{"id":"https://openalex.org/W4308044510","doi":"https://doi.org/10.1109/icip46576.2022.9898017","title":"Simurgh: A Framework for Cad-Driven Deep Learning Based X-Ray CT Reconstruction","display_name":"Simurgh: A Framework for Cad-Driven Deep Learning Based X-Ray CT Reconstruction","publication_year":2022,"publication_date":"2022-10-16","ids":{"openalex":"https://openalex.org/W4308044510","doi":"https://doi.org/10.1109/icip46576.2022.9898017"},"language":"en","primary_location":{"id":"doi:10.1109/icip46576.2022.9898017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip46576.2022.9898017","pdf_url":null,"source":{"id":"https://openalex.org/S4363607719","display_name":"2022 IEEE International Conference on Image Processing (ICIP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},"type":"paratext","indexed_in":["crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/biblio/1895204","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037719051","display_name":"Amirkoushyar Ziabari","orcid":"https://orcid.org/0000-0003-4776-457X"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Amirkoushyar Ziabari","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077586593","display_name":"Singanallur Venkatakrishnan","orcid":"https://orcid.org/0000-0002-7637-4987"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Singanallur Venkatakrishnan","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101738634","display_name":"Abhishek Dubey","orcid":"https://orcid.org/0000-0002-1037-0174"},"institutions":[{"id":"https://openalex.org/I2801345345","display_name":"Cancer Institute (WIA)","ror":"https://ror.org/01tc10z29","country_code":"IN","type":"healthcare","lineage":["https://openalex.org/I2801345345"]},{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Abhishek Dubey","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","Cancer Data Science Lab, Center of Cancer Research, National Cancer Institute, Bethesda"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"Cancer Data Science Lab, Center of Cancer Research, National Cancer Institute, Bethesda","institution_ids":["https://openalex.org/I2801345345"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053998275","display_name":"Alex Lisovich","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Lisovich","raw_affiliation_strings":["Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","Carl ZEISS Industrial Metrology"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]},{"raw_affiliation_string":"Carl ZEISS Industrial Metrology","institution_ids":["https://openalex.org/I4210109350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085357796","display_name":"Paul Brackman","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Paul Brackman","raw_affiliation_strings":["Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","ORNL"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016424501","display_name":"Curtis Frederick","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Curtis Frederick","raw_affiliation_strings":["Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","ORNL"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005159894","display_name":"Pradeep Bhattad","orcid":"https://orcid.org/0009-0000-3360-4343"},"institutions":[{"id":"https://openalex.org/I4210109350","display_name":"Carl Zeiss (United States)","ror":"https://ror.org/01xk5xs43","country_code":"US","type":"company","lineage":["https://openalex.org/I1302207122","https://openalex.org/I4210109350"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pradeep Bhattad","raw_affiliation_strings":["Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","ORNL"],"affiliations":[{"raw_affiliation_string":"Carl Zeiss Industrial Metrology,LLC,Maple Grove,MN,USA,55369","institution_ids":["https://openalex.org/I4210109350"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083513907","display_name":"Philip R. Bingham","orcid":"https://orcid.org/0000-0003-4616-6084"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Philip Bingham","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050035852","display_name":"Alex Plotkowski","orcid":"https://orcid.org/0000-0001-5471-8681"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Plotkowski","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047016339","display_name":"Ryan Dehoff","orcid":"https://orcid.org/0000-0001-9456-9633"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan Dehoff","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014047735","display_name":"Vincent Paquit","orcid":"https://orcid.org/0000-0003-0331-2598"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vincent Paquit","raw_affiliation_strings":["Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","ORNL"],"affiliations":[{"raw_affiliation_string":"Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"ORNL","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5037719051"],"corresponding_institution_ids":["https://openalex.org/I1289243028"],"apc_list":null,"apc_paid":null,"fwci":0.2224,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.45304114,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"3836","last_page":"3867"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12422","display_name":"Radiomics