage","display_name":"Breakage","score":0.4582791030406952},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.44657012820243835},{"id":"https://openalex.org/keywords/conductance","display_name":"Conductance","score":0.4454937279224396},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4315699338912964},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4271647334098816},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.4230250120162964},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34299564361572266},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.31868019700050354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.311403751373291},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2618994414806366}],"concepts":[{"id":"https://openalex.org/C145667562","wikidata":"https://www.wikidata.org/wiki/Q7646003","display_name":"Surface micromachining","level":4,"score":0.7521567940711975},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6301480531692505},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.5600714683532715},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5337404012680054},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49884772300720215},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4603012204170227},{"id":"https://openalex.org/C2779015675","wikidata":"https://www.wikidata.org/wiki/Q92796261","display_name":"Breakage","level":2,"score":0.4582791030406952},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.44657012820243835},{"id":"https://openalex.org/C121932024","wikidata":"https://www.wikidata.org/wiki/Q5159376","display_name":"Conductance","level":2,"score":0.4454937279224396},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4315699338912964},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4271647334098816},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.4230250120162964},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34299564361572266},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.31868019700050354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.311403751373291},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2618994414806366},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icit.2015.7125296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icit.2015.7125296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Technology (ICIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321837","display_name":"Ministerio de Econom\u00eda y Competitividad","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1972828537","https://openalex.org/W2000304567","https://openalex.org/W2030927311","https://openalex.org/W2053390167","https://openalex.org/W2058845658","https://openalex.org/W2126753779","https://openalex.org/W2130304248","https://openalex.org/W2625042515","https://openalex.org/W6739881549"],"related_works":["https://openalex.org/W4319763421","https://openalex.org/W4391064237","https://openalex.org/W4205707762","https://openalex.org/W3208398460","https://openalex.org/W1982566485","https://openalex.org/W1980213375","https://openalex.org/W3173829493","https://openalex.org/W4282983764","https://openalex.org/W2064223670","https://openalex.org/W4388441287"],"abstract_inverted_index":{"This":[0,15],"paper":[1],"proposes":[2],"a":[3,7,20,66,78],"conductance":[4,67],"sensor":[5,68],"and":[6,33,53,95,101],"procedure":[8,16],"for":[9,93,99],"real-time":[10,100],"monitoring":[11,104],"of":[12,29,38,60,65,74,81,105],"micromaching":[13],"processes.":[14],"is":[17,42,55,69],"based":[18],"on":[19],"computationally":[21],"efficient":[22],"method":[23],"to":[24],"detect":[25],"both":[26],"the":[27,50,56,61,75,85,91],"state":[28],"tool-workpiece":[30],"contact":[31,51],"dynamic":[32],"tool":[34,102],"breakage.":[35],"The":[36,63,72],"measurement":[37],"electrical":[39],"voltage":[40],"drop":[41],"done":[43],"by":[44],"supplying":[45],"an":[46],"AC":[47],"current":[48],"through":[49],"impedance":[52],"this":[54],"main":[57],"input":[58],"signal":[59],"algorithm.":[62],"design":[64],"verified":[70],"experimentally.":[71],"assessment":[73],"prototype":[76],"demonstrates":[77],"success":[79],"rate":[80],"90%":[82],"in":[83],"detecting":[84],"cutting":[86],"states.":[87],"These":[88],"results":[89],"are":[90],"basis":[92],"developing":[94],"implementing":[96],"embedded":[97],"system":[98],"condition":[103],"micromachining":[106],"processes":[107],"at":[108],"industrial":[109],"level.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-04-23T09:07:50.710637","created_date":"2025-10-10T00:00:00"}