{"id":"https://openalex.org/W2046725026","doi":"https://doi.org/10.1109/icip.2013.6738673","title":"Insect classification using Scanning Electron Microphotographs considering magnifications","display_name":"Insect classification using Scanning Electron Microphotographs considering magnifications","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2046725026","doi":"https://doi.org/10.1109/icip.2013.6738673","mag":"2046725026"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2013.6738673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2013.6738673","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Image Processing","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001388306","display_name":"Akihiro Takahashi","orcid":"https://orcid.org/0000-0003-0410-3085"},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihiro Takahashi","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","institution_ids":["https://openalex.org/I205349734"]},{"raw_affiliation_string":"Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009032240","display_name":"Takahiro Ogawa","orcid":"https://orcid.org/0000-0001-5332-8112"},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Ogawa","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","institution_ids":["https://openalex.org/I205349734"]},{"raw_affiliation_string":"Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]},{"author_position":"last","author":{"id":null,"display_name":"Miki Haseyama","orcid":null},"institutions":[{"id":"https://openalex.org/I205349734","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702","country_code":"JP","type":"education","lineage":["https://openalex.org/I205349734"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Miki Haseyama","raw_affiliation_strings":["Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Information Science and Technology, Hokkaido University N-14, W-9, Kita-ku, Sapporo, 060-0814, Japan","institution_ids":["https://openalex.org/I205349734"]},{"raw_affiliation_string":"Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan","institution_ids":["https://openalex.org/I205349734"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I205349734"],"apc_list":null,"apc_paid":null,"fwci":0.5449,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57507016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"3269","last_page":"3273"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9735999703407288,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnification","display_name":"Magnification","score":0.7154098153114319},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.691259503364563},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6296894550323486},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.629203200340271},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.5830721259117126},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5613784790039062},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5522518157958984},{"id":"https://openalex.org/keywords/classification-scheme","display_name":"Classification scheme","score":0.5275974869728088},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4809248149394989},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4200895428657532},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3147124648094177},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2995252311229706},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.11397269368171692},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.09050938487052917},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.08547580242156982},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07035648822784424}],"concepts":[{"id":"https://openalex.org/C4144372","wikidata":"https://www.wikidata.org/wiki/Q675287","display_name":"Magnification","level":2,"score":0.7154098153114319},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.691259503364563},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6296894550323486},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.629203200340271},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.5830721259117126},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5613784790039062},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5522518157958984},{"id":"https://openalex.org/C13460635","wikidata":"https://www.wikidata.org/wiki/Q85753676","display_name":"Classification scheme","level":2,"score":0.5275974869728088},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4809248149394989},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4200895428657532},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3147124648094177},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2995252311229706},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11397269368171692},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.09050938487052917},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.08547580242156982},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07035648822784424}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2013.6738673","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2013.6738673","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1625255723","https://openalex.org/W2106053110","https://openalex.org/W2119605622","https://openalex.org/W2119821739","https://openalex.org/W2122111042","https://openalex.org/W2138263042","https://openalex.org/W2140047820","https://openalex.org/W2148143831","https://openalex.org/W2159188990","https://openalex.org/W2172000360","https://openalex.org/W2534592857","https://openalex.org/W4239510810","https://openalex.org/W6636494156","https://openalex.org/W6675751002"],"related_works":["https://openalex.org/W4256609757","https://openalex.org/W2152595177","https://openalex.org/W2041117173","https://openalex.org/W2022127494","https://openalex.org/W1810141276","https://openalex.org/W1977757029","https://openalex.org/W2005234362","https://openalex.org/W1997235926","https://openalex.org/W3134034502","https://openalex.org/W2148260872"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,47,58,68,83],"method":[4,45],"of":[5,21,34,53,94,108,122],"insect":[6,77,110],"classification":[7,62,78,92,111],"using":[8],"images":[9,20,36,52,96],"taken":[10,26],"by":[11,27,89],"Scanning":[12],"Electron":[13],"Microscope":[14],"(SEM)":[15],"considering":[16,112],"magnifications.":[17],"Generally,":[18],"when":[19],"the":[22,43,61,65,76,91,99,103,109,120,123],"same":[23,100,104],"insects":[24],"are":[25,37],"SEM":[28],"with":[29],"different":[30,38,54],"magnifications,":[31],"visual":[32],"features":[33],"these":[35],"from":[39,98],"each":[40,73],"other.":[41],"Thus,":[42],"proposed":[44,124],"adopts":[46],"new":[48],"scheme":[49],"which":[50],"groups":[51],"magnifications":[55,113],"in":[56],"such":[57],"way":[59],"that":[60],"performance":[63,106],"becomes":[64,79],"highest.":[66],"Then":[67],"classifier":[69],"is":[70],"constructed":[71],"for":[72],"group,":[74],"and":[75],"feasible":[80],"based":[81],"on":[82],"target":[84],"image":[85],"magnification.":[86],"In":[87],"addition,":[88],"integrating":[90],"results":[93,118],"several":[95],"obtained":[97],"sample,":[101],"i.e.,":[102],"insect,":[105],"improvement":[107],"can":[114],"be":[115],"realized.":[116],"Experimental":[117],"show":[119],"effectiveness":[121],"method.":[125]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}