{"id":"https://openalex.org/W4386597281","doi":"https://doi.org/10.1109/icip49359.2023.10223192","title":"Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography","display_name":"Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography","publication_year":2023,"publication_date":"2023-09-11","ids":{"openalex":"https://openalex.org/W4386597281","doi":"https://doi.org/10.1109/icip49359.2023.10223192"},"language":"en","primary_location":{"id":"doi:10.1109/icip49359.2023.10223192","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip49359.2023.10223192","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/biblio/2007702","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076604711","display_name":"Obaidullah Rahman","orcid":"https://orcid.org/0000-0002-7781-0840"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Obaidullah Rahman","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077586593","display_name":"Singanallur Venkatakrishnan","orcid":"https://orcid.org/0000-0002-7637-4987"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Singanallur V. Venkatakrishnan","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033970061","display_name":"Luke Scime","orcid":"https://orcid.org/0000-0002-0506-253X"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luke Scime","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043284595","display_name":"Paul Brackman","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Brackman","raw_affiliation_strings":["Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061142767","display_name":"Curtis Frederick","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Curtis Frederick","raw_affiliation_strings":["Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047016339","display_name":"Ryan Dehoff","orcid":"https://orcid.org/0000-0001-9456-9633"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan Dehoff","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014047735","display_name":"Vincent Paquit","orcid":"https://orcid.org/0000-0003-0331-2598"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vincent Paquit","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037719051","display_name":"Amirkoushyar Ziabari","orcid":"https://orcid.org/0000-0003-4776-457X"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amirkoushyar Ziabari","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5076604711"],"corresponding_institution_ids":["https://openalex.org/I1289243028"],"apc_list":null,"apc_paid":null,"fwci":0.5537,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61895411,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"2990","last_page":"2994"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/workflow","display_name":"Workflow","score":0.8027511835098267},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.665993332862854},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6149478554725647},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5301027297973633},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5246872305870056},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4946558177471161},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.47973528504371643},{"id":"https://openalex.org/keywords/streaking","display_name":"Streaking","score":0.46995022892951965},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4612506628036499},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4177912473678589},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.41108986735343933},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3895363211631775},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.31825459003448486},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24140608310699463},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13649311661720276},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.08122479915618896}],"concepts":[{"id":"https://openalex.org/C177212765","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Workflow","level":2,"score":0.8027511835098267},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.665993332862854},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6149478554725647},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5301027297973633},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5246872305870056},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4946558177471161},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.47973528504371643},{"id":"https://openalex.org/C33600429","wikidata":"https://www.wikidata.org/wiki/Q2384832","display_name":"Streaking","level":2,"score":0.46995022892951965},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4612506628036499},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4177912473678589},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.41108986735343933},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3895363211631775},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.31825459003448486},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24140608310699463},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13649311661720276},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.08122479915618896},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icip49359.2023.10223192","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip49359.2023.10223192","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:2007702","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2007702","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:2007702","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2007702","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5299999713897705,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320316892","display_name":"UT-Battelle","ror":"https://ror.org/04nza6677"},{"id":"https://openalex.org/F4320317847","display_name":"Raytheon Technologies","ror":null},{"id":"https://openalex.org/F4320320398","display_name":"Office of Energy","ror":"https://ror.org/00vjrcd64"},{"id":"https://openalex.org/F4320336741","display_name":"Advanced Manufacturing Office","ror":"https://ror.org/02xznz413"},{"id":"https://openalex.org/F4320338287","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W569478347","https://openalex.org/W1901129140","https://openalex.org/W2078771948","https://openalex.org/W2133059825","https://openalex.org/W2133665775","https://openalex.org/W2157812230","https://openalex.org/W2905525600","https://openalex.org/W3131251210","https://openalex.org/W3167891248","https://openalex.org/W4243419422","https://openalex.org/W4302363201","https://openalex.org/W4308233684","https://openalex.org/W4309776478","https://openalex.org/W4381570770","https://openalex.org/W6764313512","https://openalex.org/W6845471161","https://openalex.org/W6856726535","https://openalex.org/W6860812853"],"related_works":["https://openalex.org/W2345849355","https://openalex.org/W2770535139","https://openalex.org/W4400574728","https://openalex.org/W2073693229","https://openalex.org/W2498271520","https://openalex.org/W2082992977","https://openalex.org/W2957750916","https://openalex.org/W2004988775","https://openalex.org/W2053790843","https://openalex.org/W3011136467"],"abstract_inverted_index":{"X-ray":[0],"computed":[1],"tomography":[2],"(XCT)":[3],"is":[4],"an":[5],"important":[6],"tool":[7],"for":[8,55,70,163,172],"high-resolution":[9],"non-destructive":[10],"characterization":[11,57],"of":[12,18,35,53,68,85,98,114,123,128,166],"additively-manufactured":[13],"metal":[14,19,101],"components.":[15],"XCT":[16,69,96,182],"reconstructions":[17,93],"components":[20],"may":[21],"have":[22],"beam":[23],"hardening":[24],"artifacts":[25],"such":[26],"as":[27],"cupping":[28],"and":[29,37,64,162,179],"streaking":[30],"which":[31],"makes":[32],"reliable":[33],"detection":[34],"flaws":[36],"defects":[38],"challenging.":[39],"Furthermore,":[40],"traditional":[41],"workflows":[42],"based":[43,81],"on":[44,82],"using":[45,107],"analytic":[46,142],"reconstruction":[47,144],"algorithms":[48],"require":[49],"a":[50,78,135,140,146,164],"large":[51],"number":[52],"projections":[54],"accurate":[56,178],"-":[58],"leading":[59],"to":[60,89,145],"longer":[61],"measurement":[62],"times":[63],"hindering":[65],"the":[66,83,112,117,121,129,174],"adoption":[67],"in-line":[71],"inspections.":[72,183],"In":[73],"this":[74],"paper,":[75],"we":[76,152],"introduce":[77],"new":[79],"workflow":[80],"use":[84],"two":[86],"neural":[87,137],"networks":[88,175],"obtain":[90],"high-quality":[91,147],"accelerated":[92],"from":[94],"sparse-view":[95],"scans":[97],"single":[99],"material":[100],"parts.":[102],"The":[103,132],"first":[104],"network,":[105,134,138],"implemented":[106],"fully-connected":[108],"layers,":[109],"helps":[110],"reduce":[111],"impact":[113],"BH":[115],"in":[116],"projection":[118],"data":[119],"without":[120,169],"need":[122,171],"any":[124,170],"calibration":[125],"or":[126],"knowledge":[127],"component":[130],"material.":[131],"second":[133],"convolutional":[136],"maps":[139],"low-quality":[141],"3D":[143],"reconstruction.":[148],"Using":[149],"experimental":[150],"data,":[151],"demonstrate":[153],"that":[154],"our":[155],"method":[156],"robustly":[157],"generalizes":[158],"across":[159],"several":[160],"alloys,":[161],"range":[165],"sparsity":[167],"levels":[168],"retraining":[173],"thereby":[176],"enabling":[177],"fast":[180],"industrial":[181]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}