{"id":"https://openalex.org/W4407693795","doi":"https://doi.org/10.1109/iceic64972.2025.10879677","title":"Semi-supervised Learning for Photovoltaic Cell Defect Detection Using Module and Cell-Level Labels","display_name":"Semi-supervised Learning for Photovoltaic Cell Defect Detection Using Module and Cell-Level Labels","publication_year":2025,"publication_date":"2025-01-19","ids":{"openalex":"https://openalex.org/W4407693795","doi":"https://doi.org/10.1109/iceic64972.2025.10879677"},"language":"en","primary_location":{"id":"doi:10.1109/iceic64972.2025.10879677","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic64972.2025.10879677","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116309762","display_name":"Nayoung Gil","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Nayoung Gil","raw_affiliation_strings":["Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Kyungri Park","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungri Park","raw_affiliation_strings":["Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Daeyun Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Daeyun Jeong","raw_affiliation_strings":["Hanyang University,Department of Intelligence and Information Engineering,Ansan,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Hanyang University,Department of Intelligence and Information Engineering,Ansan,Republic of Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041272419","display_name":"Woohwan Jung","orcid":"https://orcid.org/0000-0003-4561-2214"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woohwan Jung","raw_affiliation_strings":["Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Hanyang University,Department of Applied Artificial Intelligence,Ansan,Republic of Korea","institution_ids":["https://openalex.org/I4575257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5116309762"],"corresponding_institution_ids":["https://openalex.org/I4575257"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03102744,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9319999814033508,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9307000041007996,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.6986827254295349},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5661154985427856},{"id":"https://openalex.org/keywords/supervised-learning","display_name":"Supervised learning","score":0.43722572922706604},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.41930240392684937},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3278214931488037},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1763860285282135},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11419156193733215},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.09633156657218933}],"concepts":[{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.6986827254295349},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5661154985427856},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.43722572922706604},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.41930240392684937},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3278214931488037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1763860285282135},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11419156193733215},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.09633156657218933}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceic64972.2025.10879677","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic64972.2025.10879677","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5899999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2902076869","https://openalex.org/W2953947605","https://openalex.org/W2963855133","https://openalex.org/W4285082541","https://openalex.org/W4390578088","https://openalex.org/W6747701563"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W2386968573","https://openalex.org/W2395064349","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":{"Defect":[0],"detection":[1,61,127],"in":[2,30,69],"photovoltaic":[3],"(PV)":[4],"modules":[5],"is":[6],"crucial":[7],"for":[8,97,117],"ensuring":[9],"energy":[10],"efficiency":[11],"and":[12,28,66,114,133],"long-term":[13],"performance.":[14,162],"Traditionally,":[15],"electroluminescence":[16],"(EL)":[17],"images":[18],"have":[19,47],"been":[20,48],"manually":[21],"analyzed":[22],"by":[23],"workers,":[24],"leading":[25],"to":[26,62,124],"inefficiencies":[27],"subjectivity":[29],"the":[31,63,74,87,131,146],"inspection":[32],"process.":[33],"To":[34,100],"address":[35],"these":[36,53,102],"issues,":[37],"deep":[38],"learning":[39,109,123],"algorithms,":[40],"such":[41],"as":[42],"convolutional":[43],"neural":[44],"networks":[45],"(CNN),":[46],"employed,":[49],"but":[50,89],"most":[51],"of":[52,140],"approaches":[54,155],"using":[55],"only":[56],"module-level":[57,113],"labels":[58,82,116],"restrict":[59],"defect":[60,126],"module":[64,132],"level":[65],"lack":[67],"precision":[68],"identifying":[70],"defective":[71],"cells.":[72],"On":[73],"other":[75],"hand,":[76],"methods":[77],"relying":[78,156],"solely":[79],"on":[80,145,157],"cell-level":[81,88,115,141],"can":[83],"detect":[84],"defects":[85],"at":[86,129],"they":[90],"require":[91],"extensive":[92],"annotation,":[93],"making":[94],"them":[95],"impractical":[96],"industrial":[98],"applications.":[99],"overcome":[101],"limitations,":[103],"we":[104],"propose":[105],"a":[106,137],"novel":[107],"two-stage":[108],"method":[110,152],"that":[111,150],"combines":[112],"training.":[118],"Our":[119],"approach":[120],"applies":[121],"semi-supervised":[122],"improve":[125],"performance":[128],"both":[130],"cell":[134],"levels,":[135],"with":[136],"limited":[138],"number":[139],"labels.":[142],"Experimental":[143],"results":[144],"same":[147],"dataset":[148],"demonstrate":[149],"our":[151],"outperforms":[153],"traditional":[154],"single-level":[158],"labels,":[159],"achieving":[160],"superior":[161]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}