{"id":"https://openalex.org/W2057842146","doi":"https://doi.org/10.1109/iceee.2011.6106661","title":"Design of a high precision testbed of an automatic inspection system for detecting fine defects in PCBs","display_name":"Design of a high precision testbed of an automatic inspection system for detecting fine defects in PCBs","publication_year":2011,"publication_date":"2011-10-01","ids":{"openalex":"https://openalex.org/W2057842146","doi":"https://doi.org/10.1109/iceee.2011.6106661","mag":"2057842146"},"language":"en","primary_location":{"id":"doi:10.1109/iceee.2011.6106661","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceee.2011.6106661","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037771739","display_name":"Adriano de Luca","orcid":null},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Adriano De Luca","raw_affiliation_strings":["CINVESTAV-IPN-Mexico, Mexico, Distrito Federal, Mexico","CINVESTAV-IPN-Mexico, Av. Instituto Politecnico Nacional 2508, Col. San Pedro Zacatenco, 07760, MEXICO"],"affiliations":[{"raw_affiliation_string":"CINVESTAV-IPN-Mexico, Mexico, Distrito Federal, Mexico","institution_ids":["https://openalex.org/I68368234"]},{"raw_affiliation_string":"CINVESTAV-IPN-Mexico, Av. Instituto Politecnico Nacional 2508, Col. San Pedro Zacatenco, 07760, MEXICO","institution_ids":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103392450","display_name":"Hector Dominguez","orcid":null},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Hector Dominguez","raw_affiliation_strings":["CINVESTAV-IPN-Mexico, Mexico, Distrito Federal, Mexico","UPIITA-IPN-Mexico, Av. Instituto Politecnico Nacional 2580, Col. San Pedro Zacatenco, 07760, MEXICO"],"affiliations":[{"raw_affiliation_string":"CINVESTAV-IPN-Mexico, Mexico, Distrito Federal, Mexico","institution_ids":["https://openalex.org/I68368234"]},{"raw_affiliation_string":"UPIITA-IPN-Mexico, Av. Instituto Politecnico Nacional 2580, Col. San Pedro Zacatenco, 07760, MEXICO","institution_ids":["https://openalex.org/I59361560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5037771739"],"corresponding_institution_ids":["https://openalex.org/I59361560","https://openalex.org/I68368234"],"apc_list":null,"apc_paid":null,"fwci":1.511,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.84864313,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"5265","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7413583397865295},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7114246487617493},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6302549839019775},{"id":"https://openalex.org/keywords/testbed","display_name":"Testbed","score":0.5959484577178955},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.5761842727661133},{"id":"https://openalex.org/keywords/java","display_name":"Java","score":0.508192777633667},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.47922971844673157},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.47146517038345337},{"id":"https://openalex.org/keywords/proximity-sensor","display_name":"Proximity sensor","score":0.4145270884037018},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.36193370819091797},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3536548912525177},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.2097230851650238}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7413583397865295},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7114246487617493},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6302549839019775},{"id":"https://openalex.org/C31395832","wikidata":"https://www.wikidata.org/wiki/Q1318674","display_name":"Testbed","level":2,"score":0.5959484577178955},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.5761842727661133},{"id":"https://openalex.org/C548217200","wikidata":"https://www.wikidata.org/wiki/Q251","display_name":"Java","level":2,"score":0.508192777633667},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.47922971844673157},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.47146517038345337},{"id":"https://openalex.org/C135403697","wikidata":"https://www.wikidata.org/wiki/Q796765","display_name":"Proximity sensor","level":2,"score":0.4145270884037018},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.36193370819091797},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3536548912525177},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2097230851650238},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iceee.2011.6106661","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iceee.2011.6106661","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 8th International Conference on Electrical Engineering, Computing Science and Automatic Control","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1978937111","https://openalex.org/W2004241456","https://openalex.org/W2018459216","https://openalex.org/W2037113681","https://openalex.org/W2105836366","https://openalex.org/W2121341427","https://openalex.org/W2175740243","https://openalex.org/W2523234051","https://openalex.org/W6675621903","https://openalex.org/W6727483254"],"related_works":["https://openalex.org/W2381871331","https://openalex.org/W2065074105","https://openalex.org/W2143253282","https://openalex.org/W1483484008","https://openalex.org/W2381042966","https://openalex.org/W948848871","https://openalex.org/W4294845021","https://openalex.org/W4293696356","https://openalex.org/W4293699839","https://openalex.org/W2968935365"],"abstract_inverted_index":{"This":[0],"paper":[1],"shows":[2],"the":[3,40,51,59,94,102,112],"design":[4],"of":[5,25,79],"a":[6,18,74,85,89],"high":[7],"precision":[8],"automatic":[9],"inspection":[10],"system":[11,64],"for":[12,48],"Printed":[13],"Circuit":[14],"Boards":[15],"(PCB)":[16],"using":[17,73],"2D":[19],"laser":[20,60,103],"sensor.":[21,61],"The":[22],"main":[23],"purpose":[24],"this":[26],"setup":[27],"is":[28,46,65,82],"to":[29,55],"detect":[30],"errors":[31],"in":[32,84],"pasting":[33],"and":[34,54,71,98,107],"surface":[35],"mount":[36],"devices":[37],"placement":[38],"on":[39,67],"electronic":[41],"boards.":[42],"An":[43],"ultra-stable":[44],"table":[45],"used":[47],"supporting":[49],"all":[50,80],"moving":[52],"components":[53],"absorb":[56],"vibrations":[57],"from":[58,101,111],"Motion":[62],"control":[63,96],"based":[66],"open":[68],"architecture":[69],"philosophy":[70],"developed":[72],"PIC":[75],"microcontroller.":[76],"Final":[77],"integration":[78],"modules":[81],"done":[83],"personal":[86],"computer":[87],"with":[88],"java":[90],"code":[91],"that":[92],"commands":[93],"motion":[95],"module":[97],"receives":[99],"data":[100],"sensor;":[104],"then":[105],"processes":[106],"plots":[108],"final":[109],"results":[110],"PCB":[113],"inspection.":[114]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}