{"id":"https://openalex.org/W2767085128","doi":"https://doi.org/10.1109/icinfa.2017.8079012","title":"Infrared nondestructive recognition of small subsurface defects using a SVM classifier","display_name":"Infrared nondestructive recognition of small subsurface defects using a SVM classifier","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2767085128","doi":"https://doi.org/10.1109/icinfa.2017.8079012","mag":"2767085128"},"language":"en","primary_location":{"id":"doi:10.1109/icinfa.2017.8079012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icinfa.2017.8079012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Conference on Information and Automation (ICIA)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089355998","display_name":"Ronghui Qian","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ronghui Qian","raw_affiliation_strings":["Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100349461","display_name":"Ze Liu","orcid":"https://orcid.org/0000-0002-7478-435X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ze Liu","raw_affiliation_strings":["Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100599363","display_name":"Hong Hu","orcid":"https://orcid.org/0000-0002-7443-0885"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Hu","raw_affiliation_strings":["Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073410125","display_name":"Dan Zuo","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dan Zuo","raw_affiliation_strings":["Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5089355998"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.2288,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.54485072,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"34","issue":null,"first_page":"793","last_page":"803"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9751999974250793,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7887653112411499},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7748243808746338},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.7582428455352783},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.677087128162384},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6177875995635986},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.5817166566848755},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.5654367804527283},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5399459004402161},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.48002639412879944},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.4298722445964813},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.20806309580802917},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12672698497772217},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06431412696838379}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7887653112411499},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7748243808746338},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.7582428455352783},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.677087128162384},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6177875995635986},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.5817166566848755},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.5654367804527283},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5399459004402161},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.48002639412879944},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.4298722445964813},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.20806309580802917},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12672698497772217},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06431412696838379},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icinfa.2017.8079012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icinfa.2017.8079012","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Conference on Information and Automation (ICIA)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1971010219","https://openalex.org/W1971200508","https://openalex.org/W1980909362","https://openalex.org/W1992459071","https://openalex.org/W2003570906","https://openalex.org/W2049363457","https://openalex.org/W2053484286","https://openalex.org/W2109606373"],"related_works":["https://openalex.org/W2043230455","https://openalex.org/W3002438267","https://openalex.org/W3212166813","https://openalex.org/W2349790901","https://openalex.org/W2332954643","https://openalex.org/W2967842629","https://openalex.org/W2090763504","https://openalex.org/W4237804270","https://openalex.org/W1498394490","https://openalex.org/W2381618937"],"abstract_inverted_index":{"Aimed":[0],"at":[1],"the":[2,59,65,71,75,80,87,93,98,104],"problem":[3],"that":[4,13,103],"some":[5],"small":[6,110],"subsurface":[7],"defects":[8,111],"cannot":[9],"be":[10],"recognized":[11],"and":[12,79,82,112],"size":[14],"estimation":[15],"is":[16,54,77,90],"not":[17],"accurate":[18],"when":[19],"using":[20],"infrared":[21,60,66],"nondestructive":[22],"testing,":[23],"this":[24],"paper":[25],"proposes":[26],"a":[27,38],"new":[28],"method":[29],"by":[30,64],"combining":[31],"an":[32],"image":[33,50,61],"sequence":[34,51,62],"processing":[35,52],"algorithm":[36,47,53],"with":[37],"SVM":[39],"(support":[40],"vector":[41],"machine)":[42],"classifier":[43,106],"based":[44],"on":[45],"genetic":[46],"optimization.":[48],"The":[49,100],"first":[55],"used":[56,91],"to":[57],"process":[58],"collected":[63],"thermal":[67],"imager,":[68],"after":[69],"which":[70],"approximate":[72],"position":[73],"of":[74,86],"defect":[76],"determined":[78],"time-temperature":[81],"pixel":[83],"loss":[84],"information":[85],"defective":[88],"region":[89],"as":[92],"characteristic":[94],"parameters":[95],"for":[96],"training":[97],"classifier.":[99],"results":[101],"show":[102],"trained":[105],"can":[107],"successfully":[108],"recognize":[109],"accurately":[113],"estimate":[114],"their":[115],"size.":[116]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}