{"id":"https://openalex.org/W4392945160","doi":"https://doi.org/10.1109/iceic61013.2024.10457205","title":"Development of Diode Triggering SCR-Based ESD Protection Circuit with Improved Trigger Voltage for Low Voltage Application","display_name":"Development of Diode Triggering SCR-Based ESD Protection Circuit with Improved Trigger Voltage for Low Voltage Application","publication_year":2024,"publication_date":"2024-01-28","ids":{"openalex":"https://openalex.org/W4392945160","doi":"https://doi.org/10.1109/iceic61013.2024.10457205"},"language":"en","primary_location":{"id":"doi:10.1109/iceic61013.2024.10457205","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic61013.2024.10457205","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109867313","display_name":"U-jeong Seo","orcid":null},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"U Yeol Seo","raw_affiliation_strings":["Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890"],"affiliations":[{"raw_affiliation_string":"Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090289745","display_name":"Sang-Wook Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang wook Kwon","raw_affiliation_strings":["Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890"],"affiliations":[{"raw_affiliation_string":"Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111149875","display_name":"Jeong Seung Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong Seung Gu","raw_affiliation_strings":["Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890"],"affiliations":[{"raw_affiliation_string":"Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100708513","display_name":"Jeong Min Lee","orcid":"https://orcid.org/0000-0003-0561-8777"},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong Min Lee","raw_affiliation_strings":["Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890"],"affiliations":[{"raw_affiliation_string":"Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890","institution_ids":["https://openalex.org/I89015989"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012368648","display_name":"Kwang Yeob Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I55188197","display_name":"Seokyeong University","ror":"https://ror.org/04x0k0m51","country_code":"KR","type":"education","lineage":["https://openalex.org/I55188197"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwang Yeob Lee","raw_affiliation_strings":["Seokyeong University,Department of computer,Republic of Korea","Department of computer, Seokyeong University, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Seokyeong University,Department of computer,Republic of Korea","institution_ids":["https://openalex.org/I55188197"]},{"raw_affiliation_string":"Department of computer, Seokyeong University, Republic of Korea","institution_ids":["https://openalex.org/I55188197"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019446372","display_name":"Yong Seo Koo","orcid":"https://orcid.org/0000-0001-5418-2522"},"institutions":[{"id":"https://openalex.org/I89015989","display_name":"Dankook University","ror":"https://ror.org/058pdbn81","country_code":"KR","type":"education","lineage":["https://openalex.org/I89015989"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong Seo Koo","raw_affiliation_strings":["Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890"],"affiliations":[{"raw_affiliation_string":"Dankook University,Department of Electronics and Electronical Engineering,Yongin-si,Republic of Korea,16890","institution_ids":["https://openalex.org/I89015989"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5109867313"],"corresponding_institution_ids":["https://openalex.org/I89015989"],"apc_list":null,"apc_paid":null,"fwci":0.222,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47339903,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.95169997215271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9390000104904175,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.6988726258277893},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6252832412719727},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5974576473236084},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5166945457458496},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.513985812664032},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39283034205436707},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3730526566505432},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32020676136016846}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.6988726258277893},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6252832412719727},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5974576473236084},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5166945457458496},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.513985812664032},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39283034205436707},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3730526566505432},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32020676136016846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceic61013.2024.10457205","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceic61013.2024.10457205","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Electronics, Information, and Communication (ICEIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322064","display_name":"Korea Institute for Advancement of Technology","ror":"https://ror.org/015w1qa96"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2054962801","https://openalex.org/W2149061080","https://openalex.org/W3003126236","https://openalex.org/W3087972991","https://openalex.org/W4365801594"],"related_works":["https://openalex.org/W4213279392","https://openalex.org/W2379676388","https://openalex.org/W2725874044","https://openalex.org/W2365452505","https://openalex.org/W2059544191","https://openalex.org/W3009399878","https://openalex.org/W614960760","https://openalex.org/W2092371272","https://openalex.org/W2150640605","https://openalex.org/W186689889"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5],"new":[6],"structure":[7],"that":[8],"adds":[9],"diodes":[10],"to":[11,21,32,62,73,80],"the":[12,25,29,34,37,44,52,63,74],"Silicon":[13],"Controlled":[14],"Rectifier":[15],"(SCR).":[16],"Additional":[17],"Diodes":[18],"are":[19],"used":[20],"compare":[22],"and":[23,40,50,58,67],"analyze":[24],"electrical":[26,53],"characteristics":[27,54,71],"with":[28],"conventional":[30],"SCR":[31],"show":[33],"improvement":[35],"of":[36,43,55],"trigger":[38,69],"voltage":[39,42,66,70,85],"holding":[41,65],"proposed":[45],"element.":[46],"It":[47],"also":[48],"compares":[49],"analyzes":[51],"1":[56],"diode":[57],"2":[59],"diodes.":[60],"Due":[61],"high":[64],"low":[68,84],"due":[72],"diode-added":[75],"device,":[76],"it":[77],"is":[78],"expected":[79],"be":[81],"suitable":[82],"for":[83],"applications.":[86]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}