{"id":"https://openalex.org/W4308536690","doi":"https://doi.org/10.1109/icicdt56182.2022.9933101","title":"Wide Lock-in Range CDR with Modified DQFD and Coarse-fine Tuning Technique","display_name":"Wide Lock-in Range CDR with Modified DQFD and Coarse-fine Tuning Technique","publication_year":2022,"publication_date":"2022-09-21","ids":{"openalex":"https://openalex.org/W4308536690","doi":"https://doi.org/10.1109/icicdt56182.2022.9933101"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt56182.2022.9933101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt56182.2022.9933101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070314228","display_name":"Tzung-Je Lee","orcid":"https://orcid.org/0000-0001-6870-7406"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tzung-Je Lee","raw_affiliation_strings":["National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424"],"affiliations":[{"raw_affiliation_string":"National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060882471","display_name":"Bo-Hao Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Bo-Hao Liao","raw_affiliation_strings":["National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424"],"affiliations":[{"raw_affiliation_string":"National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424"],"affiliations":[{"raw_affiliation_string":"National Sun Yat-Sen University,Department of Electrical Engineering,Kaohsiung,Taiwan,80424","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070314228"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.0915,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.41212615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"61","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9291476011276245},{"id":"https://openalex.org/keywords/lock","display_name":"Lock (firearm)","score":0.6060454249382019},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.5721943378448486},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5064550638198853},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5013389587402344},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.47517886757850647},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47431325912475586},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4693278670310974},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.43737873435020447},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32549187541007996},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27934885025024414},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1697370707988739},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10860180854797363},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0788290798664093}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9291476011276245},{"id":"https://openalex.org/C174839445","wikidata":"https://www.wikidata.org/wiki/Q1134386","display_name":"Lock (firearm)","level":2,"score":0.6060454249382019},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.5721943378448486},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5064550638198853},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5013389587402344},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.47517886757850647},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47431325912475586},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4693278670310974},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.43737873435020447},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32549187541007996},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27934885025024414},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1697370707988739},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10860180854797363},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0788290798664093},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt56182.2022.9933101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt56182.2022.9933101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7599999904632568}],"awards":[],"funders":[{"id":"https://openalex.org/F4320316499","display_name":"National Applied Research Laboratories","ror":"https://ror.org/05wcstg80"},{"id":"https://openalex.org/F4320322108","display_name":"Ministry of Science and Technology","ror":"https://ror.org/032e49973"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2003473732","https://openalex.org/W2045765258","https://openalex.org/W2133488847","https://openalex.org/W2148195081","https://openalex.org/W2316721935","https://openalex.org/W2344599985","https://openalex.org/W2470238568","https://openalex.org/W2515361689","https://openalex.org/W2807782377","https://openalex.org/W2941009233","https://openalex.org/W2959455346","https://openalex.org/W3101169533"],"related_works":["https://openalex.org/W2070109416","https://openalex.org/W2976219355","https://openalex.org/W1994021281","https://openalex.org/W2139484866","https://openalex.org/W2089131288","https://openalex.org/W1600405202","https://openalex.org/W1486070987","https://openalex.org/W3064661991","https://openalex.org/W2936029881","https://openalex.org/W2072077388"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,82],"CDR":[4],"circuit":[5,19],"with":[6,81],"wide":[7,41],"lock-in":[8,29,90],"range":[9,30,43,91],"and":[10,20,70,95],"low":[11],"jitter.":[12],"By":[13],"using":[14],"the":[15,21,28,34,37,64,68,96],"Frequency":[16,26],"Increase/Decrease":[17],"Control":[18],"Modified":[22],"DQFD":[23],"(Digital":[24],"Quadricorrelator":[25],"Detector),":[27],"is":[31,45,79,92,100],"enhanced.":[32],"Besides,":[33],"problem":[35],"of":[36],"state":[38],"loss":[39],"at":[40],"frequency":[42],"detection":[44],"avoided.":[46],"The":[47,76,88],"Coarse-fine":[48],"Tuning":[49],"VCO":[50],"provides":[51],"two":[52],"control":[53],"wires":[54],"such":[55],"that":[56],"separate":[57],"loop":[58],"filters":[59],"could":[60,72],"be":[61,73],"involved":[62],"in":[63],"dual":[65],"loops.":[66],"Thus,":[67],"noise":[69],"jitter":[71,99],"further":[74],"miniaturized.":[75],"proposed":[77],"design":[78],"implemented":[80],"typical":[83],"40":[84],"nm":[85],"CMOS":[86],"process.":[87],"simulated":[89,97],"1-6.5":[93],"GHz":[94],"RMS":[98],"5.79":[101],"ps.":[102]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}