{"id":"https://openalex.org/W4308536754","doi":"https://doi.org/10.1109/icicdt56182.2022.9933107","title":"Machine Learning Method for Accurate Analysis of Complicated Low Temperature Random Telegraph Noise","display_name":"Machine Learning Method for Accurate Analysis of Complicated Low Temperature Random Telegraph Noise","publication_year":2022,"publication_date":"2022-09-21","ids":{"openalex":"https://openalex.org/W4308536754","doi":"https://doi.org/10.1109/icicdt56182.2022.9933107"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt56182.2022.9933107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt56182.2022.9933107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062039431","display_name":"Xinze Li","orcid":"https://orcid.org/0000-0003-3513-209X"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinze Li","raw_affiliation_strings":["Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]},{"raw_affiliation_string":"School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090304366","display_name":"Ying Sun","orcid":"https://orcid.org/0009-0005-1143-5928"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Sun","raw_affiliation_strings":["Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]},{"raw_affiliation_string":"School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101972816","display_name":"Jing Wan","orcid":"https://orcid.org/0000-0002-6339-4006"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wan","raw_affiliation_strings":["Fudan University,School of Information Science and Engineering,Shanghai,China,200433"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,School of Information Science and Engineering,Shanghai,China,200433","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100443083","display_name":"Bing Chen","orcid":"https://orcid.org/0000-0001-5284-8618"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Chen","raw_affiliation_strings":["Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]},{"raw_affiliation_string":"School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004036087","display_name":"Ran Cheng","orcid":"https://orcid.org/0000-0001-9410-8263"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ran Cheng","raw_affiliation_strings":["Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,School of Micro-Nano Electronics,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]},{"raw_affiliation_string":"School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055388927","display_name":"Genquan Han","orcid":"https://orcid.org/0000-0001-5140-4150"},"institutions":[{"id":"https://openalex.org/I149594827","display_name":"Xidian University","ror":"https://ror.org/05s92vm98","country_code":"CN","type":"education","lineage":["https://openalex.org/I149594827"]},{"id":"https://openalex.org/I4210123185","display_name":"Zhejiang Lab","ror":"https://ror.org/02m2h7991","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210123185"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Genquan Han","raw_affiliation_strings":["Xidian University,School of Microelectronics,Xi’an,China,710071","Research Center for Intelligent Chips, Zhejiang Lab, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xidian University,School of Microelectronics,Xi’an,China,710071","institution_ids":["https://openalex.org/I149594827"]},{"raw_affiliation_string":"Research Center for Intelligent Chips, Zhejiang Lab, Hangzhou, China","institution_ids":["https://openalex.org/I4210123185"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"20","last_page":"23"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hidden-markov-model","display_name":"Hidden Markov model","score":0.7153235673904419},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.7082352042198181},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5633174180984497},{"id":"https://openalex.org/keywords/medoid","display_name":"Medoid","score":0.5440314412117004},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5222700238227844},{"id":"https://openalex.org/keywords/mixture-model","display_name":"Mixture model","score":0.5187978148460388},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5089917182922363},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.45337387919425964}],"concepts":[{"id":"https://openalex.org/C23224414","wikidata":"https://www.wikidata.org/wiki/Q176769","display_name":"Hidden Markov model","level":2,"score":0.7153235673904419},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.7082352042198181},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5633174180984497},{"id":"https://openalex.org/C63085389","wikidata":"https://www.wikidata.org/wiki/Q4287912","display_name":"Medoid","level":3,"score":0.5440314412117004},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5222700238227844},{"id":"https://openalex.org/C61224824","wikidata":"https://www.wikidata.org/wiki/Q2260434","display_name":"Mixture model","level":2,"score":0.5187978148460388},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5089917182922363},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.45337387919425964},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt56182.2022.9933107","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt56182.2022.9933107","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2009412580","https://openalex.org/W2035374584","https://openalex.org/W2150749023","https://openalex.org/W2527428640","https://openalex.org/W2620783965","https://openalex.org/W2648901156","https://openalex.org/W2883295043","https://openalex.org/W2890577732","https://openalex.org/W2914488358","https://openalex.org/W3169299368"],"related_works":["https://openalex.org/W3133849001","https://openalex.org/W2022056881","https://openalex.org/W2081066201","https://openalex.org/W4324119469","https://openalex.org/W2164868312","https://openalex.org/W2160650576","https://openalex.org/W2587710587","https://openalex.org/W2100425112","https://openalex.org/W3037673319","https://openalex.org/W2052862819"],"abstract_inverted_index":{"In":[0,85],"this":[1],"work,":[2],"the":[3,9,24,28,48,56,64,68,72,77,81,103,106,121,130],"Hidden":[4],"Markov":[5],"Model":[6,19],"(HMM),":[7],"and":[8,16,55,97,114,133],"machine":[10,122],"learning":[11,123],"methods,":[12],"namely,":[13],"K-Medoids":[14,78,87,115],"clustering":[15,79,88],"Gaussian":[17],"Mixture":[18],"(GMM)":[20],"were":[21,59,109],"used":[22],"for":[23,129],"data":[25],"analysis":[26],"of":[27,47,94,102,135],"complicated":[29,136],"RTN":[30,137],"signals":[31],"in":[32,51,92,139],"18":[33],"nm":[34],"Fully":[35],"Depleted":[36],"Silicon":[37],"on":[38],"Insulator":[39],"(FDSOI)":[40],"n-FET":[41],"at":[42],"low":[43],"temperature.":[44],"The":[45,99],"differences":[46],"three":[49],"methods":[50],"fitting":[52,74,83],"accuracy,":[53],"efficiency":[54],"defect":[57],"location":[58],"compared.":[60],"As":[61],"compared":[62],"with":[63,112],"conventional":[65],"HMM":[66,113],"model,":[67],"GMM":[69],"model":[70],"exhibits":[71],"highest":[73,82],"accuracy":[75],"while":[76],"shows":[80],"efficiency.":[84],"general,":[86],"is":[89],"more":[90],"balanced":[91],"terms":[93],"extraction":[95],"speed":[96],"accuracy.":[98],"relative":[100],"locations":[101],"traps":[104,138],"within":[105],"gate":[107],"oxide":[108],"also":[110],"calculated,":[111],"show":[116],"similar":[117],"trap":[118],"positions.":[119],"Hence,":[120],"method":[124],"provides":[125],"a":[126],"new":[127],"solution":[128],"accurate":[131],"identification":[132],"localization":[134],"cryogenic":[140],"transistors.":[141]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}