{"id":"https://openalex.org/W2004674224","doi":"https://doi.org/10.1109/icip.2010.5652979","title":"Visual tracking and segmentation using Time-of-Flight sensor","display_name":"Visual tracking and segmentation using Time-of-Flight sensor","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W2004674224","doi":"https://doi.org/10.1109/icip.2010.5652979","mag":"2004674224"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2010.5652979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2010.5652979","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Image Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071393061","display_name":"Omar Arif","orcid":"https://orcid.org/0000-0001-6648-3787"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Omar Arif","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","[Georgia Institute of Technology, Atlanta, 30332, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology, Atlanta, 30332, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112307106","display_name":"Wayne Daley","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wayne Daley","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","[Georgia Institute of Technology, Atlanta, 30332, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology, Atlanta, 30332, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036991903","display_name":"Patricio A. Vela","orcid":"https://orcid.org/0000-0002-6888-7002"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patricio Vela","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","[Georgia Institute of Technology, Atlanta, 30332, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology, Atlanta, 30332, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022090199","display_name":"Jochen Teizer","orcid":"https://orcid.org/0000-0001-8071-895X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jochen Teizer","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","[Georgia Institute of Technology, Atlanta, 30332, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology, Atlanta, 30332, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056125412","display_name":"John Stewart","orcid":"https://orcid.org/0000-0002-1001-1753"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Stewart","raw_affiliation_strings":["Georgia Institute of Technology, Atlanta, GA, USA","[Georgia Institute of Technology, Atlanta, 30332, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[Georgia Institute of Technology, Atlanta, 30332, USA]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":8.2223,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.966,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"2241","last_page":"2244"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12015","display_name":"Photoacoustic and Ultrasonic Imaging","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.7442566156387329},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7045201659202576},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6636048555374146},{"id":"https://openalex.org/keywords/smoothness","display_name":"Smoothness","score":0.6513329744338989},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6421092748641968},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6269645690917969},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5792209506034851},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.5626358389854431},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5328840017318726},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.5068536400794983},{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.46599212288856506},{"id":"https://openalex.org/keywords/time-of-flight","display_name":"Time of flight","score":0.4641038179397583},{"id":"https://openalex.org/keywords/cut","display_name":"Cut","score":0.43403464555740356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15392935276031494},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14245566725730896},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.09148699045181274},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05968549847602844}],"concepts":[{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.7442566156387329},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7045201659202576},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6636048555374146},{"id":"https://openalex.org/C102634674","wikidata":"https://www.wikidata.org/wiki/Q868473","display_name":"Smoothness","level":2,"score":0.6513329744338989},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6421092748641968},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6269645690917969},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5792209506034851},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.5626358389854431},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5328840017318726},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.5068536400794983},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.46599212288856506},{"id":"https://openalex.org/C98960154","wikidata":"https://www.wikidata.org/wiki/Q3983322","display_name":"Time of flight","level":2,"score":0.4641038179397583},{"id":"https://openalex.org/C5134670","wikidata":"https://www.wikidata.org/wiki/Q1626444","display_name":"Cut","level":4,"score":0.43403464555740356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15392935276031494},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14245566725730896},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.09148699045181274},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05968549847602844},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2010.5652979","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2010.5652979","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W76294903","https://openalex.org/W1878940107","https://openalex.org/W1978731076","https://openalex.org/W2010529405","https://openalex.org/W2101309634","https://openalex.org/W2104484606","https://openalex.org/W2115552546","https://openalex.org/W2116027296","https://openalex.org/W2116040950","https://openalex.org/W2134541452","https://openalex.org/W2143516773","https://openalex.org/W6603102435","https://openalex.org/W6675523434","https://openalex.org/W6677104387"],"related_works":["https://openalex.org/W4256596923","https://openalex.org/W2375137989","https://openalex.org/W2010171670","https://openalex.org/W2109407305","https://openalex.org/W2032319136","https://openalex.org/W1582388844","https://openalex.org/W2088651901","https://openalex.org/W2897997384","https://openalex.org/W1544828638","https://openalex.org/W2049858394"],"abstract_inverted_index":{"Time-of-Flight":[0],"(TOF)":[1],"sensors":[2],"provide":[3],"range":[4,31,63],"information":[5],"at":[6],"each":[7],"pixel":[8],"in":[9],"addition":[10],"to":[11,61,84],"intensity":[12],"information.":[13],"They":[14],"are":[15,44],"becoming":[16],"more":[17,21],"widely":[18],"available":[19],"and":[20,36,52,73],"affordable.":[22],"This":[23],"paper":[24,57],"examines":[25],"the":[26,67,71,74,78,86],"utility":[27],"of":[28,48,77],"dense":[29],"TOF":[30,68],"data":[32,50,72],"for":[33,41],"image":[34,42],"segmentation":[35,43],"tracking.":[37],"Energy":[38],"based":[39],"formulations":[40],"used,":[45],"which":[46],"consist":[47],"a":[49,53],"term":[51,76],"smoothness":[54,75],"term.":[55],"The":[56],"proposes":[58],"novel":[59],"methods":[60],"incorporate":[62],"information,":[64],"obtained":[65],"from":[66],"sensor,":[69],"into":[70],"energy.":[79,87],"Graph":[80],"cut":[81],"is":[82],"used":[83],"minimize":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":6}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}