{"id":"https://openalex.org/W2971090698","doi":"https://doi.org/10.1109/icip.2019.8803483","title":"Directional-Aware Automatic Defect Detection in High-Speed Railway Catenary System","display_name":"Directional-Aware Automatic Defect Detection in High-Speed Railway Catenary System","publication_year":2019,"publication_date":"2019-08-26","ids":{"openalex":"https://openalex.org/W2971090698","doi":"https://doi.org/10.1109/icip.2019.8803483","mag":"2971090698"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2019.8803483","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2019.8803483","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014401552","display_name":"Huimin Liu","orcid":"https://orcid.org/0000-0002-1884-424X"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huimin Liu","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049349192","display_name":"Yi Chang","orcid":"https://orcid.org/0000-0001-8542-5937"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Chang","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056308805","display_name":"Ziqin Li","orcid":null},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziqin Li","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026169204","display_name":"Sheng Zhong","orcid":"https://orcid.org/0000-0003-2865-8202"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheng Zhong","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075653923","display_name":"Luxin Yan","orcid":"https://orcid.org/0000-0002-5445-2702"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luxin Yan","raw_affiliation_strings":["Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5014401552"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":0.5828,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65605636,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"3930","last_page":"3934"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10842","display_name":"Railway Engineering and Dynamics","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9728000164031982,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/catenary","display_name":"Catenary","score":0.9338544607162476},{"id":"https://openalex.org/keywords/rectangle","display_name":"Rectangle","score":0.8935644626617432},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7431647181510925},{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.6590105295181274},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6357738375663757},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.612008273601532},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.5725706219673157},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4651663601398468},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4522356390953064},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15430817008018494},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11677896976470947},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.07247763872146606}],"concepts":[{"id":"https://openalex.org/C29279314","wikidata":"https://www.wikidata.org/wiki/Q214561","display_name":"Catenary","level":2,"score":0.9338544607162476},{"id":"https://openalex.org/C2781302577","wikidata":"https://www.wikidata.org/wiki/Q209","display_name":"Rectangle","level":2,"score":0.8935644626617432},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7431647181510925},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.6590105295181274},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6357738375663757},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.612008273601532},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.5725706219673157},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4651663601398468},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4522356390953064},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15430817008018494},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11677896976470947},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.07247763872146606},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2019.8803483","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2019.8803483","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Image Processing (ICIP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.7400000095367432,"display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W603908379","https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1686810756","https://openalex.org/W1978459068","https://openalex.org/W1990497156","https://openalex.org/W2012986458","https://openalex.org/W2086777133","https://openalex.org/W2155893237","https://openalex.org/W2345081459","https://openalex.org/W2508088778","https://openalex.org/W2519001424","https://openalex.org/W2528351807","https://openalex.org/W2535776261","https://openalex.org/W2592396164","https://openalex.org/W2613718673","https://openalex.org/W2770740228","https://openalex.org/W2772386856","https://openalex.org/W2794282829","https://openalex.org/W2829655003","https://openalex.org/W2894675256","https://openalex.org/W2897772777","https://openalex.org/W2899280016","https://openalex.org/W2963037989","https://openalex.org/W3106250896","https://openalex.org/W6618372016","https://openalex.org/W6620707391","https://openalex.org/W6637373629","https://openalex.org/W6755527424","https://openalex.org/W6755607526","https://openalex.org/W6756132242","https://openalex.org/W6785652829"],"related_works":["https://openalex.org/W2527106474","https://openalex.org/W2387267510","https://openalex.org/W4213239480","https://openalex.org/W2355659466","https://openalex.org/W4385468390","https://openalex.org/W2367488591","https://openalex.org/W2057160698","https://openalex.org/W2340965572","https://openalex.org/W2380838904","https://openalex.org/W2971551846"],"abstract_inverted_index":{"It":[0],"is":[1,44],"crucial":[2],"to":[3,62,107],"detect":[4],"the":[5,40,64,74,78,82,88,104,114,133],"defect":[6,32],"objects":[7,21,80],"that":[8,53,128],"could":[9],"be":[10],"a":[11,50,59,98],"hidden":[12],"danger":[13],"in":[14,81,103],"high-speed":[15],"catenary":[16],"system.":[17],"Instead":[18],"of":[19,46,66,73,77],"detecting":[20],"based":[22],"on":[23,121],"horizontal":[24,135],"rectangle,":[25],"we":[26,69,96],"propose":[27],"an":[28,55,92],"end-to-end":[29],"trainable":[30],"directional-aware":[31,51],"detection":[33,136],"network":[34],"(D3-Net)":[35],"which":[36,85],"can":[37,86],"automatic":[38],"select":[39],"defective":[41,117],"components.":[42],"D3-Net":[43],"composed":[45],"two":[47,122],"streams,":[48],"including":[49],"locator":[52],"regresses":[54],"inclined":[56,89],"rectangle":[57,90],"and":[58,116,125],"channel-wise":[60],"classifier":[61],"diagnose":[63],"defects":[65],"object.":[67],"Specifically,":[68],"make":[70],"full":[71],"use":[72],"directionality":[75],"characteristic":[76],"man-made":[79],"localization":[83],"stream,":[84],"predict":[87],"with":[91],"angle":[93],"parameter.":[94],"Besides,":[95],"introduce":[97],"channel":[99],"attention":[100],"module":[101],"(CAM)":[102],"classification":[105],"stream":[106],"obtain":[108],"discriminative":[109],"features":[110],"for":[111],"better":[112],"distinguishing":[113],"normal":[115],"objects.":[118],"Experimental":[119],"results":[120],"datasets,":[123],"Dropper":[124],"Insulator,":[126],"demonstrate":[127],"our":[129],"proposed":[130],"model":[131],"outperforms":[132],"traditional":[134],"methods.":[137]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}