{"id":"https://openalex.org/W2901544599","doi":"https://doi.org/10.1109/iceee.2018.8533939","title":"Characterization of Single Phase Nanometric Cu&lt;inf&gt;2&lt;/inf&gt;O Films Grown by Thermal Oxidation in the Range of 600 to 950\u00b0 C in an Atmosphere with Low Oxygen Content","display_name":"Characterization of Single Phase Nanometric Cu&lt;inf&gt;2&lt;/inf&gt;O Films Grown by Thermal Oxidation in the Range of 600 to 950\u00b0 C in an Atmosphere with Low Oxygen Content","publication_year":2018,"publication_date":"2018-09-01","ids":{"openalex":"https://openalex.org/W2901544599","doi":"https://doi.org/10.1109/iceee.2018.8533939","mag":"2901544599"},"language":"en","primary_location":{"id":"doi:10.1109/iceee.2018.8533939","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceee.2018.8533939","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018603179","display_name":"Laura Hill-Pastor","orcid":null},"institutions":[{"id":"https://openalex.org/I721619","display_name":"Benem\u00e9rita Universidad Aut\u00f3noma de Puebla","ror":"https://ror.org/03p2z7827","country_code":"MX","type":"education","lineage":["https://openalex.org/I721619"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Laura Hill-Pastor","raw_affiliation_strings":["Centro de Investigaci\u00f3n en Dispositivos Semiconductores, BUAP, Puebla"],"affiliations":[{"raw_affiliation_string":"Centro de Investigaci\u00f3n en Dispositivos Semiconductores, BUAP, Puebla","institution_ids":["https://openalex.org/I721619"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021547517","display_name":"L. I. Ju\u00e1rez-Amador","orcid":null},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Centro de Investigaci\u00f3n y de Estudios Avanzados del Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Lucia Juarez-Amador","raw_affiliation_strings":["Programa de Doctorado en Nanociencias y Nanotecnolog\u00eda, CINVESTAV, Ciudad de M\u00e9xico, M\u00e9xico"],"affiliations":[{"raw_affiliation_string":"Programa de Doctorado en Nanociencias y Nanotecnolog\u00eda, CINVESTAV, Ciudad de M\u00e9xico, M\u00e9xico","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027722021","display_name":"M. Agustin","orcid":"https://orcid.org/0000-0001-7620-9458"},"institutions":[{"id":"https://openalex.org/I721619","display_name":"Benem\u00e9rita Universidad Aut\u00f3noma de Puebla","ror":"https://ror.org/03p2z7827","country_code":"MX","type":"education","lineage":["https://openalex.org/I721619"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"M. Vasquez-Agustin","raw_affiliation_strings":["Facultad de Electr\u00f3nica, BUAP, Puebla"],"affiliations":[{"raw_affiliation_string":"Facultad de Electr\u00f3nica, BUAP, Puebla","institution_ids":["https://openalex.org/I721619"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005570718","display_name":"M. Galv\u00e1n-Arellano","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Miguel Galvan-Arellano","raw_affiliation_strings":["Depto. de Ingenier\u00eda El\u00e9ctrica, Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido (SEES), Centro de Investigaci\u00f3n y de Estudios, Ciudad de M\u00e9xico"],"affiliations":[{"raw_affiliation_string":"Depto. de Ingenier\u00eda El\u00e9ctrica, Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido (SEES), Centro de Investigaci\u00f3n y de Estudios, Ciudad de M\u00e9xico","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091124290","display_name":"T. D\u00edaz-Becerril","orcid":"https://orcid.org/0000-0002-4850-8757"},"institutions":[{"id":"https://openalex.org/I721619","display_name":"Benem\u00e9rita Universidad Aut\u00f3noma de Puebla","ror":"https://ror.org/03p2z7827","country_code":"MX","type":"education","lineage":["https://openalex.org/I721619"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Tomas Diaz-Becerril","raw_affiliation_strings":["Centro de Investigaci\u00f3n en Dispositivos Semiconductores, BUAP, Puebla"],"affiliations":[{"raw_affiliation_string":"Centro de Investigaci\u00f3n en Dispositivos Semiconductores, BUAP, Puebla","institution_ids":["https://openalex.org/I721619"]}]},{"author_position":"last","author":{"id":null,"display_name":"Ramon Pena-Sierra","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ramon Pena-Sierra","raw_affiliation_strings":["Depto. de Ingenier\u00eda El\u00e9ctrica, Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido (SEES), Centro de Investigaci\u00f3n y de Estudios, Ciudad de M\u00e9xico"],"affiliations":[{"raw_affiliation_string":"Depto. de Ingenier\u00eda El\u00e9ctrica, Secci\u00f3n de Electr\u00f3nica del Estado S\u00f3lido (SEES), Centro de Investigaci\u00f3n y de Estudios, Ciudad de M\u00e9xico","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5018603179"],"corresponding_institution_ids":["https://openalex.org/I721619"],"apc_list":null,"apc_paid":null,"fwci":0.2959,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.52583643,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"76","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11907","display_name":"Copper-based nanomaterials and applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.5070312023162842},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4606516361236572},{"id":"https://openalex.org/keywords/oxygen","display_name":"Oxygen","score":0.4484706223011017},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4204905927181244},{"id":"https://openalex.org/keywords/kinetics","display_name":"Kinetics","score":0.4102538824081421},{"id":"https://openalex.org/keywords/nuclear-chemistry","display_name":"Nuclear