{"id":"https://openalex.org/W2966907905","doi":"https://doi.org/10.1109/icicdt.2019.8790840","title":"Design of a Low-Voltage CMOS Mixer with Improved Linearity","display_name":"Design of a Low-Voltage CMOS Mixer with Improved Linearity","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2966907905","doi":"https://doi.org/10.1109/icicdt.2019.8790840","mag":"2966907905"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2019.8790840","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113031792","display_name":"Jiajie Gou","orcid":"https://orcid.org/0009-0004-7012-0435"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"J. Gou","raw_affiliation_strings":["No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China"],"affiliations":[{"raw_affiliation_string":"No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China","institution_ids":["https://openalex.org/I2800372957"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031730164","display_name":"Xinwei Xu","orcid":"https://orcid.org/0000-0002-6063-5927"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X.-Y. Xu","raw_affiliation_strings":["No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China"],"affiliations":[{"raw_affiliation_string":"No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China","institution_ids":["https://openalex.org/I2800372957"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067503683","display_name":"Xiaofei Huang","orcid":"https://orcid.org/0000-0003-4793-433X"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X.-G. Huang","raw_affiliation_strings":["No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China"],"affiliations":[{"raw_affiliation_string":"No.36 Research Institute of China Electronic Technology Group Corporation, Jiaxing, P. R. China","institution_ids":["https://openalex.org/I2800372957"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5113031792"],"corresponding_institution_ids":["https://openalex.org/I2800372957"],"apc_list":null,"apc_paid":null,"fwci":0.2413,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.55152878,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7923696637153625},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.7517473101615906},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6145358681678772},{"id":"https://openalex.org/keywords/frequency-mixer","display_name":"Frequency mixer","score":0.5429735779762268},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5248813033103943},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5159850716590881},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5120678544044495},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4953705072402954},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.47093263268470764},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.46697115898132324},{"id":"https://openalex.org/keywords/choke","display_name":"Choke","score":0.4606620669364929},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4580669701099396},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4185049831867218},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29761964082717896},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.26677942276000977},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.18442687392234802}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7923696637153625},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.7517473101615906},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6145358681678772},{"id":"https://openalex.org/C15982861","wikidata":"https://www.wikidata.org/wiki/Q1357187","display_name":"Frequency mixer","level":3,"score":0.5429735779762268},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5248813033103943},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5159850716590881},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5120678544044495},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4953705072402954},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.47093263268470764},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.46697115898132324},{"id":"https://openalex.org/C29049376","wikidata":"https://www.wikidata.org/wiki/Q864746","display_name":"Choke","level":2,"score":0.4606620669364929},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4580669701099396},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4185049831867218},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29761964082717896},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.26677942276000977},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.18442687392234802}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2019.8790840","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2019.8790840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Conference on IC Design and Technology (ICICDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2132938334","https://openalex.org/W2149927630","https://openalex.org/W2520196286","https://openalex.org/W2789621686","https://openalex.org/W2889161343","https://openalex.org/W3009316272"],"related_works":["https://openalex.org/W2187635882","https://openalex.org/W1967298027","https://openalex.org/W2374610371","https://openalex.org/W4365452886","https://openalex.org/W4313410954","https://openalex.org/W2588786001","https://openalex.org/W2108128297","https://openalex.org/W2897529441","https://openalex.org/W2140000774","https://openalex.org/W3094229536"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,32,85,100,106,112,127],"low-voltage":[4,76],"CMOS":[5,77,90],"(complementary-metal-oxide-semiconductor)":[6],"mixer":[7,79,98],"with":[8],"low":[9],"power":[10,128],"consumption.":[11],"By":[12],"using":[13],"the":[14,17,24,52,60,63,75,97],"folded-cascade":[15,78],"structure,":[16],"problem":[18],"on":[19,84],"high":[20],"supply":[21,129],"voltage":[22,44,130],"of":[23,62,103,109,118,131],"stacking":[25],"transconductance-stage":[26],"and":[27,82,121],"switching-stage":[28],"is":[29,36,80],"solved.":[30],"Firstly,":[31],"differential":[33],"cross-coupling":[34],"structure":[35],"used":[37,50],"to":[38],"improve":[39],"transconductance-stage's":[40],"linearity":[41],"without":[42,70],"decreasing":[43],"margin.":[45],"Then,":[46],"two":[47],"inductors":[48],"are":[49],"as":[51],"RF":[53,65,89],"(Radio":[54],"Frequency)":[55],"choke,":[56],"which":[57],"could":[58],"prevent":[59],"leakage":[61],"input":[64,114],"signal":[66],"at":[67,126],"design":[68],"frequency":[69],"consuming":[71],"direct-current":[72],"voltage.":[73],"Finally,":[74],"designed":[81],"verified":[83],"TSMC":[86],"0.18":[87],"um":[88],"process.":[91],"The":[92],"simulation":[93],"results":[94],"show":[95],"that":[96],"features":[99],"conversion":[101],"gain":[102],"15.8":[104],"dB,":[105,111],"noise":[107],"figure":[108],"11":[110],"third-order":[113],"intercept":[115],"point":[116],"(IIP3)":[117],"1.4":[119],"dBm,":[120],"consumes":[122],"only":[123],"3":[124],"mW":[125],"1.2":[132],"V.":[133]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}