{"id":"https://openalex.org/W4402916943","doi":"https://doi.org/10.1109/icip51287.2024.10647816","title":"Gradtrans: Transformer-Based Gradient Guidance for Image Generation","display_name":"Gradtrans: Transformer-Based Gradient Guidance for Image Generation","publication_year":2024,"publication_date":"2024-09-27","ids":{"openalex":"https://openalex.org/W4402916943","doi":"https://doi.org/10.1109/icip51287.2024.10647816"},"language":"en","primary_location":{"id":"doi:10.1109/icip51287.2024.10647816","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icip51287.2024.10647816","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100432879","display_name":"Yiwei Chen","orcid":"https://orcid.org/0000-0002-4947-3410"},"institutions":[{"id":"https://openalex.org/I4210155230","display_name":"Samsung (China)","ror":"https://ror.org/04yt00889","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210155230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiwei Chen","raw_affiliation_strings":["Samsung R&D Institute China-Beijing (SRC-B),Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung R&D Institute China-Beijing (SRC-B),Beijing,China","institution_ids":["https://openalex.org/I4210155230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106468876","display_name":"Jiaqian Yu","orcid":"https://orcid.org/0009-0008-5121-4937"},"institutions":[{"id":"https://openalex.org/I4210155230","display_name":"Samsung (China)","ror":"https://ror.org/04yt00889","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210155230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiaqian Yu","raw_affiliation_strings":["Samsung R&D Institute China-Beijing (SRC-B),Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung R&D Institute China-Beijing (SRC-B),Beijing,China","institution_ids":["https://openalex.org/I4210155230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071964867","display_name":"Siyang Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210155230","display_name":"Samsung (China)","ror":"https://ror.org/04yt00889","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210155230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyang Pan","raw_affiliation_strings":["Samsung R&D Institute China-Beijing (SRC-B),Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung R&D Institute China-Beijing (SRC-B),Beijing,China","institution_ids":["https://openalex.org/I4210155230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104084883","display_name":"Sangil Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangil Jung","raw_affiliation_strings":["Samsung Advanced Institute of Technology (SAIT),South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology (SAIT),South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110883229","display_name":"Wu Bi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210155230","display_name":"Samsung (China)","ror":"https://ror.org/04yt00889","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210155230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wu Bi","raw_affiliation_strings":["Samsung R&D Institute China-Beijing (SRC-B),Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung R&D Institute China-Beijing (SRC-B),Beijing,China","institution_ids":["https://openalex.org/I4210155230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053713760","display_name":"Seung-In Park","orcid":"https://orcid.org/0000-0002-7304-3330"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung-In Park","raw_affiliation_strings":["Samsung Advanced Institute of Technology (SAIT),South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology (SAIT),South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101427138","display_name":"Qiang Wang","orcid":"https://orcid.org/0009-0009-3117-9078"},"institutions":[{"id":"https://openalex.org/I4210155230","display_name":"Samsung (China)","ror":"https://ror.org/04yt00889","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210155230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Wang","raw_affiliation_strings":["Samsung R&D Institute China-Beijing (SRC-B),Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung R&D Institute China-Beijing (SRC-B),Beijing,China","institution_ids":["https://openalex.org/I4210155230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103182148","display_name":"ByungIn Yoo","orcid":"https://orcid.org/0000-0002-8252-8700"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"ByungIn Yoo","raw_affiliation_strings":["Samsung Advanced Institute of Technology (SAIT),South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology (SAIT),South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"27","issue":null,"first_page":"2354","last_page":"2360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10888","display_name":"Augmented Reality Applications","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.632891058921814},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6104384660720825},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3668377995491028},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35270023345947266},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17701297998428345},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11520993709564209},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11366179585456848}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.632891058921814},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6104384660720825},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3668377995491028},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35270023345947266},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17701297998428345},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11520993709564209},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11366179585456848}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip51287.2024.10647816","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icip51287.2024.10647816","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2962793481","https://openalex.org/W3003301247","https://openalex.org/W3212516020","https://openalex.org/W4311415873","https://openalex.org/W4312669714","https://openalex.org/W4312933868","https://openalex.org/W4385245566","https://openalex.org/W4385535562","https://openalex.org/W4386066464","https://openalex.org/W6678815747","https://openalex.org/W6748582592","https://openalex.org/W6755312952","https://openalex.org/W6755358316","https://openalex.org/W6767643796","https://openalex.org/W6774266986","https://openalex.org/W6779823529","https://openalex.org/W6788651424","https://openalex.org/W6795288823","https://openalex.org/W6810940779"],"related_works":["https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2772917594","https://openalex.org/W2775347418","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"Image":[0],"generation":[1,74,91],"has":[2],"been":[3],"attracting":[4],"widespread":[5],"attention":[6],"in":[7,62],"recent":[8],"years":[9],"along":[10],"with":[11,49,115,124],"the":[12,46,59,63,68,77,82],"development":[13],"of":[14],"generative":[15,50],"models.":[16,130],"Existing":[17],"works":[18],"mostly":[19],"focus":[20],"on":[21,45,97],"pursuing":[22],"high-quality":[23],"generated":[24],"samples":[25],"as":[26,119,121],"a":[27,34,42,72],"priority.":[28],"In":[29],"this":[30],"work,":[31],"we":[32],"introduce":[33],"lightweight":[35],"transformer-based":[36],"module,":[37],"called":[38],"GradTrans,":[39],"that":[40,106],"provides":[41],"novel":[43],"balance":[44],"speed-performance":[47],"trade-off":[48],"adversarial":[51],"networks":[52],"for":[53,71,88],"image":[54,90],"generation.":[55],"GradTrans":[56,109],"effectively":[57],"leverages":[58],"instructive":[60],"information":[61],"discriminator":[64],"network":[65,70],"to":[66,127],"guide":[67],"generator":[69],"higher":[73],"quality":[75],"at":[76],"inference":[78],"stage":[79],"without":[80],"overburdening":[81],"cost.":[83],"Extensive":[84],"experiments":[85],"are":[86],"conducted":[87],"unconditional":[89],"task":[92,96],"and":[93,103],"style":[94],"transfer":[95],"diverse":[98],"datasets,":[99],"including":[100],"CIFAR10,":[101],"STL10":[102],"Horse2Zebra,":[104],"demonstrating":[105],"our":[107],"proposed":[108],"can":[110],"surpass":[111],"different":[112,128],"related":[113],"methods":[114],"significantly":[116],"superior":[117],"performance,":[118],"well":[120],"being":[122],"generalizable":[123],"large":[125],"compatibility":[126],"base":[129]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}