{"id":"https://openalex.org/W2161941676","doi":"https://doi.org/10.1109/icip.2005.1529861","title":"Multiple-model MKS with improved learning/prior modeling","display_name":"Multiple-model MKS with improved learning/prior modeling","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W2161941676","doi":"https://doi.org/10.1109/icip.2005.1529861","mag":"2161941676"},"language":"en","primary_location":{"id":"doi:10.1109/icip.2005.1529861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2005.1529861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Image Processing 2005","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101866755","display_name":"Karthik Nagarajan","orcid":"https://orcid.org/0000-0003-3863-1396"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Nagarajan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072904176","display_name":"K.C. Slatton","orcid":null},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.C. Slatton","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Department of Civil and Coastal Engineering, University of Florida, Gainesville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Department of Civil and Coastal Engineering, University of Florida, Gainesville, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.31824678,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"I","last_page":"757"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10770","display_name":"Soil Geostatistics and Mapping","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10770","display_name":"Soil Geostatistics and Mapping","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12157","display_name":"Geochemistry and Geologic Mapping","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10711","display_name":"Target Tracking and Data Fusion in Sensor Networks","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.7918689846992493},{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.6499245762825012},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.6385024785995483},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5902407169342041},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.5371068120002747},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5336471796035767},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5111690163612366},{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.4721786081790924},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4595258831977844},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.45951926708221436},{"id":"https://openalex.org/keywords/stochastic-modelling","display_name":"Stochastic modelling","score":0.4485177993774414},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.44817104935646057},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2403683066368103},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.17455026507377625},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10324349999427795}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.7918689846992493},{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.6499245762825012},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.6385024785995483},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5902407169342041},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.5371068120002747},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5336471796035767},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5111690163612366},{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.4721786081790924},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4595258831977844},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45951926708221436},{"id":"https://openalex.org/C127491075","wikidata":"https://www.wikidata.org/wiki/Q7617825","display_name":"Stochastic modelling","level":2,"score":0.4485177993774414},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.44817104935646057},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2403683066368103},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.17455026507377625},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10324349999427795},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icip.2005.1529861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icip.2005.1529861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE International Conference on Image Processing 2005","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1490266448","https://openalex.org/W1920062415","https://openalex.org/W1993650430","https://openalex.org/W2006072083","https://openalex.org/W2017628301","https://openalex.org/W2074232022","https://openalex.org/W2105124269","https://openalex.org/W2149059130","https://openalex.org/W2156263007","https://openalex.org/W2157108567","https://openalex.org/W2161417056","https://openalex.org/W2798681570","https://openalex.org/W4206059443","https://openalex.org/W4240204144"],"related_works":["https://openalex.org/W2051058708","https://openalex.org/W154868527","https://openalex.org/W3000097931","https://openalex.org/W2354322770","https://openalex.org/W1494268238","https://openalex.org/W1983207144","https://openalex.org/W2490706771","https://openalex.org/W2480116122","https://openalex.org/W4237547500","https://openalex.org/W4255576661"],"abstract_inverted_index":{"Estimation":[0],"of":[1,5],"topography":[2],"and":[3,76],"fusion":[4],"data":[6,75],"acquired":[7],"over":[8,15],"multiple":[9,52,79],"resolutions":[10],"have":[11,37],"been":[12,38],"extensively":[13],"studied":[14],"the":[16,64,74,78],"years.":[17],"The":[18],"standard":[19],"MKS":[20],"(multiscale":[21],"Kalman":[22],"smoother)":[23],"algorithm":[24],"embedded":[25],"with":[26],"a":[27,57],"single":[28],"stochastic":[29],"model":[30],"parameterized":[31],"using":[32],"power":[33],"spectra":[34],"matching":[35],"methods":[36],"found":[39],"to":[40,61,72],"give":[41],"suboptimal":[42],"performance":[43],"in":[44],"estimating":[45],"nonstationary":[46],"topographic":[47],"variations.":[48],"In":[49],"this":[50],"work,":[51],"models":[53,80],"are":[54],"regulated":[55],"by":[56],"mixture-of-experts":[58],"(MOE)":[59],"network":[60],"adaptively":[62],"fuse":[63],"estimates.":[65],"A":[66],"fractal":[67],"based":[68],"approach":[69],"was":[70],"employed":[71],"segment":[73],"parameterize":[77],"for":[81],"better":[82],"performance.":[83]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}