{"id":"https://openalex.org/W2971061625","doi":"https://doi.org/10.1109/icinfa.2018.8812567","title":"Adaptive Detection Scheme for Solder Joints Based on Guided Image Filtering and Geometrical Edge Selection","display_name":"Adaptive Detection Scheme for Solder Joints Based on Guided Image Filtering and Geometrical Edge Selection","publication_year":2018,"publication_date":"2018-08-01","ids":{"openalex":"https://openalex.org/W2971061625","doi":"https://doi.org/10.1109/icinfa.2018.8812567","mag":"2971061625"},"language":"en","primary_location":{"id":"doi:10.1109/icinfa.2018.8812567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icinfa.2018.8812567","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Information and Automation (ICIA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064773330","display_name":"Qiaokang Liang","orcid":"https://orcid.org/0000-0002-5504-9966"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiaokang Liang","raw_affiliation_strings":["Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101903084","display_name":"Jing Jin","orcid":"https://orcid.org/0000-0003-2153-9817"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing jin","raw_affiliation_strings":["Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028406957","display_name":"Jianyong Long","orcid":"https://orcid.org/0000-0002-3883-8584"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianyong Long","raw_affiliation_strings":["Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043446785","display_name":"Wei Sun","orcid":"https://orcid.org/0000-0002-2589-2100"},"institutions":[{"id":"https://openalex.org/I16609230","display_name":"Hunan University","ror":"https://ror.org/05htk5m33","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Sun","raw_affiliation_strings":["Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hunan Key Laboratory of Intelligent Robot Technology in Electronic Manufacturing, Hunan University, Changsha, Hunan, China","institution_ids":["https://openalex.org/I16609230"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083184309","display_name":"Juan\u2010Juan Cai","orcid":"https://orcid.org/0000-0002-3788-8125"},"institutions":[{"id":"https://openalex.org/I12393601","display_name":"Huaihua University","ror":"https://ror.org/04zn6xq74","country_code":"CN","type":"education","lineage":["https://openalex.org/I12393601"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Cai","raw_affiliation_strings":["College of Electrical and Information Engineering, Huaihua University, Huaihua, Hunan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Huaihua University, Huaihua, Hunan, China","institution_ids":["https://openalex.org/I12393601"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036802857","display_name":"Xiaohu Xia","orcid":"https://orcid.org/0000-0002-6372-7712"},"institutions":[{"id":"https://openalex.org/I39774598","display_name":"Hefei University","ror":"https://ror.org/01f5rdf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I39774598"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaohu Xia","raw_affiliation_strings":["Department of Mechanical Engineering, Hefei University, Hefei, Anhui, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Hefei University, Hefei, Anhui, China","institution_ids":["https://openalex.org/I39774598"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079215889","display_name":"Guangbing Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I118987531","display_name":"Anhui Jianzhu University","ror":"https://ror.org/0108wjw08","country_code":"CN","type":"education","lineage":["https://openalex.org/I118987531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangbing Zhang","raw_affiliation_strings":["School of Electronics and Information Engineering, Anhui Jianzhu University, Hefei, Anhui, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Anhui Jianzhu University, Hefei, Anhui, China","institution_ids":["https://openalex.org/I118987531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.31660565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"34","issue":null,"first_page":"1042","last_page":"1047"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.7018738985061646},{"id":"https://openalex.org/keywords/canny-edge-detector","display_name":"Canny edge detector","score":0.6541330218315125},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.6379689574241638},{"id":"https://openalex.org/keywords/soldering","display_name":"Soldering","score":0.5726798176765442},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5558691620826721},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5491093993186951},{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.5297129154205322},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5134035348892212},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.4722801148891449},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.46195295453071594},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.4158085286617279},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.41393816471099854},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.3551989495754242},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.31858885288238525},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.27348172664642334},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2258930802345276},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15941065549850464},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.08629471063613892}],"concepts":[{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.7018738985061646},{"id":"https://openalex.org/C14705441","wikidata":"https://www.wikidata.org/wiki/Q597183","display_name":"Canny