{"id":"https://openalex.org/W4416261796","doi":"https://doi.org/10.1109/icecs66544.2025.11270597","title":"Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region","display_name":"Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region","publication_year":2025,"publication_date":"2025-11-17","ids":{"openalex":"https://openalex.org/W4416261796","doi":"https://doi.org/10.1109/icecs66544.2025.11270597"},"language":"en","primary_location":{"id":"doi:10.1109/icecs66544.2025.11270597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Shuya Isawa","orcid":null},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Shuya Isawa","raw_affiliation_strings":["Meiji University,Kawasaki,Japan","Meiji University [Tokyo] (4-21-1 Nakano Nakano Ku Tokyo 164-8525 Japan - Japan)"],"affiliations":[{"raw_affiliation_string":"Meiji University,Kawasaki,Japan","institution_ids":["https://openalex.org/I16656306"]},{"raw_affiliation_string":"Meiji University [Tokyo] (4-21-1 Nakano Nakano Ku Tokyo 164-8525 Japan - Japan)","institution_ids":["https://openalex.org/I16656306"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Kawori Sekine","orcid":null},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR","JP"],"is_corresponding":false,"raw_author_name":"Kawori Sekine","raw_affiliation_strings":["Meiji University,Kawasaki,Japan","IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)"],"affiliations":[{"raw_affiliation_string":"Meiji University,Kawasaki,Japan","institution_ids":["https://openalex.org/I16656306"]},{"raw_affiliation_string":"IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103731117","display_name":"Kazuyuki Wada","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR","JP"],"is_corresponding":false,"raw_author_name":"Kazuyuki Wada","raw_affiliation_strings":["Meiji University,Kawasaki,Japan","IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)","University of Bordeaux,Talence,France"],"affiliations":[{"raw_affiliation_string":"Meiji University,Kawasaki,Japan","institution_ids":["https://openalex.org/I16656306"]},{"raw_affiliation_string":"IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"raw_affiliation_string":"University of Bordeaux,Talence,France","institution_ids":["https://openalex.org/I15057530"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Fran\u00e7ois Rivet","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210157089","display_name":"Laboratoire de l'Int\u00e9gration du Mat\u00e9riau au Syst\u00e8me","ror":"https://ror.org/04nabhy78","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210091158","https://openalex.org/I4210095849","https://openalex.org/I4210157089","https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois Rivet","raw_affiliation_strings":["University of Bordeaux,Talence,France","IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)"],"affiliations":[{"raw_affiliation_string":"University of Bordeaux,Talence,France","institution_ids":["https://openalex.org/I15057530"]},{"raw_affiliation_string":"IMS - Laboratoire de l'int\u00e9gration, du mat\u00e9riau au syst\u00e8me (33405 TALENCE CEDEX - France)","institution_ids":["https://openalex.org/I4210157089","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110758665","display_name":"H. Lapuyade","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Herv\u00e9 Lapuyade","raw_affiliation_strings":["University of Bordeaux,Talence,France"],"affiliations":[{"raw_affiliation_string":"University of Bordeaux,Talence,France","institution_ids":["https://openalex.org/I15057530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068662659","display_name":"Yann Deval","orcid":"https://orcid.org/0000-0002-7358-8904"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Yann Deval","raw_affiliation_strings":["University of Bordeaux,Talence,France"],"affiliations":[{"raw_affiliation_string":"University of Bordeaux,Talence,France","institution_ids":["https://openalex.org/I15057530"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I16656306"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33366896,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.7468000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.7468000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.12870000302791595,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.03530000150203705,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6025999784469604},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.546500027179718},{"id":"https://openalex.org/keywords/quadratic-equation","display_name":"Quadratic equation","score":0.529699981212616},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.5095000267028809},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.49079999327659607},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.48350000381469727},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4657000005245209},{"id":"https://openalex.org/keywords/saturation","display_name":"Saturation (graph theory)","score":0.42100000381469727}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6025999784469604},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.546500027179718},{"id":"https://openalex.org/C129844170","wikidata":"https://www.wikidata.org/wiki/Q41299","display_name":"Quadratic equation","level":2,"score":0.529699981212616},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.5095000267028809},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.49079999327659607},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.48350000381469727},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4657000005245209},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.42100000381469727},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3939000070095062},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.364300012588501},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.3573000133037567},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.3458999991416931},{"id":"https://openalex.org/C166437778","wikidata":"https://www.wikidata.org/wiki/Q50695","display_name":"Quadratic function","level":3,"score":0.34040001034736633},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.33959999680519104},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.33640000224113464},{"id":"https://openalex.org/C195905723","wikidata":"https://www.wikidata.org/wiki/Q7113634","display_name":"Overdrive voltage","level":5,"score":0.3294000029563904},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.31630000472068787},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.3133000135421753},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.3075999915599823},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2818000018596649},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.2806999981403351},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.2793999910354614},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.2718000113964081}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icecs66544.2025.11270597","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs66544.2025.11270597","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-05298693v1","is_oa":false,"landing_page_url":"https://hal.science/hal-05298693","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"32nd IEEE International Conference on Electronics Circuits and Systems (ICECS 2025), Nov 2025, Marrakech, Morocco","raw_type":"Conference papers"},{"id":"pmh:oai:oskar-bordeaux.fr:20.500.12278/207715","is_oa":false,"landing_page_url":"https://oskar-bordeaux.fr/handle/20.500.12278/207715","pdf_url":null,"source":{"id":"https://openalex.org/S4306402569","display_name":"Oskar-Bordeaux (Universite de Bordeaux)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Communication dans un congr\u00e8s"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320315052","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93"},{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0,106],"paper":[1],"investigates":[2],"a":[3,22,78,97,102],"voltage":[4,16,28,55,125],"reference":[5,124],"circuit":[6],"that":[7],"incorporates":[8],"an":[9],"equivalent":[10],"MOSFET,":[11],"which":[12],"adjusts":[13],"the":[14,34,37,44,53,60,82,110,119,123],"threshold":[15,54],"and":[17,43,74,115],"its":[18],"temperature":[19,120],"coefficient":[20,121],"using":[21,93],"Proportional":[23],"To":[24],"Absolute":[25],"Temperature":[26],"(PTAT)":[27],"generation":[29],"circuit.":[30],"In":[31],"previous":[32],"designs,":[33],"relationship":[35],"between":[36,72,112],"drain":[38],"current":[39],"I<inf":[40,83],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[41,47,57,84,88,127],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">D</inf>":[42,85],"gate-source":[45],"voltageV<inf":[46],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">GS</inf>":[48,89],"was":[49],"derived":[50],"based":[51],"on":[52],"V<inf":[56,87,126],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</inf>":[58],"from":[59,96,131],"gradual":[61],"channel":[62],"model":[63,107],"of":[64,122],"MOSFETs.":[65],"However,":[66],"this":[67],"method":[68],"led":[69],"to":[70,101,134],"discrepancies":[71],"theory":[73],"simulation.":[75],"We":[76],"propose":[77],"new":[79],"approach":[80],"where":[81],"-":[86],"characteristics":[90],"are":[91],"modeled":[92],"simulation":[94,116],"data":[95],"single":[98],"NMOSFET,":[99],"fitted":[100],"general":[103],"quadratic":[104],"function.":[105],"significantly":[108],"reduces":[109],"error":[111],"theoretical":[113],"calculations":[114],"results.":[117],"Additionally,":[118],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">ref</inf>":[128],"is":[129],"improved":[130],"498":[132],"ppm/K":[133],"32":[135],"ppm/K.":[136]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}