and Machine Learning in Medical Imaging","score":0.9624999761581421,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.7278882265090942},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5547147393226624},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49865293502807617},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4964633584022522},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.39157748222351074},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.3368246853351593},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.2414109706878662},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19257032871246338}],"concepts":[{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.7278882265090942},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5547147393226624},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49865293502807617},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4964633584022522},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.39157748222351074},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.3368246853351593},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.2414109706878662},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19257032871246338}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icip46576.2022.9898017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip46576.2022.9898017","pdf_url":null,"source":{"id":"https://openalex.org/S4363607719","display_name":"2022 IEEE International Conference on Image Processing (ICIP)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:1895204","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1895204","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"doi:10.17023/fg7f-z886","is_oa":true,"landing_page_url":"https://doi.org/10.17023/fg7f-z886","pdf_url":null,"source":{"id":"https://openalex.org/S7407051697","display_name":"IEEE RESOURCE CENTERS","issn_l":null,"issn":[],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"pmh:oai:osti.gov:1895204","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1895204","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320320398","display_name":"Office of Energy","ror":"https://ror.org/00vjrcd64"},{"id":"https://openalex.org/F4320336741","display_name":"Advanced Manufacturing Office","ror":"https://ror.org/02xznz413"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1901129140","https://openalex.org/W1944106919","https://openalex.org/W2078771948","https://openalex.org/W2157812230","https://openalex.org/W2333204874","https://openalex.org/W2525884435","https://openalex.org/W2542870090","https://openalex.org/W2574952845","https://openalex.org/W2800378296","https://openalex.org/W2905525600","https://openalex.org/W2962793481","https://openalex.org/W3080821159","https://openalex.org/W3111841671","https://openalex.org/W3131251210","https://openalex.org/W3133902371","https://openalex.org/W3155327808","https://openalex.org/W3196252324","https://openalex.org/W4210371543","https://openalex.org/W6761790632"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W2755342338","https://openalex.org/W2058170566","https://openalex.org/W2036807459","https://openalex.org/W2775347418","https://openalex.org/W1969923398","https://openalex.org/W2772917594","https://openalex.org/W2166024367","https://openalex.org/W3009238340"],"abstract_inverted_index":{"High-resolution":[0],"X-ray":[1],"computed":[2],"tomography":[3],"(XCT)":[4],"is":[5,19,54,118],"an":[6],"important":[7],"technique":[8],"for":[9,42],"the":[10,73,109,123,147],"inspection":[11,44],"of":[12,27,40,72,135],"additively":[13],"manufactured":[14,28],"(AM)":[15],"parts.":[16],"While":[17],"XCT":[18,41,86,133],"typically":[20],"used":[21],"off-line":[22],"to":[23,45,79,103,126],"inspect":[24],"a":[25,59,97,113],"subset":[26],"parts,":[29,137],"significantly":[30],"accelerating":[31],"measurement":[32],"speed":[33],"while":[34,144],"retaining":[35],"accuracy":[36],"would":[37],"enable":[38],"use":[39],"in-line":[43],"rapidly":[46,80],"identify":[47],"defects":[48],"in":[49],"each":[50],"part":[51],"as":[52],"it":[53],"manufactured.":[55],"Here,":[56],"we":[57,138],"propose":[58],"deep":[60,114],"learning":[61],"(DL)":[62],"based":[63],"approach":[64,95],"that":[65,117],"uses":[66,96],"computer":[67],"aided":[68],"design":[69],"(CAD)":[70],"models":[71],"AM":[74],"parts":[75],"and":[76,112],"physics-based":[77],"information":[78],"produce":[81,127],"high-quality":[82],"reconstructions":[83],"from":[84,108,122],"sparse":[85],"measurements":[87],"without":[88],"high":[89],"quality":[90],"ground":[91],"truth":[92],"data.":[93],"Our":[94],"generative":[98],"adversarial":[99],"neural":[100,115],"network":[101,116],"(GAN)":[102],"produced":[104],"realistic":[105],"training":[106],"data":[107,121,134],"CAD-based":[110],"simulations":[111],"trained":[119],"using":[120],"first":[124],"stage":[125],"accurate":[128],"3D":[129],"reconstructions.":[130],"Using":[131],"experimental":[132],"metal":[136],"demonstrate":[139],"enhanced":[140],"defect":[141],"detection":[142],"capabilities":[143],"dramatically":[145],"reducing":[146],"scan":[148],"time.":[149]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}