{"id":"https://openalex.org/W4417170331","doi":"https://doi.org/10.1109/icecs66544.2025.11270814","title":"An Integrated Flow for Predicting Radiation Effects in CubeSat Onboard Electronics","display_name":"An Integrated Flow for Predicting Radiation Effects in CubeSat Onboard Electronics","publication_year":2025,"publication_date":"2025-11-17","ids":{"openalex":"https://openalex.org/W4417170331","doi":"https://doi.org/10.1109/icecs66544.2025.11270814"},"language":null,"primary_location":{"id":"doi:10.1109/icecs66544.2025.11270814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043895501","display_name":"Eleonora Vacca","orcid":"https://orcid.org/0000-0002-7573-1815"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Eleonora Vacca","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018567565","display_name":"Corrado De Sio","orcid":"https://orcid.org/0000-0003-4212-3052"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Corrado De Sio","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Sterpone","raw_affiliation_strings":["Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Department of Control and Computer Engineering,Turin,Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5043895501"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.42448193,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.8490999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.8490999937057495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.10270000249147415,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11176","display_name":"Radiation Therapy and Dosimetry","score":0.006200000178068876,"subfield":{"id":"https://openalex.org/subfields/2740","display_name":"Pulmonary and Respiratory Medicine"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cubesat","display_name":"CubeSat","score":0.9401999711990356},{"id":"https://openalex.org/keywords/streamlines-streaklines-and-pathlines","display_name":"Streamlines, streaklines, and pathlines","score":0.6927000284194946},{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.6593999862670898},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.6575999855995178},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5318999886512756},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4790000021457672},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.47350001335144043},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4462999999523163},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.44339999556541443}],"concepts":[{"id":"https://openalex.org/C2775936636","wikidata":"https://www.wikidata.org/wiki/Q1142930","display_name":"CubeSat","level":3,"score":0.9401999711990356},{"id":"https://openalex.org/C60439489","wikidata":"https://www.wikidata.org/wiki/Q634407","display_name":"Streamlines, streaklines, and pathlines","level":2,"score":0.6927000284194946},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.6593999862670898},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6575999855995178},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5318999886512756},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4790000021457672},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.47350001335144043},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4462999999523163},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.44339999556541443},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.42800000309944153},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3968999981880188},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.38519999384880066},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3756999969482422},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36579999327659607},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3319999873638153},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.32829999923706055},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.32339999079704285},{"id":"https://openalex.org/C2986508813","wikidata":"https://www.wikidata.org/wiki/Q1574099","display_name":"Radiation shielding","level":3,"score":0.3192000091075897},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30720001459121704},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.30239999294281006},{"id":"https://openalex.org/C489000","wikidata":"https://www.wikidata.org/wiki/Q747385","display_name":"Data flow diagram","level":2,"score":0.29809999465942383},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.2937000095844269},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.2913999855518341},{"id":"https://openalex.org/C2989044035","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronic equipment","level":2,"score":0.2870999872684479},{"id":"https://openalex.org/C187970030","wikidata":"https://www.wikidata.org/wiki/Q1185086","display_name":"Background radiation","level":3,"score":0.2831000089645386},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.28200000524520874},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.27000001072883606},{"id":"https://openalex.org/C204431084","wikidata":"https://www.wikidata.org/wiki/Q748473","display_name":"Radioecology","level":3,"score":0.25690001249313354},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.2556999921798706}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs66544.2025.11270814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2099032301","https://openalex.org/W2103902557","https://openalex.org/W2128881154","https://openalex.org/W2141424572","https://openalex.org/W2906063286","https://openalex.org/W3094215093","https://openalex.org/W4241075081","https://openalex.org/W4406457514","https://openalex.org/W4406894455","https://openalex.org/W4408358288","https://openalex.org/W4408779344","https://openalex.org/W4409660357"],"related_works":[],"abstract_inverted_index":{"We":[0],"introduce":[1],"a":[2],"simulation-driven":[3],"methodology":[4],"to":[5,44,64],"assess":[6],"the":[7,45],"Single":[8,23],"Event":[9,24],"Effect":[10],"(SEE)":[11],"sensitivity":[12],"of":[13,40],"CubeSat":[14,47],"electronics":[15],"under":[16],"mission-specific":[17],"radiation":[18],"environments.":[19],"By":[20],"combining":[21],"component-level":[22],"Upset":[25],"(SEU)":[26],"cross-section":[27],"data":[28],"with":[29],"detailed":[30],"3D":[31,54],"structural":[32],"shielding":[33,75],"models,":[34],"our":[35],"approach":[36],"enables":[37],"fine-grained":[38],"estimation":[39],"SEE":[41],"rates.":[42],"Applied":[43],"RAMSES":[46],"mission,":[48],"it":[49],"demonstrates":[50],"that":[51],"accounting":[52],"for":[53],"analysis":[55],"reduce":[56],"predicted":[57],"SEU":[58],"rates":[59],"by":[60],"over":[61],"50\u00d7":[62],"compared":[63],"simplified":[65],"standalone":[66],"models.":[67],"This":[68],"improved":[69],"precision":[70],"enhances":[71],"component":[72],"selection,":[73],"informs":[74],"strategies,":[76],"and":[77,85],"streamlines":[78],"fault":[79],"mitigation":[80],"planning,":[81],"ultimately":[82],"supporting":[83],"cost-effective":[84],"reliable":[86],"mission":[87],"design.":[88]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-12-09T00:00:00"}