{"id":"https://openalex.org/W2074626442","doi":"https://doi.org/10.1109/icicdt.2012.6232839","title":"Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications","display_name":"Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2074626442","doi":"https://doi.org/10.1109/icicdt.2012.6232839","mag":"2074626442"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2012.6232839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068577719","display_name":"J. Franco","orcid":"https://orcid.org/0000-0002-7382-8605"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"J. Franco","raw_affiliation_strings":["Imec, Leuven, Belgium","also ESAT Dept., KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"also ESAT Dept., KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110590613","display_name":"J\u00e9r\u00f4me Mitard","orcid":"https://orcid.org/0000-0002-7422-079X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Mitard","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108442484","display_name":"M. Toledano-Luque","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. Toledano-Luque","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086668405","display_name":"Felice Crupi","orcid":"https://orcid.org/0000-0002-5011-6621"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE","IT"],"is_corresponding":false,"raw_author_name":"F. Crupi","raw_affiliation_strings":["Imec, Leuven, Belgium","Universista\u00e0 della Calabria, Italy","Universit\u00e0 della Calabria, Italy"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Universista\u00e0 della Calabria, Italy","institution_ids":["https://openalex.org/I45204951"]},{"raw_affiliation_string":"Universit\u00e0 della Calabria, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075183384","display_name":"Geert Eneman","orcid":"https://orcid.org/0000-0002-5849-3384"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Eneman","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5096891262","display_name":"Ph. J. Rousse","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ph. J. Rousse","raw_affiliation_strings":["imec, Kapeldreef 75, B3001 Leuven - Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, B3001 Leuven - Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT","BE"],"is_corresponding":false,"raw_author_name":"T. Grasser","raw_affiliation_strings":["Imec, Leuven, Belgium","Technische Universit\u00e4t Wien, Austria"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Technische Universit\u00e4t Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018137674","display_name":"M. Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. Cho","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038148281","display_name":"T. Kauerauf","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"T. Kauerauf","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060988237","display_name":"Liesbeth Witters","orcid":"https://orcid.org/0000-0002-0772-5501"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"L. Witters","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064166800","display_name":"Geert Hellings","orcid":"https://orcid.org/0000-0002-5376-2119"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Hellings","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057022290","display_name":"L.-\u00c5. Ragnarsson","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"L.-A Ragnarsson","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065113949","display_name":"Naoto Horiguchi","orcid":"https://orcid.org/0000-0001-5490-0416"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"N. Horiguchi","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053777799","display_name":"Marc Heyns","orcid":"https://orcid.org/0000-0002-1199-4341"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. Heyns","raw_affiliation_strings":["imec, Kapeldreef 75, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec, Kapeldreef 75, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020367935","display_name":"G. Groeseneken","orcid":"https://orcid.org/0000-0003-3763-2098"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Groeseneken","raw_affiliation_strings":["Imec, Leuven, Belgium","also ESAT Dept., KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"also ESAT Dept., KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":16,"corresponding_author_ids":["https://openalex.org/A5068577719"],"corresponding_institution_ids":["https://openalex.org/I4210114974","https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.78803668,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.656200110912323},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5843935012817383},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5724177360534668},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.5596303939819336},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5538889765739441},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5191099643707275},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5149115324020386},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.48434126377105713},{"id":"https://openalex.org/keywords/gate-dielectric","display_name":"Gate dielectric","score":0.43264034390449524},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.42883503437042236},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.42502039670944214},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.37161019444465637},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3349088728427887},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2938730716705322},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.17149734497070312},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16205716133117676},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09228378534317017},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08453559875488281},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.07603928446769714}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.656200110912323},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5843935012817383},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5724177360534668},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.5596303939819336},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5538889765739441},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5191099643707275},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5149115324020386},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.48434126377105713},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.43264034390449524},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.42883503437042236},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.42502039670944214},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.37161019444465637},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3349088728427887},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2938730716705322},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.17149734497070312},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16205716133117676},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09228378534317017},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08453559875488281},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07603928446769714},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2012.6232839","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232839","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design & Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1499580424","https://openalex.org/W1971395995","https://openalex.org/W1989815901","https://openalex.org/W1998287536","https://openalex.org/W2009144272","https://openalex.org/W2023223863","https://openalex.org/W2080749001","https://openalex.org/W2090987773","https://openalex.org/W2097733814","https://openalex.org/W2102209270","https://openalex.org/W2103180611","https://openalex.org/W2105327370","https://openalex.org/W2106482808","https://openalex.org/W2108839731","https://openalex.org/W2117621013","https://openalex.org/W2134777311","https://openalex.org/W2146992328","https://openalex.org/W2147445052","https://openalex.org/W2153468435"],"related_works":["https://openalex.org/W2157278395","https://openalex.org/W2152950565","https://openalex.org/W2374313965","https://openalex.org/W1617565119","https://openalex.org/W160381218","https://openalex.org/W4283025278","https://openalex.org/W2167195438","https://openalex.org/W2843479960","https://openalex.org/W2132453866","https://openalex.org/W2154260911"],"abstract_inverted_index":{"With":[0],"a":[1,32,49],"significantly":[2,50],"reduced":[3,51],"Negative":[4],"Bias":[5],"Temperature":[6],"Instability,":[7],"SiGe":[8,38,87],"channel":[9,39],"pMOSFETs":[10],"promise":[11],"to":[12,46,77],"virtually":[13],"eliminate":[14],"this":[15,47],"reliability":[16,61],"issue":[17],"for":[18],"ultra-thin":[19],"EOT":[20],"devices.":[21],"The":[22],"intrinsically":[23],"superior":[24],"NBTI":[25],"robustness":[26],"is":[27,57,89],"understood":[28],"in":[29],"terms":[30],"of":[31,54,94],"favorable":[33],"energy":[34],"decoupling":[35],"between":[36],"the":[37,41,81,86,92],"and":[40,71],"gate":[42],"dielectric":[43],"defects.":[44],"Thanks":[45],"effect,":[48],"time-dependent":[52],"variability":[53],"nanoscaled":[55],"devices":[56],"also":[58],"observed.":[59],"Other":[60],"mechanisms,":[62],"such":[63],"as":[64],"Channel":[65],"Hot":[66],"Carriers,":[67],"Time-Dependent":[68],"Dielectric":[69],"Breakdown":[70],"Low-Frequency":[72],"noise":[73],"are":[74],"demonstrated":[75],"not":[76],"be":[78],"showstoppers.":[79],"Finally":[80],"performance":[82],"improvement":[83],"promised":[84],"by":[85],"technology":[88],"discussed":[90],"from":[91],"perspective":[93],"VLSI":[95],"logic":[96],"circuits.":[97]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}