{"id":"https://openalex.org/W4407692845","doi":"https://doi.org/10.1109/iceic64972.2025.10879702","title":"Physical Based IGZO Thin-Film Transistor Compact Model for Process In Memory (PIM) Applications","display_name":"Physical Based IGZO Thin-Film Transistor Compact Model for Process In Memory (PIM) Applications","publication_year":2025,"publication_date":"2025-01-19","ids":{"openalex":"https://openalex.org/W4407692845","doi":"https://doi.org/10.1109/iceic64972.2025.10879702"},"language":"en","primary_location":{"id":"doi:10.1109/iceic64972.2025.10879702","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic64972.2025.10879702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101873223","display_name":"Hyoungsoo Kim","orcid":"https://orcid.org/0000-0003-0137-6707"},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hyoungsoo Kim","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I24062138"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101819644","display_name":"Jin Ho Park","orcid":"https://orcid.org/0000-0001-7979-3135"},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jin Ho Park","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I24062138"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jaewoog Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewoog Jung","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I24062138"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100330185","display_name":"Hyunwoo Kim","orcid":"https://orcid.org/0000-0001-7588-3723"},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunwoo Kim","raw_affiliation_strings":["Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Konkuk University,Department of Electrical and Electronics Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I24062138"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101873223"],"corresponding_institution_ids":["https://openalex.org/I24062138"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02102078,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9559000134468079,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9340000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6179074048995972},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6018319129943848},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5642576813697815},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5612040162086487},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4591924250125885},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4502045214176178},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.41414546966552734},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41230690479278564},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27487891912460327},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18578511476516724},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15359961986541748},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1309235394001007},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11960369348526001},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.1033778190612793},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09043753147125244}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6179074048995972},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6018319129943848},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5642576813697815},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5612040162086487},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4591924250125885},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4502045214176178},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.41414546966552734},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41230690479278564},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27487891912460327},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18578511476516724},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15359961986541748},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1309235394001007},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11960369348526001},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.1033778190612793},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09043753147125244}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceic64972.2025.10879702","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic64972.2025.10879702","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.75,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1522835088","https://openalex.org/W2013036650","https://openalex.org/W2121198060","https://openalex.org/W2123087977","https://openalex.org/W2978320292","https://openalex.org/W4226194411","https://openalex.org/W4391622557"],"related_works":["https://openalex.org/W2532740565","https://openalex.org/W2527471840","https://openalex.org/W2049246612","https://openalex.org/W2271044277","https://openalex.org/W2321256480","https://openalex.org/W2067958891","https://openalex.org/W2279453894","https://openalex.org/W1508109676","https://openalex.org/W2749472015","https://openalex.org/W2024991754"],"abstract_inverted_index":{"By":[0],"outstanding":[1],"growth":[2],"in":[3,31],"AI":[4],"industry,":[5],"the":[6,105],"limitation":[7],"of":[8,108],"Von":[9],"Neumann":[10],"Architecture":[11,25],"which":[12,53,73],"is":[13,18],"required":[14],"massive":[15],"data":[16],"bandwidth":[17],"emerging.":[19],"To":[20],"solve":[21],"this":[22,93,113],"problem,":[23],"PIM(Process-in-memory)":[24],"requiring":[26],"additional":[27],"arithmetic":[28],"logic":[29],"unit":[30],"memory":[32],"device":[33,52],"was":[34],"suggested.":[35],"Thanks":[36],"to":[37,47],"2T0C":[38,110],"DRAM":[39],"idea,":[40],"CIM":[41],"layer":[42],"has":[43,54,85],"become":[44],"thin":[45],"enough":[46],"be":[48],"stacked.":[49],"Also,":[50],"IGZO-TFT":[51,71,100],"physically":[55],"small":[56],"leakage":[57,83],"current":[58],"arise,":[59],"as":[60],"a":[61,97,109],"replacement":[62],"for":[63,89],"traditional":[64],"silicon-based":[65],"MOSFET":[66],"device.":[67],"Recently,":[68],"research":[69],"on":[70],"devices,":[72],"are":[74],"stackable,":[75],"exhibit":[76],"high":[77],"mobility":[78],"and":[79,103],"possess":[80],"extremely":[81],"low":[82],"current,":[84],"been":[86],"actively":[87],"pursued":[88],"PIM":[90],"Architectures.":[91],"In":[92],"study,":[94],"we":[95],"developed":[96],"physical":[98],"based":[99],"compact":[101],"model":[102],"validated":[104],"electrical":[106],"characteristics":[107],"cell":[111],"using":[112],"model.":[114]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}
