{"id":"https://openalex.org/W2968636862","doi":"https://doi.org/10.1109/icicdt.2019.8790869","title":"Low Frequency Noise in CMOS Switched-g<sub>m</sub> Mixers: A Quasi-Analytical Model","display_name":"Low Frequency Noise in CMOS Switched-g<sub>m</sub> Mixers: A Quasi-Analytical Model","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2968636862","doi":"https://doi.org/10.1109/icicdt.2019.8790869","mag":"2968636862"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2019.8790869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078475308","display_name":"Benqing Guo","orcid":"https://orcid.org/0000-0001-5376-4942"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Benqing Guo","raw_affiliation_strings":["School of Information and Communication Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, P. R. China"],"affiliations":[{"raw_affiliation_string":"School of Information and Communication Engineering, University of Electronic Science and Technology of China, Chengdu, 611731, P. R. China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101779960","display_name":"Jing Gong","orcid":"https://orcid.org/0000-0003-1795-062X"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I4210089761","display_name":"West China Hospital of Sichuan University","ror":"https://ror.org/007mrxy13","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210089761"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Gong","raw_affiliation_strings":["Sichuan University, West China Hospital, Chengdu, 610000, P. R. China"],"affiliations":[{"raw_affiliation_string":"Sichuan University, West China Hospital, Chengdu, 610000, P. R. China","institution_ids":["https://openalex.org/I24185976","https://openalex.org/I4210089761"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102861347","display_name":"Jun Chen","orcid":"https://orcid.org/0000-0001-6493-0950"},"institutions":[{"id":"https://openalex.org/I2250955327","display_name":"Huawei Technologies (China)","ror":"https://ror.org/00cmhce21","country_code":"CN","type":"company","lineage":["https://openalex.org/I2250955327"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Chen","raw_affiliation_strings":["Huawei Technologies Co. Ltd., Chengdu, 610000, P. R. China"],"affiliations":[{"raw_affiliation_string":"Huawei Technologies Co. Ltd., Chengdu, 610000, P. R. China","institution_ids":["https://openalex.org/I2250955327"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078475308"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.4576357,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.9002052545547485},{"id":"https://openalex.org/keywords/flicker","display_name":"Flicker","score":0.6854308843612671},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6531057357788086},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6097958087921143},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5253039002418518},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.4950381815433502},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.49271872639656067},{"id":"https://openalex.org/keywords/harmonic-mixer","display_name":"Harmonic mixer","score":0.48261913657188416},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.4769945740699768},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4413689374923706},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.42549777030944824},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.4231874942779541},{"id":"https://openalex.org/keywords/noise-spectral-density","display_name":"Noise spectral density","score":0.41505491733551025},{"id":"https://openalex.org/keywords/local-oscillator","display_name":"Local oscillator","score":0.3852885961532593},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3707834780216217},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3382715880870819},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3303547501564026},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28105419874191284}],"concepts":[{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.9002052545547485},{"id":"https://openalex.org/C19743564","wikidata":"https://www.wikidata.org/wiki/Q25378119","display_name":"Flicker","level":2,"score":0.6854308843612671},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6531057357788086},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6097958087921143},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5253039002418518},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.4950381815433502},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.49271872639656067},{"id":"https://openalex.org/C97145050","wikidata":"https://www.wikidata.org/wiki/Q5659262","display_name":"Harmonic mixer","level":4,"score":0.48261913657188416},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.4769945740699768},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4413689374923706},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.42549777030944824},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.4231874942779541},{"id":"https://openalex.org/C133976006","wikidata":"https://www.wikidata.org/wiki/Q3023291","display_name":"Noise spectral density","level":5,"score":0.41505491733551025},{"id":"https://openalex.org/C203597036","wikidata":"https://www.wikidata.org/wiki/Q1238887","display_name":"Local oscillator","level":3,"score":0.3852885961532593},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3707834780216217},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3382715880870819},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3303547501564026},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28105419874191284},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2019.8790869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1990569371","https://openalex.org/W2012342710","https://openalex.org/W2020195524","https://openalex.org/W2102365579","https://openalex.org/W2122193289","https://openalex.org/W2330008665","https://openalex.org/W2885270851","https://openalex.org/W3021186357"],"related_works":["https://openalex.org/W4243333603","https://openalex.org/W2134436426","https://openalex.org/W3021392142","https://openalex.org/W286594222","https://openalex.org/W4236509694","https://openalex.org/W2014396867","https://openalex.org/W3150676548","https://openalex.org/W2107607160","https://openalex.org/W2115379395","https://openalex.org/W2166272290"],"abstract_inverted_index":{"Low":[0],"frequency":[1,43],"noise":[2,31,58,78],"in":[3,33],"active":[4,36],"mixers":[5],"of":[6,60,70,76],"direct":[7],"conversion":[8],"receivers":[9],"(DCR)":[10],"can":[11],"compromise":[12],"overall":[13],"receiver":[14],"sensitivity.":[15],"In":[16],"this":[17],"paper,":[18],"A":[19],"qualitative":[20],"quasi-analytical":[21],"model":[22,39],"has":[23],"been":[24],"developed":[25],"to":[26,54],"in-depth":[27],"explain":[28],"the":[29,34,48,56,64,68,71,74],"flicker":[30,57,77],"mechanisms":[32],"switched-gm":[35],"mixer.":[37,49],"The":[38],"simply":[40],"explains":[41],"how":[42],"translations":[44],"take":[45],"place":[46],"within":[47],"Compact":[50],"equations":[51],"are":[52],"derived":[53],"estimate":[55],"contribution":[59],"individual":[61],"stages":[62],"at":[63],"output.":[65],"Simulations":[66],"validate":[67],"accuracy":[69],"predictions,":[72],"and":[73,86],"dependence":[75],"on":[79],"local":[80],"oscillator":[81],"(LO)":[82],"slope":[83],"ratio,":[84],"period,":[85],"other":[87],"circuit":[88],"parameters.":[89]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}