{"id":"https://openalex.org/W1992631566","doi":"https://doi.org/10.1109/icicdt.2012.6232836","title":"Gate delay modeling for static timing analysis of body-biased circuits","display_name":"Gate delay modeling for static timing analysis of body-biased circuits","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W1992631566","doi":"https://doi.org/10.1109/icicdt.2012.6232836","mag":"1992631566"},"language":"en","primary_location":{"id":"doi:10.1109/icicdt.2012.6232836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design &amp; Technology","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069520131","display_name":"Donkyu Baek","orcid":"https://orcid.org/0000-0002-8056-744X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Donkyu Baek","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, South Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021863397","display_name":"Insup Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Insup Shin","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, South Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020011072","display_name":"Youngsoo Shin","orcid":"https://orcid.org/0000-0002-7474-9212"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngsoo Shin","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, South Korea","Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, 305-701 Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5069520131"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06586492,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.8228131532669067},{"id":"https://openalex.org/keywords/delay-calculation","display_name":"Delay calculation","score":0.573141872882843},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.549795925617218},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5215075612068176},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5161100625991821},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.5036010146141052},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48263248801231384},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.46772825717926025},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.46259987354278564},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.457827627658844},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.44388455152511597},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4294590353965759},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42621010541915894},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4256390333175659},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38378089666366577},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3278725743293762},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25948500633239746},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.2093748152256012},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17785856127738953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17169499397277832},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11556777358055115},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.11488497257232666},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.08412313461303711}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.8228131532669067},{"id":"https://openalex.org/C174086752","wikidata":"https://www.wikidata.org/wiki/Q5253471","display_name":"Delay calculation","level":3,"score":0.573141872882843},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.549795925617218},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5215075612068176},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5161100625991821},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.5036010146141052},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48263248801231384},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.46772825717926025},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.46259987354278564},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.457827627658844},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.44388455152511597},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4294590353965759},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42621010541915894},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4256390333175659},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38378089666366577},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3278725743293762},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25948500633239746},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.2093748152256012},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17785856127738953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17169499397277832},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11556777358055115},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.11488497257232666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.08412313461303711},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icicdt.2012.6232836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icicdt.2012.6232836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Conference on IC Design &amp; Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1761143336","https://openalex.org/W2019487421","https://openalex.org/W2105597240","https://openalex.org/W2106201583","https://openalex.org/W2150526221"],"related_works":["https://openalex.org/W2100329931","https://openalex.org/W2145535176","https://openalex.org/W2158805860","https://openalex.org/W2144812464","https://openalex.org/W1570180536","https://openalex.org/W4246774934","https://openalex.org/W4229446324","https://openalex.org/W2117925677","https://openalex.org/W1804063983","https://openalex.org/W2134944363"],"abstract_inverted_index":{"Body":[0],"biasing":[1],"is":[2,24,35,50,63,108,129,172,185,194],"a":[3,36,109,120,132],"well-known":[4],"circuit":[5],"technique":[6],"to":[7,32,90,92,143,157],"compensate":[8],"for":[9,67],"increasing":[10],"process":[11,33],"variations.":[12],"A":[13],"static":[14],"body":[15,83,182],"biasing,":[16],"in":[17,41,47],"which":[18,62],"fixed":[19],"amount":[20],"of":[21,74,111,122,146],"bias":[22,183,192],"voltage":[23,184,193],"applied":[25],"after":[26,82],"chips":[27],"are":[28],"sorted":[29],"out":[30],"according":[31],"corners,":[34],"convenient":[37],"and":[38,79,115],"viable":[39],"approach":[40,49],"ASIC":[42],"designs.":[43],"The":[44,187],"key":[45],"question":[46],"this":[48],"how":[51],"we":[52],"generate":[53],"new":[54],"gate":[55,78,81,123,134],"delays":[56],"without":[57],"re-characterizing":[58],"all":[59,147],"the":[60,68,72,80,86,93,127,148,167],"gates,":[61],"expensive.":[64],"We":[65,151],"notice,":[66],"first":[69],"time,":[70],"that":[71,166],"ratio":[73,128],"delay":[75,145],"(of":[76],"original":[77],"biasing)":[84],"from":[85],"time":[87,94,114],"input":[88,112],"starts":[89],"change":[91],"output":[95],"crosses":[96],"V":[97],"<sub":[98],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dd</sub>":[100],"=2":[101],"can":[102,140],"be":[103,141],"regarded":[104],"invariant,":[105],"i.e.":[106],"it":[107,139],"function":[110,121],"transition":[113],"load":[116],"capacitance,":[117],"but":[118],"not":[119],"type.":[124],"Therefore,":[125],"once":[126],"characterized":[130],"using":[131],"sample":[133],"such":[135],"as":[136,190],"an":[137],"inverter,":[138],"used":[142],"derive":[144],"other":[149],"gates.":[150],"also":[152],"propose":[153],"some":[154],"refinement":[155],"techniques":[156],"improve":[158],"accuracy.":[159],"Experiments":[160],"with":[161,175],"industrial":[162],"32-nm":[163],"library":[164],"indicate":[165],"average":[168],"error":[169,177],"over":[170],"re-characterization":[171],"about":[173],"4%":[174],"maximum":[176,181],"being":[178],"11%,":[179],"when":[180],"assumed.":[186],"errors":[188],"decrease":[189],"smaller":[191],"applied.":[195]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}