{"id":"https://openalex.org/W2783205495","doi":"https://doi.org/10.1109/iciinfs.2016.8263044","title":"Study of role of channel engineering in dual-material-double-gate MOSFETs","display_name":"Study of role of channel engineering in dual-material-double-gate MOSFETs","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2783205495","doi":"https://doi.org/10.1109/iciinfs.2016.8263044","mag":"2783205495"},"language":"en","primary_location":{"id":"doi:10.1109/iciinfs.2016.8263044","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iciinfs.2016.8263044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 11th International Conference on Industrial and Information Systems (ICIIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021986588","display_name":"Varun Goel","orcid":"https://orcid.org/0000-0002-1184-8782"},"institutions":[{"id":"https://openalex.org/I154970844","display_name":"Jaypee Institute of Information Technology","ror":"https://ror.org/05sttyy11","country_code":"IN","type":"education","lineage":["https://openalex.org/I154970844"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Varun Goel","raw_affiliation_strings":["Jaypee Institute of information Technology, Noida, India"],"affiliations":[{"raw_affiliation_string":"Jaypee Institute of information Technology, Noida, India","institution_ids":["https://openalex.org/I154970844"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102442446","display_name":"Sanjay Sharma","orcid":null},"institutions":[{"id":"https://openalex.org/I91357014","display_name":"Banaras Hindu University","ror":"https://ror.org/04cdn2797","country_code":"IN","type":"education","lineage":["https://openalex.org/I91357014"]},{"id":"https://openalex.org/I56404289","display_name":"Indian Institute of Technology BHU","ror":"https://ror.org/01kh5gc44","country_code":"IN","type":"education","lineage":["https://openalex.org/I56404289"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sanjay Sharma","raw_affiliation_strings":["Indian Institute of Technology (BHU), Varanasi, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology (BHU), Varanasi, India","institution_ids":["https://openalex.org/I56404289","https://openalex.org/I91357014"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5021986588"],"corresponding_institution_ids":["https://openalex.org/I154970844"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.23116717,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"778","last_page":"783"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.634692370891571},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6121697425842285},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.602074384689331},{"id":"https://openalex.org/keywords/poissons-equation","display_name":"Poisson's equation","score":0.5472438335418701},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49324482679367065},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47573113441467285},{"id":"https://openalex.org/keywords/dependency","display_name":"Dependency (UML)","score":0.4605099558830261},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.45122450590133667},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44106540083885193},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3850483298301697},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3170084059238434},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3100844621658325},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22286280989646912},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2131926715373993},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.18263831734657288},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.08485844731330872}],"concepts":[{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.634692370891571},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6121697425842285},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.602074384689331},{"id":"https://openalex.org/C96716743","wikidata":"https://www.wikidata.org/wiki/Q827688","display_name":"Poisson's equation","level":2,"score":0.5472438335418701},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49324482679367065},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47573113441467285},{"id":"https://openalex.org/C19768560","wikidata":"https://www.wikidata.org/wiki/Q320727","display_name":"Dependency (UML)","level":2,"score":0.4605099558830261},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.45122450590133667},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44106540083885193},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3850483298301697},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3170084059238434},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3100844621658325},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22286280989646912},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2131926715373993},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18263831734657288},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.08485844731330872},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iciinfs.2016.8263044","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iciinfs.2016.8263044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 11th International Conference on Industrial and Information Systems (ICIIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1569944689","https://openalex.org/W1984473146","https://openalex.org/W1992926203","https://openalex.org/W2009050103","https://openalex.org/W2014144793","https://openalex.org/W2054360411","https://openalex.org/W2063689624","https://openalex.org/W2077624939","https://openalex.org/W2108776537","https://openalex.org/W2126810113","https://openalex.org/W2159572017","https://openalex.org/W6664056236"],"related_works":["https://openalex.org/W1977042749","https://openalex.org/W2542162669","https://openalex.org/W2042881279","https://openalex.org/W2121451436","https://openalex.org/W2115248544","https://openalex.org/W1608296848","https://openalex.org/W2975003965","https://openalex.org/W2049062674","https://openalex.org/W2492111440","https://openalex.org/W4297923311"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3],"2-D":[4,29,38,97],"analytical":[5,30,89],"model":[6,90],"of":[7,19,21,37,51,59,80],"threshold":[8,66],"voltage":[9,67],"for":[10],"nanoscale":[11],"graded-channel-dual-material-double-gate":[12],"(GCDMDG)":[13],"MOSFETs":[14,82],"to":[15,76],"discuss":[16],"the":[17,35,49,57,78,88],"advantage":[18],"incorporation":[20],"channel":[22,42,46],"engineering":[23],"in":[24,41],"dual-material-double-gate":[25],"(DMDG)":[26],"MOSFETs.":[27,85],"The":[28,62],"modeling":[31],"is":[32],"based":[33],"upon":[34],"solution":[36],"Poisson's":[39],"equation":[40],"region(s)":[43],"using":[44],"parabolic":[45],"profile":[47],"with":[48],"help":[50],"different":[52],"boundary":[53],"conditions":[54],"and":[55,65],"excluding":[56],"effect":[58],"interface":[60],"charges.":[61],"surface":[63],"potential":[64],"dependency":[68],"on":[69],"various":[70],"device":[71,98],"parameters":[72],"have":[73],"been":[74,103],"studied":[75],"support":[77],"advantages":[79],"GCDMDG":[81],"over":[83],"DMDG":[84],"To":[86],"validate":[87],"results,":[91],"numerical":[92],"simulation":[93],"data":[94],"obtained":[95],"from":[96],"simulators":[99],"ATLAS\u2122":[100],"SILVACO":[101],"has":[102],"used.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}