{"id":"https://openalex.org/W4417169598","doi":"https://doi.org/10.1109/icecs66544.2025.11270785","title":"AI-Assisted Design of a Compact Voltage Monitoring System with a Millisecond-Delayed Fault Detection Circuit","display_name":"AI-Assisted Design of a Compact Voltage Monitoring System with a Millisecond-Delayed Fault Detection Circuit","publication_year":2025,"publication_date":"2025-11-17","ids":{"openalex":"https://openalex.org/W4417169598","doi":"https://doi.org/10.1109/icecs66544.2025.11270785"},"language":null,"primary_location":{"id":"doi:10.1109/icecs66544.2025.11270785","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270785","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088038023","display_name":"Ahmed Abuelnasr","orcid":"https://orcid.org/0000-0002-2153-4496"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Ahmed Abuelnasr","raw_affiliation_strings":["Polytechnique Montreal,Electrical Engineering Department"],"affiliations":[{"raw_affiliation_string":"Polytechnique Montreal,Electrical Engineering Department","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024661151","display_name":"Mostafa Amer","orcid":"https://orcid.org/0000-0002-3246-8156"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mostafa Amer","raw_affiliation_strings":["Polytechnique Montreal,Electrical Engineering Department"],"affiliations":[{"raw_affiliation_string":"Polytechnique Montreal,Electrical Engineering Department","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024826090","display_name":"Isa Altoobaji","orcid":"https://orcid.org/0000-0001-8346-6866"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Isa Altoobaji","raw_affiliation_strings":["Polytechnique Montreal,Electrical Engineering Department"],"affiliations":[{"raw_affiliation_string":"Polytechnique Montreal,Electrical Engineering Department","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056366870","display_name":"Ahmad Hassan","orcid":"https://orcid.org/0000-0002-2215-5375"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ahmad Hassan","raw_affiliation_strings":["Polytechnique Montreal,Electrical Engineering Department"],"affiliations":[{"raw_affiliation_string":"Polytechnique Montreal,Electrical Engineering Department","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038488044","display_name":"Yvon Savaria","orcid":"https://orcid.org/0000-0002-3404-9959"},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Yvon Savaria","raw_affiliation_strings":["Polytechnique Montreal,Electrical Engineering Department"],"affiliations":[{"raw_affiliation_string":"Polytechnique Montreal,Electrical Engineering Department","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5088038023"],"corresponding_institution_ids":["https://openalex.org/I45683168"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.38716234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.7281000018119812,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.7281000018119812,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.042899999767541885,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.042100001126527786,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6434000134468079},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6032000184059143},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5741000175476074},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5519000291824341},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5349000096321106},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.47269999980926514},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.44130000472068787},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41589999198913574}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6434000134468079},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6133000254631042},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6032000184059143},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5741000175476074},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5519000291824341},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5349000096321106},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.47269999980926514},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44449999928474426},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.44130000472068787},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41589999198913574},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.3986000120639801},{"id":"https://openalex.org/C31352089","wikidata":"https://www.wikidata.org/wiki/Q3750474","display_name":"Systems