chemistry","score":0.35692086815834045},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2981661558151245},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25449198484420776},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.16215729713439941},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.15188610553741455}],"concepts":[{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.5070312023162842},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4606516361236572},{"id":"https://openalex.org/C540031477","wikidata":"https://www.wikidata.org/wiki/Q629","display_name":"Oxygen","level":2,"score":0.4484706223011017},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4204905927181244},{"id":"https://openalex.org/C148898269","wikidata":"https://www.wikidata.org/wiki/Q1108792","display_name":"Kinetics","level":2,"score":0.4102538824081421},{"id":"https://openalex.org/C13965031","wikidata":"https://www.wikidata.org/wiki/Q243545","display_name":"Nuclear chemistry","level":1,"score":0.35692086815834045},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2981661558151245},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25449198484420776},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.16215729713439941},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.15188610553741455},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceee.2018.8533939","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceee.2018.8533939","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1963535140","https://openalex.org/W1967655036","https://openalex.org/W1968424592","https://openalex.org/W1974108497","https://openalex.org/W1992099331","https://openalex.org/W2002118086","https://openalex.org/W2020504721","https://openalex.org/W2025380744","https://openalex.org/W2025541564","https://openalex.org/W2030011774","https://openalex.org/W2036141767","https://openalex.org/W2042012600","https://openalex.org/W2049816551","https://openalex.org/W2050951060","https://openalex.org/W2057862826","https://openalex.org/W2075147729","https://openalex.org/W2078764582","https://openalex.org/W2097066111","https://openalex.org/W2107642036","https://openalex.org/W2110631483","https://openalex.org/W2159141326","https://openalex.org/W2160000511","https://openalex.org/W2323443137","https://openalex.org/W2325873706","https://openalex.org/W2588473977","https://openalex.org/W6990321694"],"related_works":["https://openalex.org/W1980203814","https://openalex.org/W2325428709","https://openalex.org/W2390155750","https://openalex.org/W2359833044","https://openalex.org/W1981155105","https://openalex.org/W2037069556","https://openalex.org/W1995380350","https://openalex.org/W2364614865","https://openalex.org/W2372045828","https://openalex.org/W2386250410"],"abstract_inverted_index":{"High-quality":[0],"single":[1],"phase":[2,163,170,202],"p-type":[3],"nanometric":[4,226],"films":[5,20,45,82,186,227],"of":[6,17,36,44,47,59,110,159,168,174,179],"cuprous":[7],"oxide":[8,162],"with":[9,34,117,228],"controllable":[10],"properties":[11],"were":[12],"produced":[13,52],"by":[14,140],"thermal":[15,217],"oxidation":[16,142,153,218],"copper":[18],"thin":[19],"from":[21],"600":[22],"to":[23,90,133,188,231],"950\u00b0C":[24],"in":[25,107,234],"a":[26],"nitrogen":[27],"(N":[28],"<sub":[29,182,198,222],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[30,75,79,93,97,114,183,199,223],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[31,184,200,224],")":[32],"atmosphere":[33,148],"5ppm":[35],"oxygen":[37,147],"content":[38],"at":[39,53,65,84,124],"atmospheric":[40],"pressure.":[41],"The":[42,68,127,196],"resistivity":[43],"was":[46,72,155,164,171,203],"300":[48],"\u03a9-cm":[49,61],"for":[50,62,81,99,121,192],"samples":[51,63,122],"high":[54,85,125],"temperatures":[55,86],"and":[56,87,208],"decreased":[57,156],"below":[58],"80":[60],"grown":[64,83,123],"lower":[66],"temperatures.":[67,126],"minimum":[69],"hole":[70],"concentration":[71,149],"8\u00d710":[73,91],"<sup":[74,78,92,96,113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">14</sup>":[76],"cm":[77,95,112],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-3</sup>":[80,98],"increased":[88],"up":[89],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">15</sup>":[94],"low":[100,146],"temperatures,":[101],"the":[102,108,118,134,141,152,160,166,175,180,189,193,206,216],"corresponding":[103],"Hall":[104],"mobilities":[105],"vary":[106],"range":[109],"20-45":[111],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[115],"/V-s":[116],"best":[119],"values":[120],"observed":[128],"electrical":[129],"behavior":[130],"is":[131],"related":[132],"structural":[135],"lattice":[136],"defects":[137],"controlled":[138],"mainly":[139],"kinetics":[143],"process":[144],"under":[145],"conditions.":[150],"When":[151],"temperature":[154],"some":[157],"traces":[158],"cupric":[161],"observed,":[165],"formation":[167],"this":[169],"apparent":[172],"because":[173],"characteristic":[176],"reddish":[177],"color":[178],"Cu":[181,197,221],"O":[185,201,225],"changes":[187],"blackish":[190],"aspect":[191],"tenorite":[194],"phase.":[195],"assessed":[204],"through":[205],"XRD":[207],"Raman":[209],"characterization":[210],"techniques.":[211],"This":[212],"work":[213],"demonstrates":[214],"that":[215],"method":[219],"produces":[220],"enough":[229],"quality":[230],"be":[232],"used":[233],"electronic":[235],"device":[236],"applications.":[237]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-25T23:56:10.502304","created_date":"2025-10-10T00:00:00"}