edge detector","level":5,"score":0.6541330218315125},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.6379689574241638},{"id":"https://openalex.org/C50296614","wikidata":"https://www.wikidata.org/wiki/Q211387","display_name":"Soldering","level":2,"score":0.5726798176765442},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5558691620826721},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5491093993186951},{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.5297129154205322},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5134035348892212},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.4722801148891449},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.46195295453071594},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.4158085286617279},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.41393816471099854},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.3551989495754242},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.31858885288238525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.27348172664642334},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2258930802345276},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15941065549850464},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.08629471063613892},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icinfa.2018.8812567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icinfa.2018.8812567","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Information and Automation (ICIA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1479974481","https://openalex.org/W1967400177","https://openalex.org/W1977556410","https://openalex.org/W1995031544","https://openalex.org/W1998844509","https://openalex.org/W2004491626","https://openalex.org/W2010981805","https://openalex.org/W2101488630","https://openalex.org/W2111314392","https://openalex.org/W2114908523","https://openalex.org/W2123299916","https://openalex.org/W2125188192","https://openalex.org/W2128072235","https://openalex.org/W2140427427","https://openalex.org/W2142796063","https://openalex.org/W2145023731","https://openalex.org/W2146968679","https://openalex.org/W2153028943","https://openalex.org/W2158479172","https://openalex.org/W2164944168","https://openalex.org/W2165214338","https://openalex.org/W2168437459","https://openalex.org/W2370530878","https://openalex.org/W2389451054","https://openalex.org/W2414372621","https://openalex.org/W2534262995","https://openalex.org/W4233078852","https://openalex.org/W4285719527","https://openalex.org/W4300920262","https://openalex.org/W6641919407","https://openalex.org/W6675008265","https://openalex.org/W6681750928","https://openalex.org/W6728632141"],"related_works":["https://openalex.org/W3169126738","https://openalex.org/W1994279415","https://openalex.org/W2558559991","https://openalex.org/W1986338341","https://openalex.org/W2545065926","https://openalex.org/W2980082320","https://openalex.org/W2036421992","https://openalex.org/W3093839383","https://openalex.org/W2387510934","https://openalex.org/W2015446345"],"abstract_inverted_index":{"Aiming":[0],"to":[1,47,114],"effectively":[2,96],"inspect":[3],"solder":[4,53,60,126,134,153,178],"joints":[5,61,154,179],"on":[6,16,149,155],"vehicle":[7,156,160],"body-in-white,":[8,157],"a":[9],"novel":[10],"detection":[11,77],"and":[12,20,64,123,137,165,175,181],"calibration":[13,131],"scheme":[14,27,172],"based":[15],"guided":[17,71],"image":[18,39,72],"filtering":[19],"geometrical":[21,101],"edge":[22,76,88,102],"selection":[23,103],"is":[24,45,67,112],"proposed.":[25],"The":[26,146],"can":[28,173],"be":[29],"generally":[30],"divided":[31],"into":[32],"the":[33,38,42,49,52,57,65,70,75,79,85,91,99,116,120,130,142,170,177],"following":[34],"three":[35],"stages.":[36],"In":[37,74,129],"preprocessing":[40],"stage,":[41,78,132],"homomorphic":[43],"filter":[44],"utilized":[46],"adjust":[48],"illumination":[50],"of":[51,59,119,152],"joint":[54],"image.":[55],"Then":[56],"contours":[58,81],"are":[62,82,95,139],"sharpened,":[63],"noise":[66],"eliminated":[68],"by":[69,84,98,141],"filtering.":[73],"candidate":[80],"given":[83],"improved":[86,108],"Canny":[87],"detection.":[89],"Then,":[90],"obvious":[92],"interference":[93],"edges":[94,118,136],"removed":[97],"proposed":[100,171],"method.":[104,145],"After":[105],"that,":[106],"an":[107],"K-means":[109],"clustering":[110],"method":[111],"used":[113],"remove":[115],"round":[117],"body":[121],"spots":[122],"distinguish":[124],"multiple":[125,133],"joints'":[127,135],"edges.":[128],"centers":[138],"calculated":[140],"least":[143],"square":[144],"extensive":[147],"experiments":[148],"various":[150],"kinds":[151],"which":[158],"contained":[159],"frame":[161],"contours,":[162],"rusted,":[163],"scratched":[164],"spotted":[166],"body,":[167],"showed":[168],"that":[169],"detect":[174],"calibrate":[176],"quickly":[180],"accurately.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}