design","level":2,"score":0.39809998869895935},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.3562000095844269},{"id":"https://openalex.org/C192209626","wikidata":"https://www.wikidata.org/wiki/Q190909","display_name":"Focus (optics)","level":2,"score":0.34380000829696655},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.31299999356269836},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2741999924182892},{"id":"https://openalex.org/C2777466363","wikidata":"https://www.wikidata.org/wiki/Q17008971","display_name":"Design tool","level":2,"score":0.2696000039577484},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.26840001344680786},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2648000121116638},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25870001316070557},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.25360000133514404},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.2529999911785126},{"id":"https://openalex.org/C149629883","wikidata":"https://www.wikidata.org/wiki/Q660926","display_name":"Fraction (chemistry)","level":2,"score":0.25130000710487366}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icecs66544.2025.11270785","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270785","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.polymtl.ca:70542","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401013","display_name":"PolyPublie (\u00c9cole Polytechnique de Montr\u00e9al)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I45683168","host_organization_name":"Polytechnique Montr\u00e9al","host_organization_lineage":["https://openalex.org/I45683168"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310709","display_name":"CMC Microsystems","ror":"https://ror.org/03k70ea39"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W3089465231","https://openalex.org/W4206303881","https://openalex.org/W4210552504","https://openalex.org/W4294241929","https://openalex.org/W4313598887","https://openalex.org/W4313890236","https://openalex.org/W4391339190"],"related_works":[],"abstract_inverted_index":{"Voltage":[0],"monitoring":[1],"systems":[2,25],"(VMS)":[3],"with":[4,32,224],"delayed":[5],"fault":[6],"detection":[7],"(DFD)":[8],"are":[9,26],"critical":[10,91],"for":[11,22,67,89,142],"ensuring":[12],"safe":[13],"operation":[14],"of":[15,47,70,86,112,170],"voltage-sensitive":[16],"integrated":[17,186],"circuits.":[18,227],"Traditional":[19],"design":[20,38,46,69,150,169],"approaches":[21],"such":[23],"analog":[24],"manual,":[27],"requiring":[28],"time-consuming":[29],"repetitive":[30],"interactions":[31],"simulators.":[33],"While":[34],"artificial":[35],"intelligence":[36],"(AI)-assisted":[37],"methods":[39],"have":[40],"emerged,":[41],"they":[42],"focus":[43],"on":[44],"the":[45,68,90,94,113,117,121,157,171],"isolated":[48],"circuits":[49,92,184],"and":[50,105,173,178,198,211],"do":[51],"not":[52],"show":[53],"their":[54],"coordinated":[55],"performance":[56,194],"in":[57,74,93,109,134,156,161],"a":[58,71,75,97,106,110,128,143,162,188,222],"full":[59,189],"system.":[60],"This":[61],"paper":[62],"introduces":[63],"an":[64,100,152],"AI-driven":[65],"approach":[66,83],"VMS-DFD":[72],"implemented":[73],"180":[76],"nm":[77],"silicon-on-insulator":[78],"(SOI)":[79],"process.":[80],"The":[81,147,167,182],"proposed":[82],"generated":[84,133],"hundreds":[85],"specification-compliant":[87],"solutions":[88,126],"VMS-DFD,":[95,190],"namely":[96],"hysteric":[98],"comparator,":[99],"op-amp-based":[101],"reference":[102],"voltage":[103],"circuit,":[104],"delay":[107,122,131,158],"element,":[108,123],"fraction":[111],"time":[114],"needed":[115],"by":[116],"traditional":[118],"approach.":[119],"For":[120],"100":[124],"valid":[125],"targeting":[127],"1":[129],"ms":[130],"were":[132,185],"2.17":[135],"hours,":[136,180],"compared":[137],"to":[138,221],"five":[139],"weeks":[140],"required":[141,175],"single":[144],"manual":[145],"solution.":[146],"most":[148],"area-efficient":[149],"yielded":[151],"84%":[153],"area":[154,165],"reduction":[155],"element":[159],"resulting":[160,183],"22%":[163],"system-level":[164],"saving.":[166],"AI-Assisted":[168],"comparator":[172],"op-amp":[174],"only":[176],"2.4":[177],"6":[179],"respectively.":[181],"into":[187],"demonstrating":[191],"stable":[192],"system":[193,223],"across":[195],"process,":[196],"voltage,":[197],"temperature":[199,213],"(PVT)":[200],"corners,":[201],"achieving":[202],"better":[203],"delay-voltage":[204],"sensitivity":[205,214],"(2.37":[206],"ms/V":[207],"vs.":[208,217],"3.39":[209],"ms/V)":[210],"comparable":[212],"(0.116":[215],"ms/\u00b0C":[216],"0.097":[218],"ms/\u00b0C)":[219],"relative":[220],"manually":[225],"designed":[226]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-12-09T00:00:00"}