{"id":"https://openalex.org/W2170989130","doi":"https://doi.org/10.1109/icip.2008.4712309","title":"An experimental study on discriminative concept classifier combination for TRECVID high-level feature extraction","display_name":"An experimental study on discriminative concept classifier combination for TRECVID high-level feature extraction","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2170989130","doi":"https://doi.org/10.1109/icip.2008.4712309","mag":"2170989130"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2008.4712309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2008.4712309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Image Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016174356","display_name":"Byungki Byun","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Byungki Byun","raw_affiliation_strings":["School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102725787","display_name":"Chengyuan Ma","orcid":"https://orcid.org/0000-0001-5126-5883"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chengyuan Ma","raw_affiliation_strings":["School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066868860","display_name":"Chin\u2010Hui Lee","orcid":"https://orcid.org/0000-0002-1892-2551"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chin-Hui Lee","raw_affiliation_strings":["School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5016174356"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":1.7559,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.87159736,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"2532","last_page":"2535"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.8651403188705444},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.802398681640625},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.7963473796844482},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.7737001180648804},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6687131524085999},{"id":"https://openalex.org/keywords/random-subspace-method","display_name":"Random subspace method","score":0.6463568806648254},{"id":"https://openalex.org/keywords/binary-classification","display_name":"Binary classification","score":0.5825569033622742},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.5721765756607056},{"id":"https://openalex.org/keywords/quadratic-classifier","display_name":"Quadratic classifier","score":0.4825108051300049},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4734377861022949},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.46283578872680664},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.30943602323532104},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23692220449447632}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.8651403188705444},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.802398681640625},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.7963473796844482},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.7737001180648804},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6687131524085999},{"id":"https://openalex.org/C106135958","wikidata":"https://www.wikidata.org/wiki/Q7291993","display_name":"Random subspace method","level":3,"score":0.6463568806648254},{"id":"https://openalex.org/C66905080","wikidata":"https://www.wikidata.org/wiki/Q17005494","display_name":"Binary classification","level":3,"score":0.5825569033622742},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.5721765756607056},{"id":"https://openalex.org/C52620605","wikidata":"https://www.wikidata.org/wiki/Q7268357","display_name":"Quadratic classifier","level":3,"score":0.4825108051300049},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4734377861022949},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.46283578872680664},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.30943602323532104},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23692220449447632},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2008.4712309","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2008.4712309","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2004663411","https://openalex.org/W2017822976","https://openalex.org/W2028688779","https://openalex.org/W2036718463","https://openalex.org/W2089060621","https://openalex.org/W2118714763","https://openalex.org/W2120929742","https://openalex.org/W2122310385","https://openalex.org/W2136507825","https://openalex.org/W2143854982","https://openalex.org/W2153635508","https://openalex.org/W2167295232","https://openalex.org/W3021461773","https://openalex.org/W3120421331","https://openalex.org/W3142089804","https://openalex.org/W4240021943","https://openalex.org/W6684451480"],"related_works":["https://openalex.org/W4288315282","https://openalex.org/W2951122819","https://openalex.org/W2073565062","https://openalex.org/W2888937984","https://openalex.org/W2407804800","https://openalex.org/W108062576","https://openalex.org/W2128012032","https://openalex.org/W2149131139","https://openalex.org/W2164726323","https://openalex.org/W4285388059"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,35],"present":[4],"an":[5,104],"experimental":[6],"study":[7],"on":[8,62,69,86,93],"using":[9,53],"high-dimensional":[10],"image":[11],"features":[12],"to":[13],"perform":[14],"discriminative":[15,55],"classifier":[16,26,56],"combination":[17,57],"for":[18,144],"TRECVID":[19],"concept":[20,112,130],"detection.":[21],"We":[22],"combine":[23],"a":[24,32,41,54,71,147],"multi-class":[25,33,42,66,129],"with":[27,98,126,134,146],"binary-class":[28,37,46],"classifiers.":[29,131],"After":[30],"training":[31],"classifier,":[34],"train":[36],"classifiers":[38,67,84],"by":[39,102,120],"decomposing":[40],"problem":[43],"into":[44],"several":[45],"classification":[47],"problems,":[48],"and":[49],"fuse":[50],"them":[51],"together":[52],"approach.":[58],"This":[59],"idea":[60],"leverages":[61],"each":[63],"classifier's":[64],"properties;":[65],"emphasize":[68],"segmenting":[70],"decision":[72],"space":[73],"optimally":[74],"in":[75],"terms":[76],"of":[77,107,110,151],"some":[78],"overall":[79],"performance":[80],"criteria":[81],"whereas":[82],"binary":[83,111],"focus":[85],"detecting":[87],"corresponding":[88],"positive":[89,152],"samples":[90],"locally.":[91],"Testing":[92],"the":[94,114],"TRECVID2005":[95],"development":[96],"set":[97,106],"39":[99,108,128],"LSCOM-Lite":[100],"concepts":[101,145],"adding":[103],"additional":[105],"pairs":[109],"classifiers,":[113],"mean":[115],"average":[116],"precision":[117],"was":[118],"improved":[119],"34.1%":[121],"over":[122],"our":[123,137],"baseline":[124],"system":[125],"only":[127],"When":[132],"compared":[133],"state-of-the-art":[135],"systems":[136],"proposed":[138],"method":[139],"is":[140],"quite":[141],"competitive":[142],"especially":[143],"relatively":[148],"small":[149],"number":[150],"samples.":[153]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
