{"id":"https://openalex.org/W4389389306","doi":"https://doi.org/10.1109/icicdt59917.2023.10332416","title":"Design of 1-5 GHz Two-Stage Noise-Canceling Low-Noise Amplifier with gm-boosting Technique for Spin Wave Detection Circuit","display_name":"Design of 1-5 GHz Two-Stage Noise-Canceling Low-Noise Amplifier with gm-boosting Technique for Spin Wave Detection Circuit","publication_year":2023,"publication_date":"2023-09-25","ids":{"openalex":"https://openalex.org/W4389389306","doi":"https://doi.org/10.1109/icicdt59917.2023.10332416"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt59917.2023.10332416","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icicdt59917.2023.10332416","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040170623","display_name":"Zhenyu Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Zhenyu Cheng","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083782865","display_name":"Zunsong Yang","orcid":"https://orcid.org/0000-0001-8539-8481"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Zunsong Yang","raw_affiliation_strings":["The University of Tokyo,Systems Design Lab., School of Engineering,Tokyo,Japan,113-0032"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Systems Design Lab., School of Engineering,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101072944","display_name":"Yuyang Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuyang Zhu","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004839089","display_name":"Md Shamim Sarker","orcid":"https://orcid.org/0000-0003-0464-1713"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Md Shamim Sarker","raw_affiliation_strings":["The University of Tokyo,Department of Bioengineering,Tokyo,Japan,113-8656"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Bioengineering,Tokyo,Japan,113-8656","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082629938","display_name":"Hiroyasu Yamahara","orcid":"https://orcid.org/0000-0003-2369-5813"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyasu Yamahara","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010376762","display_name":"Munetoshi Seki","orcid":"https://orcid.org/0000-0003-2686-5590"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Munetoshi Seki","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","Department of Bioengineering, The University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"Department of Bioengineering, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072109963","display_name":"Hitoshi Tabata","orcid":"https://orcid.org/0000-0001-5048-6385"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Tabata","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","Department of Bioengineering, The University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"Department of Bioengineering, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007028121","display_name":"Tetsuya Iizuka","orcid":"https://orcid.org/0000-0002-1512-4714"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tetsuya Iizuka","raw_affiliation_strings":["The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","Systems Design Lab., School of Engineering, The University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Tokyo,Department of Electrical Engineering and Information Systems,Tokyo,Japan,113-0032","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]},{"raw_affiliation_string":"Systems Design Lab., School of Engineering, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5040170623"],"corresponding_institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16222266,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"92","last_page":"95"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.6758293509483337},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.6523318290710449},{"id":"https://openalex.org/keywords/cascode","display_name":"Cascode","score":0.5907307863235474},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.563990592956543},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.5476755499839783},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5345600843429565},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.5047954320907593},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5013995170593262},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.46374377608299255},{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.43143072724342346},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.4177965819835663},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4141707122325897},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39714083075523376},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36084461212158203},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3061636984348297},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22531074285507202},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.18798702955245972}],"concepts":[{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.6758293509483337},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.6523318290710449},{"id":"https://openalex.org/C2775946640","wikidata":"https://www.wikidata.org/wiki/Q1735017","display_name":"Cascode","level":4,"score":0.5907307863235474},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.563990592956543},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.5476755499839783},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5345600843429565},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.5047954320907593},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5013995170593262},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.46374377608299255},{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.43143072724342346},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.4177965819835663},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4141707122325897},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39714083075523376},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36084461212158203},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3061636984348297},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22531074285507202},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.18798702955245972},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt59917.2023.10332416","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icicdt59917.2023.10332416","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1888802228","https://openalex.org/W2002981745","https://openalex.org/W2085467379","https://openalex.org/W2143301002","https://openalex.org/W2143948542","https://openalex.org/W2157391701","https://openalex.org/W2159794630","https://openalex.org/W2892139633","https://openalex.org/W3049155030","https://openalex.org/W4360825343"],"related_works":["https://openalex.org/W2010358330","https://openalex.org/W2309688638","https://openalex.org/W2539763138","https://openalex.org/W4390187685","https://openalex.org/W2024400826","https://openalex.org/W2131553985","https://openalex.org/W2107844311","https://openalex.org/W2095707859","https://openalex.org/W2024183800","https://openalex.org/W3150374606"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,60],"two-stage":[4,91],"low-noise":[5],"amplifier":[6,64],"(LNA)":[7],"for":[8,32,65],"spin":[9,13],"wave":[10,14],"detection.":[11],"Since":[12],"detection":[15],"must":[16],"be":[17,27],"performed":[18],"under":[19],"strong":[20],"magnetic":[21],"field,":[22],"no":[23],"on-chip":[24,87],"inductors":[25],"should":[26],"used":[28],"in":[29,73],"the":[30,89,94,112],"circuit":[31],"avoiding":[33],"unexpected":[34],"electromagnetic":[35],"coupling.":[36],"The":[37,56,69],"first":[38],"stage":[39,58],"employs":[40],"noise-canceling":[41],"and":[42,52,77,105],"$g_{m}$-boosting":[43],"to":[44],"provide":[45],"preferable":[46],"noise":[47,103],"figure,":[48,104],"wideband":[49],"input":[50,109],"matching":[51,110],"low":[53],"power":[54],"consumption.":[55],"second":[57],"is":[59,71],"fully":[61],"differential":[62],"cascode":[63],"further":[66],"voltage":[67],"gain.":[68],"prototype":[70],"implemented":[72],"65nm":[74],"CMOS":[75],"technology":[76],"consumes":[78],"8.3":[79],"mA":[80],"from":[81],"1":[82],"V":[83],"supply.":[84],"Without":[85],"any":[86],"inductor,":[88],"proposed":[90],"LNA":[92],"including":[93],"output":[95],"buffer":[96],"achieves":[97],"30.6":[98],"dB":[99],"maximum":[100],"gain,":[101],"3.4-5.4dB":[102],"better":[106],"than":[107],"-10dB":[108],"within":[111],"frequency":[113],"range":[114],"of":[115],"1-5":[116],"GHz":[117],"based":[118],"on":[119],"post-layout":[120],"simulation":[121],"results.":[122]},"counts_by_year":[],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}
