{"id":"https://openalex.org/W2078742081","doi":"https://doi.org/10.1109/icicdt.2012.6232877","title":"A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing","display_name":"A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2078742081","doi":"https://doi.org/10.1109/icicdt.2012.6232877","mag":"2078742081"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2012.6232877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084746242","display_name":"Dimitri Soussan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Dimitri Soussan","raw_affiliation_strings":["LETI, CEA, Grenoble, France","ST Microelectronics Crolles, Crolles, France"],"affiliations":[{"raw_affiliation_string":"LETI, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]},{"raw_affiliation_string":"ST Microelectronics Crolles, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079482442","display_name":"Alexandre Valentian","orcid":"https://orcid.org/0000-0002-4319-6563"},"institutions":[{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alexandre Valentian","raw_affiliation_strings":["LETI, CEA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"LETI, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002526522","display_name":"S. Majcherczak","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Sylvain Majcherczak","raw_affiliation_strings":["ST Microelectronics Crolles, Crolles, France"],"affiliations":[{"raw_affiliation_string":"ST Microelectronics Crolles, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106036198","display_name":"Marc Belleville","orcid":null},"institutions":[{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I3020098449","display_name":"CEA Grenoble","ror":"https://ror.org/02mg6n827","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Marc Belleville","raw_affiliation_strings":["LETI, CEA, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"LETI, CEA, Grenoble, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I3020098449","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5084746242"],"corresponding_institution_ids":["https://openalex.org/I2738703131","https://openalex.org/I3020098449","https://openalex.org/I4210104693","https://openalex.org/I4210150049"],"apc_list":null,"apc_paid":null,"fwci":0.4034,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.64644826,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.8909768462181091},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5857635736465454},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.5625287890434265},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5616304278373718},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5396753549575806},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5190001726150513},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.5045429468154907},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.49138227105140686},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4520738124847412},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38196897506713867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2697542905807495},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2661041021347046},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2132658064365387},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19912710785865784},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.09867802262306213}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.8909768462181091},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5857635736465454},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.5625287890434265},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5616304278373718},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5396753549575806},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5190001726150513},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.5045429468154907},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.49138227105140686},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4520738124847412},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38196897506713867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2697542905807495},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2661041021347046},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2132658064365387},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19912710785865784},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.09867802262306213},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2012.6232877","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232877","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1489728615","https://openalex.org/W2010401422","https://openalex.org/W2084758815","https://openalex.org/W2106941563","https://openalex.org/W2113288380","https://openalex.org/W2138096420","https://openalex.org/W2165215843","https://openalex.org/W6629402789"],"related_works":["https://openalex.org/W4283824105","https://openalex.org/W2307120179","https://openalex.org/W2572422521","https://openalex.org/W2126751867","https://openalex.org/W2004392033","https://openalex.org/W2536800026","https://openalex.org/W2026961927","https://openalex.org/W4297786912","https://openalex.org/W2356432821","https://openalex.org/W4255518127"],"abstract_inverted_index":{"A":[0],"mixed":[1],"analog/digital":[2],"impedance":[3,34],"calibration":[4],"circuit":[5],"for":[6,54],"LPDDR2":[7],"transmitter":[8],"is":[9,43],"proposed,":[10],"taking":[11],"advantage":[12],"of":[13,35],"the":[14,29,33,36,40,46,50],"Fully":[15],"Depleted":[16],"SOI":[17],"technology":[18],"and":[19,31,56],"its":[20],"back":[21,63],"biasing":[22,64],"capability.":[23],"This":[24],"feature":[25],"allows":[26],"to":[27,52,62],"modulate":[28],"current,":[30],"hence":[32],"output":[37],"driver.":[38],"While":[39],"process":[41],"deviation":[42],"compensated":[44],"digitally,":[45],"proposed":[47],"technique":[48],"gives":[49],"opportunity":[51],"compensate":[53],"temperature":[55],"voltage":[57],"drifts":[58],"during":[59],"transmission":[60],"thanks":[61],"control.":[65]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}