{"id":"https://openalex.org/W2074412089","doi":"https://doi.org/10.1109/icicdt.2014.6838601","title":"32% Slew rate and 27% data rate improved 2×VDD output buffer using PVTL compensation","display_name":"32% Slew rate and 27% data rate improved 2×VDD output buffer using PVTL compensation","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W2074412089","doi":"https://doi.org/10.1109/icicdt.2014.6838601","mag":"2074412089"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2014.6838601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2014.6838601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070314228","display_name":"Tzung-Je Lee","orcid":"https://orcid.org/0000-0001-6870-7406"},"institutions":[{"id":"https://openalex.org/I91951123","display_name":"Cheng Shiu University","ror":"https://ror.org/011bdtx65","country_code":"TW","type":"education","lineage":["https://openalex.org/I91951123"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Tzung-Je Lee","raw_affiliation_strings":["Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan","Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan 83347"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I91951123"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung, Taiwan 83347","institution_ids":["https://openalex.org/I91951123"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075036140","display_name":"Kai-Wei Ruan","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Wei Ruan","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077220045","display_name":"Chua\u2010Chin Wang","orcid":"https://orcid.org/0000-0002-2426-2879"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chua-Chin Wang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering National Sun Yat-Sen University Kaohsiung, Taiwan 80424","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5070314228"],"corresponding_institution_ids":["https://openalex.org/I91951123"],"apc_list":null,"apc_paid":null,"fwci":0.4187,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68617038,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.8978278636932373},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6581639051437378},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5737495422363281},{"id":"https://openalex.org/keywords/buffer","display_name":"Buffer (optical fiber)","score":0.5405224561691284},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5402599573135376},{"id":"https://openalex.org/keywords/frequency-compensation","display_name":"Frequency compensation","score":0.5155260562896729},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.48689761757850647},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4846346974372864},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47319266200065613},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43372708559036255},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4068180322647095},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32040441036224365},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23354992270469666},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2152143120765686},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2054143249988556},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1943056881427765}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.8978278636932373},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6581639051437378},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5737495422363281},{"id":"https://openalex.org/C145018004","wikidata":"https://www.wikidata.org/wiki/Q4985944","display_name":"Buffer (optical fiber)","level":2,"score":0.5405224561691284},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5402599573135376},{"id":"https://openalex.org/C131782439","wikidata":"https://www.wikidata.org/wiki/Q1455581","display_name":"Frequency compensation","level":4,"score":0.5155260562896729},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.48689761757850647},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4846346974372864},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47319266200065613},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43372708559036255},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4068180322647095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32040441036224365},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23354992270469666},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2152143120765686},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2054143249988556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1943056881427765},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2014.6838601","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2014.6838601","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1561782264","https://openalex.org/W2072102935","https://openalex.org/W2132220603","https://openalex.org/W2138387379","https://openalex.org/W2143738690","https://openalex.org/W2169676602","https://openalex.org/W2170137374","https://openalex.org/W3047826795"],"related_works":["https://openalex.org/W4386167960","https://openalex.org/W2185588300","https://openalex.org/W4236869048","https://openalex.org/W2167303105","https://openalex.org/W2080011931","https://openalex.org/W2969974063","https://openalex.org/W2782485102","https://openalex.org/W2323093206","https://openalex.org/W3208327896","https://openalex.org/W2061118292"],"abstract_inverted_index":{"A":[0],"2\u00d7VDD":[1],"Output":[2],"Buffer":[3],"using":[4,74],"PVTL":[5],"compensation":[6,18,26],"is":[7,20,67,72,84,92,101],"proposed":[8,24,70],"in":[9],"this":[10],"paper.":[11],"Beside":[12],"the":[13,23,28,48,52,57],"PVT":[14],"compensation,":[15],"a":[16,75],"Leakage":[17,25],"circuit":[19],"employed.":[21],"With":[22],"circuit,":[27],"SR":[29,91],"(slew":[30],"rate)":[31],"and":[32,39,63,107,115],"data":[33,99],"rate":[34,100],"are":[35],"improved":[36],"by":[37,56],"32%":[38],"27%,":[40],"respectively,":[41],"for":[42,110],"VDDIO":[43,111],"=":[44,112],"1.8":[45],"V":[46],"at":[47],"worst":[49],"case.":[50],"Moreover,":[51],"reliability":[53],"problem":[54],"caused":[55],"unstable":[58],"voltage,":[59],"gate":[60],"oxide":[61],"overstress":[62],"hot":[64],"carrier":[65],"degradation":[66],"avoided.":[68],"The":[69,81,90,98],"design":[71],"implemented":[73],"typical":[76],"90":[77],"nm":[78],"CMOS":[79],"process.":[80],"core":[82],"area":[83],"0.425":[85],"mm":[86],"\u00d7":[87],"0.0563":[88],"mm.":[89],"simulated":[93,102],"to":[94,103],"be":[95,104],"1.3-3.0":[96],"V/ns.":[97],"454,":[105],"370,":[106],"500":[108],"MHz":[109],"1.8,":[113],"1.2,":[114],"1.0":[116],"V,":[117],"respectively.":[118]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}