{"id":"https://openalex.org/W2151450253","doi":"https://doi.org/10.1109/icip.2005.1530443","title":"Visual inspection of particle boards for quality assessment","display_name":"Visual inspection of particle boards for quality assessment","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2151450253","doi":"https://doi.org/10.1109/icip.2005.1530443","mag":"2151450253"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2005.1530443","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2005.1530443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Image Processing 2005","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009147954","display_name":"Vincenzo Piuri","orcid":"https://orcid.org/0000-0003-3178-8198"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Piuri","raw_affiliation_strings":["Information Technologies Department, University of Milan, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technologies Department, University of Milan, Milan, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004969615","display_name":"Fabio Scotti","orcid":"https://orcid.org/0000-0002-4277-3701"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Scotti","raw_affiliation_strings":["Information Technologies Department, University of Milan, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technologies Department, University of Milan, Milan, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035547226","display_name":"Manuel Roveri","orcid":"https://orcid.org/0000-0001-7828-7687"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Roveri","raw_affiliation_strings":["Electronic and Information Department, Politecnico of Milan, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic and Information Department, Politecnico of Milan, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9487,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.75729316,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"III","last_page":"521"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9750000238418579,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9661999940872192,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.8702223300933838},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.7780876159667969},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6767999529838562},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.5714548230171204},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5649591088294983},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5080578327178955},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.37466806173324585},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2348267138004303},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.18834510445594788}],"concepts":[{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.8702223300933838},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.7780876159667969},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6767999529838562},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.5714548230171204},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5649591088294983},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5080578327178955},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.37466806173324585},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2348267138004303},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.18834510445594788}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icip.2005.1530443","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2005.1530443","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Image Processing 2005","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/503793","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/503793","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1833045830","https://openalex.org/W1900582009","https://openalex.org/W1976342447","https://openalex.org/W2123026937","https://openalex.org/W2152236601","https://openalex.org/W2160522381","https://openalex.org/W2479606315"],"related_works":["https://openalex.org/W1560398276","https://openalex.org/W1979172994","https://openalex.org/W3149631139","https://openalex.org/W571879","https://openalex.org/W1979253374","https://openalex.org/W1986703546","https://openalex.org/W2154087496","https://openalex.org/W2132335896","https://openalex.org/W2058593100","https://openalex.org/W1965696824"],"abstract_inverted_index":{"The":[0,62],"automatic":[1],"visual":[2,35],"inspection":[3,36],"(AVI)":[4],"systems":[5],"are":[6,56,65],"nowadays":[7],"used":[8,67],"with":[9],"good":[10],"results":[11],"in":[12,59,68],"a":[13,34],"wide":[14],"broad":[15],"of":[16,24,28,33,37],"applications.":[17],"In":[18],"particular":[19],"we":[20],"considered":[21],"the":[22,25,38,52,60,69],"problem":[23],"defect":[26,45,71,79,88],"detection":[27,46,72,80,89],"particle":[29],"boards":[30],"by":[31],"means":[32],"printed":[39],"surface.":[40],"We":[41],"propose":[42],"an":[43],"innovative":[44],"approach":[47],"capable":[48],"to":[49],"automatically":[50],"extract":[51],"repetitive":[53],"patterns":[54,64,84],"that":[55,74,86],"generally":[57],"present":[58],"printed-matters.":[61],"extracted":[63],"then":[66],"proper":[70],"phase":[73],"can":[75],"thus":[76],"achieve":[77],"high":[78,93],"performances.":[81],"Real":[82],"wood":[83],"prove":[85],"our":[87],"system":[90],"achieves":[91],"very":[92],"classification":[94],"capability.":[95]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}