{"id":"https://openalex.org/W2782782773","doi":"https://doi.org/10.1109/iciinfs.2016.8262955","title":"In-situ high-temperature electromagnetic characterization of ceramic composite tiles for strategic applications","display_name":"In-situ high-temperature electromagnetic characterization of ceramic composite tiles for strategic applications","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2782782773","doi":"https://doi.org/10.1109/iciinfs.2016.8262955","mag":"2782782773"},"language":"en","primary_location":{"id":"doi:10.1109/iciinfs.2016.8262955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iciinfs.2016.8262955","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 11th International Conference on Industrial and Information Systems (ICIIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013900726","display_name":"Himangshu B. Baskey","orcid":"https://orcid.org/0000-0002-0644-6551"},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"H. B. Baskey","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109273203","display_name":"Devendra Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I82571370","display_name":"GLA University","ror":"https://ror.org/05fnxgv12","country_code":"IN","type":"education","lineage":["https://openalex.org/I82571370"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Devendra Kumar","raw_affiliation_strings":["GLA, University, Mathura"],"affiliations":[{"raw_affiliation_string":"GLA, University, Mathura","institution_ids":["https://openalex.org/I82571370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110870903","display_name":"T. C. Shami","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"T.C. Shami","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101934204","display_name":"Ramesh Kumar","orcid":"https://orcid.org/0000-0003-2089-2213"},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"R. Kumar","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100623679","display_name":"Sumit Kumar","orcid":"https://orcid.org/0009-0003-3841-337X"},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"S. Kumar","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103019755","display_name":"A. K. Dixit","orcid":"https://orcid.org/0000-0002-1179-2096"},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"A. K. Dixit","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048171971","display_name":"N. Eswara Prasad","orcid":"https://orcid.org/0000-0002-6734-2238"},"institutions":[{"id":"https://openalex.org/I4210113972","display_name":"Defence Materials and Stores Research and Development Establishment","ror":"https://ror.org/0297zwz89","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I4210113972","https://openalex.org/I4210150591"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"N. Eswara Prasad","raw_affiliation_strings":["Defence Materials Stores Research and Development Establishment, Kanpur"],"affiliations":[{"raw_affiliation_string":"Defence Materials Stores Research and Development Establishment, Kanpur","institution_ids":["https://openalex.org/I4210113972"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5013900726"],"corresponding_institution_ids":["https://openalex.org/I4210113972"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66981816,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"300","last_page":"303"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.8112361431121826},{"id":"https://openalex.org/keywords/ceramic","display_name":"Ceramic","score":0.698344886302948},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6318643093109131},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5614503622055054},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5219792127609253},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4578494131565094},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.4464782178401947},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.43438491225242615},{"id":"https://openalex.org/keywords/temperature-control","display_name":"Temperature control","score":0.43324393033981323},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"Network analyzer (electrical)","score":0.42793571949005127},{"id":"https://openalex.org/keywords/in-situ","display_name":"In situ","score":0.4158068895339966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41554421186447144},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40158194303512573},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.37484055757522583},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22745108604431152},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.18606790900230408},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1502508819103241},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1463756263256073},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1336904764175415}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.8112361431121826},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.698344886302948},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6318643093109131},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5614503622055054},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5219792127609253},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4578494131565094},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.4464782178401947},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.43438491225242615},{"id":"https://openalex.org/C536315585","wikidata":"https://www.wikidata.org/wiki/Q7698332","display_name":"Temperature control","level":2,"score":0.43324393033981323},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.42793571949005127},{"id":"https://openalex.org/C2777822432","wikidata":"https://www.wikidata.org/wiki/Q216681","display_name":"In situ","level":2,"score":0.4158068895339966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41554421186447144},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40158194303512573},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.37484055757522583},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22745108604431152},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.18606790900230408},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1502508819103241},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1463756263256073},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1336904764175415},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iciinfs.2016.8262955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iciinfs.2016.8262955","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 11th International Conference on Industrial and Information Systems (ICIIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W270690376","https://openalex.org/W355943682","https://openalex.org/W1976370585","https://openalex.org/W1985069227","https://openalex.org/W1992338980","https://openalex.org/W2002531891","https://openalex.org/W2057419199","https://openalex.org/W2080932682","https://openalex.org/W2084727841","https://openalex.org/W2086382402","https://openalex.org/W2111943187","https://openalex.org/W2130705138","https://openalex.org/W2148211756","https://openalex.org/W2151224241","https://openalex.org/W2310154204","https://openalex.org/W2322094703","https://openalex.org/W2494749743","https://openalex.org/W2890351524","https://openalex.org/W6698279380"],"related_works":["https://openalex.org/W4220711674","https://openalex.org/W2051437113","https://openalex.org/W2990481554","https://openalex.org/W3013435404","https://openalex.org/W2794259478","https://openalex.org/W2053673665","https://openalex.org/W2162602759","https://openalex.org/W2390640503","https://openalex.org/W2742726548","https://openalex.org/W1994787935"],"abstract_inverted_index":{"In":[0,45,81],"this":[1,46],"paper":[2],"free":[3],"space":[4],"microwave":[5],"measurement":[6,61,88],"setup":[7],"has":[8,50,63,110],"been":[9,51,64,111],"integrated":[10,65,108,131],"with":[11,36,66,72],"the":[12,18,29,37,67,73,78,85,92,97,106],"high":[13],"temperature":[14,79],"(HT)":[15],"cell":[16],"for":[17,54,91,103,113,123,136,149],"in-situ":[19,38],"electromagnetic":[20,137],"characterization.":[21,104],"The":[22,60,129],"experimental-setup":[23],"is":[24,89,101,133],"capable":[25],"of":[26,115,139],"operating":[27],"in":[28,125],"frequency":[30,58],"range":[31],"from":[32,41],"5.85\u201340":[33],"GHz":[34],"along":[35],"material":[39,98],"characterization":[40,138],"ambient":[42],"to":[43,83,141],"1200\u00b0C.":[44],"present":[47],"work,":[48],"experiment":[49],"carried":[52],"out":[53],"X":[55],"band":[56],"(8.2\u201312.4GHz)":[57],"region.":[59],"system":[62],"dedicated":[68],"software,":[69],"which":[70,118],"interfaces":[71],"vector":[74],"network":[75],"analyzer":[76],"and":[77],"controller.":[80],"order":[82],"validate":[84],"experimental":[86],"set-up,":[87],"performed":[90],"standard":[93],"samples,":[94],"after":[95],"that":[96],"under":[99],"test":[100],"evaluated":[102],"Here":[105],"proposed":[107,130],"set-up":[109,132],"used":[112,122],"testing":[114],"ceramic":[116],"samples":[117,144],"are":[119],"quite":[120],"often":[121],"application":[124],"defence":[126],"strategic":[127],"products.":[128],"ideally":[134],"suited":[135],"day":[140,142],"routine":[143],"as":[145,147,148],"well":[146],"various":[150],"industrial":[151],"applications.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}