{"id":"https://openalex.org/W2134879740","doi":"https://doi.org/10.1109/icip.2008.4712141","title":"EP printer jitter characterization using 2D Gabor filter and spectral analysis","display_name":"EP printer jitter characterization using 2D Gabor filter and spectral analysis","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2134879740","doi":"https://doi.org/10.1109/icip.2008.4712141","mag":"2134879740"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2008.4712141","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2008.4712141","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Image Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102911931","display_name":"Ahmed H. Eid","orcid":"https://orcid.org/0009-0004-4241-9915"},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ahmed H. Eid","raw_affiliation_strings":["Lexmark International, Inc., Lexington, KY, USA","Lexmark Int. Inc., Lexington, KY"],"affiliations":[{"raw_affiliation_string":"Lexmark International, Inc., Lexington, KY, USA","institution_ids":["https://openalex.org/I154586514"]},{"raw_affiliation_string":"Lexmark Int. Inc., Lexington, KY","institution_ids":["https://openalex.org/I154586514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101206628","display_name":"Mohamed N. Ahmed","orcid":null},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohamed N. Ahmed","raw_affiliation_strings":["Lexmark International, Inc., Lexington, KY, USA","Lexmark Int. Inc., Lexington, KY"],"affiliations":[{"raw_affiliation_string":"Lexmark International, Inc., Lexington, KY, USA","institution_ids":["https://openalex.org/I154586514"]},{"raw_affiliation_string":"Lexmark Int. Inc., Lexington, KY","institution_ids":["https://openalex.org/I154586514"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047572977","display_name":"Edward E. Rippetoe","orcid":null},"institutions":[{"id":"https://openalex.org/I154586514","display_name":"Lexmark (United States)","ror":"https://ror.org/00basdj35","country_code":"US","type":"company","lineage":["https://openalex.org/I154586514"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward E. Rippetoe","raw_affiliation_strings":["Lexmark International, Inc., Lexington, KY, USA","Lexmark Int. Inc., Lexington, KY"],"affiliations":[{"raw_affiliation_string":"Lexmark International, Inc., Lexington, KY, USA","institution_ids":["https://openalex.org/I154586514"]},{"raw_affiliation_string":"Lexmark Int. Inc., Lexington, KY","institution_ids":["https://openalex.org/I154586514"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5102911931"],"corresponding_institution_ids":["https://openalex.org/I154586514"],"apc_list":null,"apc_paid":null,"fwci":0.8249,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.78980313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1860","last_page":"1863"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8495535850524902},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.7707695960998535},{"id":"https://openalex.org/keywords/orientation","display_name":"Orientation (vector space)","score":0.6679138541221619},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5933014154434204},{"id":"https://openalex.org/keywords/scanner","display_name":"Scanner","score":0.5364986062049866},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.47278547286987305},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.42850032448768616},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.39234957098960876},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37385284900665283},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3183552026748657},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15204796195030212},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.09618693590164185},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.06717437505722046}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8495535850524902},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.7707695960998535},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.6679138541221619},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5933014154434204},{"id":"https://openalex.org/C2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","level":2,"score":0.5364986062049866},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.47278547286987305},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.42850032448768616},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.39234957098960876},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37385284900665283},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3183552026748657},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15204796195030212},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.09618693590164185},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.06717437505722046},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2008.4712141","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2008.4712141","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Image Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W6963749","https://openalex.org/W187235643","https://openalex.org/W1588043677","https://openalex.org/W1627054999","https://openalex.org/W1992558806","https://openalex.org/W2001006185","https://openalex.org/W2021715286","https://openalex.org/W2093250348","https://openalex.org/W2160966992","https://openalex.org/W4378378460","https://openalex.org/W6607462693","https://openalex.org/W6852709965"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W3095633856","https://openalex.org/W2048850195"],"abstract_inverted_index":{"Electrophotographic":[0],"(EP)":[1],"printer":[2,56],"banding":[3],"and":[4,121,142],"jitter":[5,110,140],"defects":[6,19,111],"are":[7],"main":[8],"sources":[9],"of":[10,17,40,55,95,112,118,148],"print":[11,149],"quality":[12,150],"degradation.":[13],"Traditionally,":[14],"the":[15,23,26,36,41,63,69,79,88,93,96,108,129,138,145],"characterization":[16],"these":[18],"relies":[20],"mainly":[21],"on":[22],"assumption":[24,46],"that":[25,128,136],"defect":[27,42,70,80,97],"has":[28,82],"either":[29],"horizontal":[30],"or":[31,57],"vertical":[32,75],"orientation":[33,81,114],"to":[34,62,106,144],"permit":[35],"simple":[37],"ID":[38],"analysis":[39,117],"profile.":[43],"However,":[44],"this":[45,100],"can":[47,71],"easily":[48],"be":[49,73],"violated":[50],"if":[51],"a":[52,153],"small":[53],"amount":[54],"scanner":[58],"skew":[59],"is":[60],"introduced":[61],"analyzed":[64],"images.":[65],"In":[66,99],"some":[67],"cases":[68],"inherently":[72],"neither":[74],"nor":[76],"horizontal.":[77],"Unless":[78],"been":[83],"accurately":[84],"detected":[85],"before":[86],"analysis,":[87],"ID-based":[89],"approaches":[90],"could":[91],"bias":[92],"estimation":[94],"severity.":[98],"paper,":[101],"we":[102],"present":[103],"an":[104,133],"approach":[105,131],"characterize":[107],"skewed":[109],"unrestricted":[113],"using":[115],"2D-based":[116],"Gabor":[119],"pre-filtering":[120],"spectral":[122],"analysis.":[123],"Our":[124],"experimental":[125],"results":[126],"show":[127],"proposed":[130],"provides":[132],"objective":[134],"measure":[135],"quantifies":[137],"EP":[139],"defect,":[141],"correlates":[143],"subjective":[146],"assessment":[147],"experts":[151],"with":[152],"0.96":[154],"correlation":[155],"coefficient.":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}