{"id":"https://openalex.org/W2143854715","doi":"https://doi.org/10.1109/icip.2012.6467152","title":"Corrupted reference image quality assessment","display_name":"Corrupted reference image quality assessment","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W2143854715","doi":"https://doi.org/10.1109/icip.2012.6467152","mag":"2143854715"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2012.6467152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2012.6467152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Image Processing","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101961792","display_name":"Cheng Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wu Cheng","raw_affiliation_strings":["Electrical and Computer Engineering, University of Dayton, Dayton, OH, USA","Electr. & Comput. Eng., Univ. of Dayton, Dayton, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Dayton, Dayton, OH, USA","institution_ids":["https://openalex.org/I127591826"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Univ. of Dayton, Dayton, OH, USA","institution_ids":["https://openalex.org/I127591826"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084211411","display_name":"Keigo Hirakawa","orcid":"https://orcid.org/0000-0002-0818-7688"},"institutions":[{"id":"https://openalex.org/I127591826","display_name":"University of Dayton","ror":"https://ror.org/021v3qy27","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Keigo Hirakawa","raw_affiliation_strings":["Electrical and Computer Engineering, University of Dayton, Dayton, OH, USA","Electr. & Comput. Eng., Univ. of Dayton, Dayton, OH, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering, University of Dayton, Dayton, OH, USA","institution_ids":["https://openalex.org/I127591826"]},{"raw_affiliation_string":"Electr. & Comput. Eng., Univ. of Dayton, Dayton, OH, USA","institution_ids":["https://openalex.org/I127591826"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I127591826"],"apc_list":null,"apc_paid":null,"fwci":0.4512,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.63331276,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"1485","last_page":"1488"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7102598547935486},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5765517354011536},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5234450697898865},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4682252109050751},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.46436354517936707},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.38135096430778503}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7102598547935486},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5765517354011536},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5234450697898865},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4682252109050751},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.46436354517936707},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.38135096430778503},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icip.2012.6467152","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2012.6467152","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Image Processing","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.674.1714","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.674.1714","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://campus.udayton.edu/%7EISSL/papers/ChengHirakawa2012CRIQA.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1973207880","https://openalex.org/W1983990732","https://openalex.org/W2054640142","https://openalex.org/W2059978765","https://openalex.org/W2079724595","https://openalex.org/W2109225941","https://openalex.org/W2113474920","https://openalex.org/W2133251102","https://openalex.org/W2133665775","https://openalex.org/W2139312536","https://openalex.org/W2142731874","https://openalex.org/W2145568341","https://openalex.org/W2156096953","https://openalex.org/W2159372562","https://openalex.org/W2160046865","https://openalex.org/W2171125155","https://openalex.org/W2212271491","https://openalex.org/W3182211633","https://openalex.org/W4255521522","https://openalex.org/W6680986726","https://openalex.org/W6688742339"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"We":[0],"propose":[1],"a":[2,31,62],"foundation":[3],"for":[4,17,61],"assessing":[5],"visual":[6,28],"quality":[7,13,29,68],"with":[8,45],"\u201ccorrupted":[9],"reference\u201d":[10],"(CR-QA)-a":[11],"new":[12],"assessment":[14,76],"(QA)":[15],"paradigm":[16],"reasoning":[18],"about":[19],"human":[20],"vision":[21],"and":[22,70,91],"image":[23,33,42],"restoration":[24],"problems":[25],"jointly.":[26],"The":[27],"of":[30,48,77],"processed":[32,79],"signal":[34],"is":[35,52],"assessed":[36],"relative":[37,81],"to":[38,55,73,82],"an":[39],"ideal":[40,84],"reference":[41,85],"(not":[43],"provided)":[44],"the":[46,75,78,83],"help":[47],"observed":[49],"image.":[50],"This":[51],"in":[53,89,93],"contrast":[54],"today's":[56],"QAs,":[57],"which":[58],"are":[59,71],"optimized":[60],"\u201cpost-hoc\u201d":[63],"usage":[64],"(process":[65],"first,":[66],"assess":[67],"second)":[69],"unequipped":[72],"handle":[74],"data":[80],"that":[86],"exist":[87],"only":[88],"theory":[90],"not":[92],"practice.":[94]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}